A Physical Unclonable Function Based on Inter-Metal Layer Resistance Variations and an Evaluation of its Temperature and Voltage Stability

Keying material for encryption is stored as digital bistrings in non-volatile memory (NVM) on FPGAs and ASICs in current technologies. However, secrets stored this way are not secure against a determined adversary, who can use probing attacks to steal the secret. Physical Unclonable functions (PUFs) have emerged as an alternative. PUFs leverage random manufacturing variations as the source of entropy for generating random bitstrings, and incorporate an on-chip infrastructure for measuring and digitizing the corresponding variations in key electrical parameters, such as delay or voltage. PUFs are designed to reproduce a bitstring on demand and therefore eliminate the need for on-chip storage. In this dissertation, I propose a kind of PUF that measures resistance variations in inter-metal layers that define the power grid of the chip and evaluate its temperature and voltage stability. First, I introduce two implementations of a power grid-based PUF (PG-PUF). Then, I analyze the quality of bit strings generated without considering environmental variations from the PG-PUFs that leverage resistance variations in: 1) the power grid metal wires in 60 copies of a 90 nm chip and 2) in the power grid metal wires of 58 copies of a 65 nm chip. Next, I carry out a series of experiments in a set of 63 chips in IBM\u27s 90 nm technology at 9 TV corners, i.e., over all combination of 3 temperatures: -40oC, 25oC and 85oC and 3 voltages: nominal and +/-10% of the nominal supply voltage. The randomness, uniqueness and stability characteristics of bitstrings generated from PG-PUFs are evaluated. The stability of the PG-PUF and an on-chip voltage-to-digital (VDC) are also evaluated at 9 temperature-voltage corners. I introduce several techniques that have not been previously described, including a mechanism to eliminate voltage trends or \u27bias\u27 in the power grid voltage measurements, as well as a voltage threshold, Triple-Module-Redundancy (TMR) and majority voting scheme to identify and exclude unstable bits

Barrel Shifter Physical Unclonable Function Based Encryption

Physical Unclonable Functions (PUFs) are circuits designed to extract physical randomness from the underlying circuit. This randomness depends on the manufacturing process. It differs for each device enabling chip-level authentication and key generation applications. We present a protocol utilizing a PUF for secure data transmission. Parties each have a PUF used for encryption and decryption; this is facilitated by constraining the PUF to be commutative. This framework is evaluated with a primitive permutation network - a barrel shifter. Physical randomness is derived from the delay of different shift paths. Barrel shifter (BS) PUF captures the delay of different shift paths. This delay is entangled with message bits before they are sent across an insecure channel. BS-PUF is implemented using transmission gates; their characteristics ensure same-chip reproducibility, a necessary property of PUFs. Post-layout simulations of a common centroid layout 8-level barrel shifter in 0.13 {\mu}m technology assess uniqueness, stability and randomness properties. BS-PUFs pass all selected NIST statistical randomness tests. Stability similar to Ring Oscillator (RO) PUFs under environment variation is shown. Logistic regression of 100,000 plaintext-ciphertext pairs (PCPs) failed to successfully model BS- PUF behavior