Layout to circuit extraction for three-dimensional thermal-electrical circuit simulation of device structures

In this paper, a method is proposed for extraction of coupled networks from layout information for simulation of electrothermal device behavior. The networks represent a three-dimensional (3-D) device structure with circuit elements. The electrical and thermal characteristics of this circuit representation are calculated with a circuit simulator. Spatial potential distributions, current flows, and temperature distributions in the device structure are calculated on the spatial coordinates. This simulation method can be placed between device simulation and (conventional) circuit simulation. It has been implemented in a circuit simulator and is demonstrated for simulation of self-heating in a bipolar low frequency power transistor. The main advantage of this simulation method is that not only the 3-D thermal behavior of the whole chip is simulated, but that this is also directly coupled to the electrical device behavior by means of the power dissipation and temperature distribution in the device. This offers the possibility for the circuit designer to simulate 3-D, coupled, thermal-electrical problems with a circuit simulator. As an example, the influence of the emitter contacting on the internal temperature and current distribution of a BJT is investigate

OPTIMAL AREA AND PERFORMANCE MAPPING OF K-LUT BASED FPGAS

FPGA circuits are increasingly used in many fields: for rapid prototyping of new products (including fast ASIC implementation), for logic emulation, for producing a small number of a device, or if a device should be reconfigurable in use (reconfigurable computing). Determining if an arbitrary, given wide, function can be implemented by a programmable logic block, unfortunately, it is generally, a very difficult problem. This problem is called the Boolean matching problem. This paper introduces a new implemented algorithm able to map, both for area and performance, combinational networks using k-LUT based FPGAs.k-LUT based FPGAs, combinational circuits, performance-driven mapping.

Physics-based large-signal sensitivity analysis of microwave circuits using technological parametric sensitivity from multidimensional semiconductor device models

The authors present an efficient approach to evaluate the large-signal (LS) parametric sensitivity of active semiconductor devices under quasi-periodic operation through accurate, multidimensional physics-based models. The proposed technique exploits efficient intermediate mathematical models to perform the link between physics-based analysis and circuit-oriented simulations, and only requires the evaluation of dc and ac small-signal (dc charge) sensitivities under general quasi-static conditions. To illustrate the technique, the authors discuss examples of sensitivity evaluation, statistical analysis, and doping profile optimization of an implanted MESFET to minimize intermodulation which makes use of LS parametric sensitivities under two-tone excitatio