Developing large-scale field-programmable analog arrays for rapid prototyping

Field-programmable analog arrays (FPAAs) provide a method for rapidly prototyping analog systems. While currently available FPAAs vary in architecture and interconnect design, they are often limited in size and flexibility. For FPAAs to be as useful and marketable as modern digital reconfigurable devices, new technologies must be explored to provide area efficient, accurately programmable analog circuitry that can be easily integrated into a larger digital/mixed signal system. By leveraging recent advances in floating gate transistors, a new generation of FPAAs are achievable that will dramatically advance the current state of the art in terms of size, functionality, and flexibility

Delay Measurements and Self Characterisation on FPGAs

This thesis examines new timing measurement methods for self delay characterisation of Field-Programmable Gate Arrays (FPGAs) components and delay measurement of complex circuits on FPGAs. Two novel measurement techniques based on analysis of a circuit's output failure rate and transition probability is proposed for accurate, precise and efficient measurement of propagation delays. The transition probability based method is especially attractive, since it requires no modifications in the circuit-under-test and requires little hardware resources, making it an ideal method for physical delay analysis of FPGA circuits. The relentless advancements in process technology has led to smaller and denser transistors in integrated circuits. While FPGA users benefit from this in terms of increased hardware resources for more complex designs, the actual productivity with FPGA in terms of timing performance (operating frequency, latency and throughput) has lagged behind the potential improvements from the improved technology due to delay variability in FPGA components and the inaccuracy of timing models used in FPGA timing analysis. The ability to measure delay of any arbitrary circuit on FPGA offers many opportunities for on-chip characterisation and physical timing analysis, allowing delay variability to be accurately tracked and variation-aware optimisations to be developed, reducing the productivity gap observed in today's FPGA designs. The measurement techniques are developed into complete self measurement and characterisation platforms in this thesis, demonstrating their practical uses in actual FPGA hardware for cross-chip delay characterisation and accurate delay measurement of both complex combinatorial and sequential circuits, further reinforcing their positions in solving the delay variability problem in FPGAs

Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

Design and application of reconfigurable circuits and systems

Open Acces

Introduction to FPGA design

This paper presents an introduction to digital hardware design using Field Programmable Gate Arrays (FPGAs). After a historical introduction and a quick overview of digital design, the internal structure of a generic FPGA is discussed. We then describe the design flow, i.e., the steps needed to go from design idea to actual working hardware. Digital signal processing is an important area where FPGAs have found many applications in recent years. Therefore a complete section is devoted to this subject. The paper finishes with a discussion of important peripheral concepts essential for success in any project involving FPGAs

GROK-FPGA: Generating Real on-Chip Knowledge for FPGA Fine-Grain Delays Using Timing Extraction

Circuit variation is one of the biggest problems to overcome if Moore\u27s Law is to continue. It is no longer possible to maintain an abstraction of identical devices without huge yield losses, performance penalties, and energy costs. Current techniques such as margining and grade binning are used to deal with this problem. However, they tend to be conservative, offering limited solutions that will not scale as variation increases. Conventional circuits use limited tests and statistical models to determine the margining and binning required to counteract variation. If the limited tests fail, the whole chip is discarded. On the other hand, reconfigurable circuits, such as FPGAs, can use more fine-grained, aggressive techniques that carefully choose which resources to use in order to mitigate variation. Knowing which resources to use and avoid, however, requires measurement of underlying variation. We present Timing Extraction, a methodology that allows measurement of process variation without expensive testers nor highly invasive techniques, rather, relying only on resources already available on conventional FPGAs. It takes advantage of the fact that we can measure the delay of logic paths between any two registers. Measuring enough paths, provides the information necessary to decompose the delay of each path into individual components-essentially, forming a system of linear equations. Determining which paths to measure requires simple graph transformation algorithms applied to a representation of the FPGA circuit. Ultimately, this process decomposes the FPGA into individual components and identifies which paths to measure for computing the delay of individual components. We apply Timing Extraction to 18 commercially available Altera Cyclone III (65 nm) FPGAs. We measure 22×28 logic clusters and the interconnect within and between cluster. Timing Extraction decomposes this region into 1,356,182 components, classified into 10 categories, requiring 2,736,556 path measurements. With an accuracy of ±3.2 ps, our measurements reveal regional variation on the order of 50 ps, systematic variation from 30 ps to 70 ps, and random variation in the clusters with σ=15 ps and in the interconnect with σ=62 ps