DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

Baseband processor for IEEE 802.11a standard with embedded BIST

In this paper results of an IEEE 802.11a compliant low-power baseband processor implementation are presented. The detailed structure of the baseband processor and its constituent blocks is given. A design for testability strategy based on Built-In Self-Test (BIST) is proposed. Finally implementational results and power estimation are reported

Online self-repair of FIR filters

Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs

Phase Locked Loop Test Methodology

Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

Plug & Test at System Level via Testable TLM Primitives

With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos

Design and Test Space Exploration of Transport-Triggered Architectures

This paper describes a new approach in the high level design and test of transport-triggered architectures (TTA), a special type of application specific instruction processors (ASIP). The proposed method introduces the test as an additional constraint, besides throughput and circuit area. The method, that calculates the testability of the system, helps the designer to assess the obtained architectures with respect to test, area and throughput in the early phase of the design and selects the most suitable one. In order to create the templated TTA, the ¿MOVE¿ framework has been addressed. The approach is validated with respect to the ¿Crypt¿ Unix applicatio

Creation and detection of hardware trojans using non-invasive off-the-shelf technologies

As a result of the globalisation of the semiconductor design and fabrication processes, integrated circuits are becoming increasingly vulnerable to malicious attacks. The most concerning threats are hardware trojans. A hardware trojan is a malicious inclusion or alteration to the existing design of an integrated circuit, with the possible effects ranging from leakage of sensitive information to the complete destruction of the integrated circuit itself. While the majority of existing detection schemes focus on test-time, they all require expensive methodologies to detect hardware trojans. Off-the-shelf approaches have often been overlooked due to limited hardware resources and detection accuracy. With the advances in technologies and the democratisation of open-source hardware, however, these tools enable the detection of hardware trojans at reduced costs during or after production. In this manuscript, a hardware trojan is created and emulated on a consumer FPGA board. The experiments to detect the trojan in a dormant and active state are made using off-the-shelf technologies taking advantage of different techniques such as Power Analysis Reports, Side Channel Analysis and Thermal Measurements. Furthermore, multiple attempts to detect the trojan are demonstrated and benchmarked. Our simulations result in a state-of-the-art methodology to accurately detect the trojan in both dormant and active states using off-the-shelf hardware