Development of Josephson voltage standards

Neurology & clinical neurophysiolog

Chapter Development of Josephson voltage standards

Neurology & clinical neurophysiolog

Present and future of high-temperature superconductor quantum-based voltage standards

This paper presents a brief overview of the current state-of-the-art of Josephson junctions for Quantum-based Voltage Standards fabricated with High-Temperature Superconductors (HTS). A short introduction on the history and technical evolution of Low Temperature Superconductors (LTS) technology is provided for non-specialists. Then HTS technology is summarized and discussed in the context of quantum voltage standard applications. Finally, the two most promising technologies: bicrystal and Focused Helium-Ion Beam junctions are discussed with more detail, analyzing strength, limitations and perspectives in both cases

Realization of superconducting quantum devices based on tunnel Josephson junctions by micro and nanofabrication techniques

This PhD Thesis is focused on the realization of superconducting quantum devices based on overdamped Nb/Al-AlOx/Nb SNIS (Superconductor - Normal metal - Insulator - Superconductor) tunneling Josephson junctions, interesting for several application fields (voltage metrology, digital electronics, radiation sensors, nanoSQUID, etc.). The challenges faced by quantum electronics and metrology are directing the new generations of devices towards smaller dimensions and higher levels of integration. Taking into account this requirement, the fabrication of SNIS-based devices has been addressed on downscaling the junction dimensions form the micro to the nanoscale. In particular, the effective area of junctions has been reduced exploiting three different lithographic techniques: the optical lithography to realize SNISs for a micrometer resolution, the Electron Beam Lithography (EBL) at the subµm and, finally, the Focused Ion Beam (FIB) sculpting method to achieve nanometer sizes. Specifically, prototypes have been realized exploiting the thin film technology, to guarantee a good control of electrical parameters of junctions, a higher reproducibility of their current-voltage I-V characteristics, and an accurate dimension control. Reliable and simpler fabrication processes have been implemented and validated, and the device downscaling was pursued without affecting the fundamental properties of SNIS junctions such as the non hysteretic I-V response and the skill on generating quantised voltage steps under radiofrequency irradiation. This work has thereby led to the definition and validation of a new generation of devices and processes down to the nanometer scale, and these approaches represent precious experiences of nanofabrication valuable for new research activities and projects

Programmierbare Josephson-Arrays für Impedanzmessungen

An innovative way of networking two programmable Josephson arrays generating synchronous waveforms for impedance ratio measurements, as the first of its kind, is presented. This pioneering approach of the Josephson Impedance Bridges is far more flexible than conventional bridges at the same level of measurement uncertainty. Results prove that aside from having the capability of measuring over a wider frequency range, the Josephson bridge permits measurements on two impedances with any value of phase angle between them. In the two-terminal-pair Josephson bridge setup, measurements are made for a 1:1 resistance ratio at the 10-k level in the frequency range between 25 Hz and 10 kHz. Uncertainties reach to levels of better than a few parts in 108 and results agree to the values measured from conventional impedance bridges. Two methods for four-terminal impedance measurements have been investigated, the potential comparison circuit and the coaxial setup. Both methods are capable of measuring from DC to 6 kHz with uncertainties to 10−8. The four-terminal-pair coaxial setup has potential to decrease the relative uncertainty down to 10−9 once systematic errors are analyzed and canceled. Thermal converter measurements have been made to investigate the effects of transients on stepwise approximated sinewaves. Rms measurements show that transients limit the uncertainty to about 10−6 at 1 kHz. A simple model with an equivalent time constant is presented to evaluate the influence of different parameters on the shape of the transients. It has been experimentally established, at the 10−8 level of uncertainty for the determination of impedance ratios, that the variations of the transients in stepwise approximated waveforms can be neglected when using the fundamental component of rectangular waveforms. Quantization at up to 10 kHz has been confirmed by varying the bias current of the Josephson arrays resulting in constant resistance ratios within the measurement resolution.Ein innovativer Weg, zwei programmierbare Josephson-Schaltungen für Impedanz-Verhältnismessungen zu verknüpfen, wird erstmals in dieser Arbeit präsentiert. Dieser neuartige Ansatz einer Josephson-Impedanzmessbrücke ist flexibler als konventionelle Impedanzmessbrücken bei gleicher Messunsicherheit. Es wird gezeigt, dass neben der Möglichkeit, über einen wesentlich größeren Frequenzbereich zu messen, die Josephson-Impedanzmessbrücke auch Messungen sehr unterschiedlicher Impedanzverhältnisse und beliebiger Phasenwinkel erlaubt. In einer Zwei-Tor-Anordnung der Josephson-Impedanzmessbrücke wurden Messungen für ein 1:1 Widerstandsverhältnis bei 10 k im Frequenzbereich von 25 Hz bis 10 kHz durchgeführt. Die Ergebnisse stimmen mit denen einer konventionellen Messbrücke im Rahmen der Unsicherheit von wenigen 10−8 überein. Für eine Vier-Tor-Anordnung wurden zwei unterschiedliche Methoden untersucht, eine Spannungsverhältnisschaltung und eine koaxiale Vier-Tor-Anordnung. Letztere hat das Potential, Unsicherheiten von 10−9 zu erreichen, sobald systematische Fehler eliminiert sind. Um Effekte der Transienten in stufenförmig approximierten Sinuswellen zu untersuchen, wurden Messungen an Thermokonvertern durchgeführt. Diese Effektivmessungen zeigen, dass Transienten die relative Messunsicherheiten auf etwa 10−6 bei einer Frequenz von 1 kHz beschränken. Es wird ein einfaches Modell vorgestellt, das die Form der Transienten in Abhängigkeit der wesentlichen Parameter beschreibt. Experimentell konnte bei Impedanzverhältnismessungen mit einer relativen Messunsicherheit von 10−8 nachgewiesen werden, dass die Variation der Transienten in stufenförmig approximierten Wellenformen vernachlässigbar ist, wenn die fundamentale Komponente eines Rechtecksignals verwendet wird. Quantisierte Plateaus wurden bis zu Frequenzen von 10 kHz gefunden, bei denen die Variation des angelegten Stroms durch die Josephson-Schaltungen keine Veränderung des Impedanzverhältnisses zur Folge hatte

Towards single-electron metrology

We review the status of the understanding of single-electron transport (SET) devices with respect to their applicability in metrology. Their envisioned role as the basis of a high-precision electrical standard is outlined and is discussed in the context of other standards. The operation principles of single electron transistors, turnstiles and pumps are explained and the fundamental limits of these devices are discussed in detail. We describe the various physical mechanisms that influence the device uncertainty and review the analytical and numerical methods needed to calculate the intrinsic uncertainty and to optimise the fabrication and operation parameters. Recent experimental results are evaluated and compared with theoretical predictions. Although there are discrepancies between theory and experiments, the intrinsic uncertainty is already small enough to start preparing for the first SET-based metrological applications.Comment: 39 pages, 14 figures. Review paper to be published in International Journal of Modern Physics

Focused Ion Beam Fabricated Non-equilibrium Superconducting Devices

The developments over the last decade in Focused Ion Beam (FIB) instrument technology have reached a point where there is sufficient control of an ion beam to make cuts, trenches, and other shapes in a sample on a scale of tens of nanometers. This work concentrates on the use of an FIB instrument for making superconducting devices. It is shown for the first time that planar-bridge (Nb/Cu/Nb) Superconductor/Normalmetal/ Superconductor (SNS) junctions can be reliably fabricated using a standard FIB instrument. This is demonstrated by the responses of junctions to microwaves and magnetic fields; the junctions display the appropriate Josephson behaviour demanded by current technological applications. In addition, the reproducibility in junction behaviour (the variation of critical current is approximately 10%) is the best so far observed for this type of junction. The SNS junction fabrication method has been successfully extended for making high-density SNS junction arrays, dc-SQUIDs, and related devices. A simple model is devised to explain the normal-state resistance and critical current of a junction. The model is based on the geometry of a junction as defined by the FIB instrument and the film deposition. The model is mostly successful in qualitatively explaining many of the geometrical factors that affect the electrical properties of the junction. Nb/Cu/Nb junction series arrays, made using an FIB instrument, are also successfully fabricated. The yield of the junctions forming small arrays is found to be similar to the yield of single junctions. For the series arrays studied here, new observations have been made: the electrical properties of an array have been found to be dependent on the spacing of the junctions and the number of junctions in the array. This work also investigates the thermal properties of SNS and micron-scale superconductor/insulator/normal-metal junction based devices for use in bolometer device based applications. It is shown that self-heating raises the temperature of the junctions significantly above their operating temperatures. For a device sitting on a low thermally conductive membrane, it is found that the effects of heating, or cooling, in the junctions are exaggerated