9,855 research outputs found

    Gate Delay Fault Test Generation for Non-Scan Circuits

    Get PDF
    This article presents a technique for the extension of delay fault test pattern generation to synchronous sequential circuits without making use of scan techniques. The technique relies on the coupling of TDgen, a robust combinational test pattern generator for delay faults, and SEMILET, a sequential test pattern generator for several static fault models. The approach uses a forward propagation-backward justification technique: The test pattern generation is started at the fault location, and after successful ¿local¿ test generation fault effect propagation is performed and finally a synchronising sequence to the required state is computed. The algorithm is complete for a robust gate delay fault model, which means that for every testable fault a test will be generated, assuming sufficient time. Experimental results for the ISCAS'89 benchmarks are presented in this pape

    Single-Event Upset Analysis and Protection in High Speed Circuits

    Get PDF
    The effect of single-event transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at the input of a flip-flop and consequently is latched in the flip-flop and generates a soft-error. When an SET conjoined with a transition at a node along a critical path of the combinational part of a design, a transient delay fault may occur at the input of a flip-flop. On the other hand, increasing pipeline depth and using low power techniques such as multi-level power supply, and multi-threshold transistor convert almost all paths in a circuit to critical ones. Thus, studying the behavior of the SET in these kinds of circuits needs special attention. This paper studies the dynamic behavior of a circuit with massive critical paths in the presence of an SET. We also propose a novel flip-flop architecture to mitigate the effects of such SETs in combinational circuits. Furthermore, the proposed architecture can tolerant a single event upset (SEU) caused by particle strike on the internal nodes of a flip-flo

    Computer program detects transient malfunctions in switching circuits

    Get PDF
    A program which accepts a system model in the form of Boolean equations and solves these equations using a ternary algebra will determine the response of large combinational and sequencial switching circuits to given input changes, taking into account malfunctions due to races, hazards, and oscillations

    Deductive Fault Simulation Technique for Asynchronous Circuits

    Get PDF
    Fault simulator for acpASC needs to deal with hazards, oscillations and races. The simplest algorithm for simulating faults is the serial fault simulation technique which was successfully used for the acpASC. Faster fault simulation techniques, for example deductive fault simulation, was previously used for the combinational and synchronous sequential circuits only. In this paper a deductive fault simulator for the stuck-at faults of acSI acpASC is presented. An algorithm for the propagation of the fault lists is proposed which can deal with the complex gates of the acpASC. The implemented deductive fault simulator was tested using acSI benchmark circuits. The experimental results show significant reduction of the computation time and negligible increase of the memory requirements in comparison with the serial fault simulation technique

    Synthesis for Logical Initializability of Synchronous Finite State Machines

    Get PDF
    A new method is introduced for the synthesis for logical initializability of synchronous state machines. The goal is to synthesize a gate-level implementation that is initializable when simulated by a 3-valued (0,1,X) simulator. The method builds on an existing approach of Cheng and Agrawal, which uses constrained state assignment to translate functional initializability into logical initializability. Here, a different state assignment method is proposed which, unlike the method of Cheng and Agrawal, is guaranteed safe and yet is not as conservative. Furthermore, it is demonstrated that certain new constraints on combinational logic synthesis are both necessary and sufficient to insure that the resulting gate-level circuit is 3-valued simulatable. Interestingly, these constraints are similar to those used for hazard-free synthesis of asynchronous combinational circuits. Using the above constraints, we present a complete synthesis for initializability method, targeted to both two-level and multi-level circuits

    Desynchronization: Synthesis of asynchronous circuits from synchronous specifications

    Get PDF
    Asynchronous implementation techniques, which measure logic delays at run time and activate registers accordingly, are inherently more robust than their synchronous counterparts, which estimate worst-case delays at design time, and constrain the clock cycle accordingly. De-synchronization is a new paradigm to automate the design of asynchronous circuits from synchronous specifications, thus permitting widespread adoption of asynchronicity, without requiring special design skills or tools. In this paper, we first of all study different protocols for de-synchronization and formally prove their correctness, using techniques originally developed for distributed deployment of synchronous language specifications. We also provide a taxonomy of existing protocols for asynchronous latch controllers, covering in particular the four-phase handshake protocols devised in the literature for micro-pipelines. We then propose a new controller which exhibits provably maximal concurrency, and analyze the performance of desynchronized circuits with respect to the original synchronous optimized implementation. We finally prove the feasibility and effectiveness of our approach, by showing its application to a set of real designs, including a complete implementation of the DLX microprocessor architectur

    Computer programs: Electronic circuit design criteria: A compilation

    Get PDF
    A Technology Utilization Program for the dissemination of information on technological developments which have potential utility outside the aerospace community is presented. The 21 items reported herein describe programs that are applicable to electronic circuit design procedures
    corecore