Comparative Analysis of Image Fusion using DWT, PCA and BBF

Now-a-days, medical image fusion is one of the upcoming fields which helps in easy diagnostics and helps to bring down the time gap between the diagnosis of the disease and the treatment. In Magnetic Resonance Image (MRI), anatomy and soft tissues are visible and it has high spatial resolution. In Computed Tomography (CT) images bony structures appears brighter. Analysis is done to determine the image fusion algorithm which is more suitable for clinical diagnosis. Analysis is also done on image quality assessment parameters of image fusion. Image fusion is of extraordinary significance in safeguard and data from various images of same scene. It has been reasoned that image fusion utilizing wavelets with larger amount of disintegration indicated better execution in a few measurements and in different measurements PCA demonstrated better execution. We also illustrate different results based on all three methodology and compare results based on time and quality of images using PSNR

Three-dimensional fluorescent microscopy via simultaneous illumination and detection at multiple planes.

The conventional optical microscope is an inherently two-dimensional (2D) imaging tool. The objective lens, eyepiece and image sensor are all designed to capture light emitted from a 2D 'object plane'. Existing technologies, such as confocal or light sheet fluorescence microscopy have to utilize mechanical scanning, a time-multiplexing process, to capture a 3D image. In this paper, we present a 3D optical microscopy method based upon simultaneously illuminating and detecting multiple focal planes. This is implemented by adding two diffractive optical elements to modify the illumination and detection optics. We demonstrate that the image quality of this technique is comparable to conventional light sheet fluorescent microscopy with the advantage of the simultaneous imaging of multiple axial planes and reduced number of scans required to image the whole sample volume

Implementation of Image Fusion using DWT and PCA

Now-a-days, medical image fusion is one of the upcoming fields which helps in easy diagnostics and helps to bring down the time gap between the diagnosis of the disease and the treatment. In Magnetic Resonance Image (MRI), anatomy and soft tissues are visible and it has high spatial resolution. In Computed Tomography (CT) images bony structures appears brighter. Analysis is done to determine the image fusion algorithm which is more suitable for clinical diagnosis. Analysis is also done on image quality assessment parameters of image fusion. Image fusion is of extraordinary significance in safeguard and data from various images of same scene. It has been reasoned that image fusion utilizing wavelets with larger amount of disintegration indicated better execution in a few measurements and in different measurements PCA demonstrated better execution. We also illustrate different results based on all three methodology and compare results based on time and quality of images using PSNR

SPITFIR(e): A supermaneuverable algorithm for fast denoising and deconvolution of 3D fluorescence microscopy images and videos

International audienceModern fluorescent microscopy imaging is still limited by the optical aberrations and the photon budget available in the specimen. A direct consequence is the necessity to develop flexible and "off-road" algorithms in order to recover structural details and improve spatial resolution, which is critical when restraining the illumination to low levels in order to limit photo-damages. Here, we report SPITFIR(e) a flexible method designed to accurately and quickly restore 2D-3D fluorescence microscopy images and videos (4D images). We designed a generic sparse-promoting regularizer to subtract undesirable out-of-focus background and we developed a primal-dual algorithm for fast optimization. SPITFIR(e) is a "swiss-knife" method for practitioners as it adapts to any microscopy techniques, to various sources of signal degradation (noise, blur), to variable image contents, aswell as to low signal-to-noise ratios. Our method outperforms existing state-of-the-art algorithms, and is more flexible than supervised deep-learning methods requiring ground truth datasets. The performance, the flexibility, and the ability to push the spatiotemporal resolution limit of sub-diffracted fluorescence microscopy techniques are demonstrated on experimental datasets acquired with various microscopy techniques from 3D spinning-disk confocal up to lattice light sheet microscopy

Superresolution fluorescence microscopy with structured illumination

The resolution of a conventional fluorescence microscope image is diffraction limited which achieves a spatial resolution of 200nm lateral and 500nm axial. Recently, many superresolution fluorescence microscopy techniques have been developed which allow the observation of many biological structures beyond the diffraction limit. Structured illumination microscopy (SIM) is one of them. The principle of SIM is based on using a harmonic light grid which down modulates the high spatial frequencies of the sample into the observable region of the microscope. The resolution enhancement is highly dependent on the reconstruction technique, which restores the high spatial frequencies of the sample to their original position. Common SIM reconstructions require the perfect knowledge of the illumination pattern. However, to perfectly control the harmonic illumination patterns on the sample plane is not easy in experimental implementations and this makes the experimental setup very technical. Reconstructing SIM images assuming the perfect knowledge of the illumination intensity patterns may, therefore, introduce artifacts on the estimated sample due to the misalignment of the grid that can occur during experimental acquisitions. To tackle this drawback of SIM, in this these, we have developed blind-SIM reconstruction strategies which are independent of the illumination patterns. Using the 3D blind-SIM reconstruction strategies we extended the harmonic SIM to speckle illumination microscopy which uses random unknown speckle patterns that need no control, unlike the harmonic grid patterns. For harmonic-SIM images, since incorporating some information about illumination patterns is valuable, we have developed a 3D positive filtered blind-SIM reconstruction which confines the iterative estimation of the illuminations in the vicinity of the Fourier peaks (using carefully designed Fourier filter masks) in the Fourier space. Using blind-SIM reconstruction techniques a lateral resolution of about 100nm and axial resolution of about 200nm is obtained in both speckle and harmonic SIM. In addition, to reduce the out-of-focus problem in widefield images, a simple computational technique which is based on reconstructing 2D data with 3D PSF is developed based on blind-SIM reconstruction. Moreover, to combine the functionalities of SIM and light sheet microscopy, as a proof of concept, we have developed a simple microscope setup which produces a structured light sheet illumination pattern.La microscopie de fluorescence optique est l’un des outils les plus puissants pour étudier les structures cellulaires et moléculaires au niveau subcellulaire. La résolution d’une image de microscope conventionnel à fluorescence est limitée par la diffraction, ce qui permet d’obtenir une résolution spatiale latérale de 200nm et axiale de 500nm. Récemment, de nombreuses techniques de microscopie de fluorescence de super-résolution ont été développées pour permettre d’observer de nombreuses structures biologiques au-delà de la limite de diffraction. La microscopie d’illumination structurée (SIM) est l’une de ces technologies. Le principe de la SIM est basé sur l’utilisation d’une grille de lumière harmonique qui permet de translater les hautes fréquences spatiales de l’échantillon vers la région d’observation du microscope. L’amélioration de la résolution de cette technologie de microscopie dépend fortement de la technique de reconstruction, qui rétablit les hautes fréquences spatiales de l’échantillon dans leur position d’origine. Les méthodes classiques de reconstruction SIM nécessitent une connaissance parfaite de l’illumination de l’échantillon. Cependant, l’implémentation d’un contrôle parfait de l’illumination harmonique sur le plan de l’échantillon n’est pas facile expérimentalement et il présente un grand défi. L’hypothèse de la connaissance parfaite de l’intensité de la lumière illuminant l’échantillon en SIM peut donc introduire des artefacts sur l’image reconstruite de l’échantillon, à cause des erreurs d’alignement de la grille qui peuvent se présenter lors de l’acquisition expérimentale. Afin de surmonter ce défi, nous avons développé dans cette thèse des stratégies de reconstruction «aveugle» qui sont indépendantes de d’illumination. À l’aide de ces stratégies de reconstruction dites «blind-SIM», nous avons étendu la SIM harmonique pour l’appliquer aux cas de «SIM-speckle» qui utilisent des illuminations aléatoires et inconnues qui contrairement à l’illumination harmonique, ne nécessitent pas de controle. Comme il est utile de récupérer des informations sur l’illumination en SIM harmonique, nous avons développé une reconstruction blind-SIM tridimensionnel et filtrée qui confine l’estimation itérative des illuminations au voisinage des pics dans l’espace de Fourier, en utilisant des masques de filtre de Fourier soigneusement conçus. En utilisant des techniques de reconstruction blind-SIM, une résolution latérale d’environ 100 nm et une résolution axiale d’environ 200 nm sont obtenues, à la fois en SIM harmonique et en SIM speckle. En outre, pour réduire le problème de focalisation dans les images de champ large, une technique de calcul simple qui repose sur la reconstruction bidimensionnel de données à partir de PSF tridimensionnel est développée. En outre, afin de combiner à la fois les fonctionnalités de la SIM et de la microscopie á nappe de lumière, en tant que preuve de concept, nous avons développé une configuration de microscope simple qui produit une nappe de lumière structuré

Superresolution fluorescence microscopy with structured illumination

Cotutela Universitat Politècnica de Catalunya i Aix-Marseille UniversitéThe resolution of a conventional fluorescence microscope image is diffraction limited which achieves a spatial resolution of 200nm lateral and 500nm axial. Recently, many superresolution fluorescence microscopy techniques have been developed which allow the observation of many biological structures beyond the diffraction limit. Structured illumination microscopy (SIM) is one of them. The principle of SIM is based on using a harmonic light grid which down modulates the high spatial frequencies of the sample into the observable region of the microscope. The resolution enhancement is highly dependent on the reconstruction technique, which restores the high spatial frequencies of the sample to their original position. Common SIM reconstructions require the perfect knowledge of the illumination pattern. However, to perfectly control the harmonic illumination patterns on the sample plane is not easy in experimental implementations and this makes the experimental setup very technical. Reconstructing SIM images assuming the perfect knowledge of the illumination intensity patterns may, therefore, introduce artifacts on the estimated sample due to the misalignment of the grid that can occur during experimental acquisitions. To tackle this drawback of SIM, in this these, we have developed blind-SIM reconstruction strategies which are independent of the illumination patterns. Using the 3D blind-SIM reconstruction strategies we extended the harmonic SIM to speckle illumination microscopy which uses random unknown speckle patterns that need no control, unlike the harmonic grid patterns. For harmonic-SIM images, since incorporating some information about illumination patterns is valuable, we have developed a 3D positive filtered blind-SIM reconstruction which confines the iterative estimation of the illuminations in the vicinity of the Fourier peaks (using carefully designed Fourier filter masks) in the Fourier space. Using blind-SIM reconstruction techniques a lateral resolution of about 100nm and axial resolution of about 200nm is obtained in both speckle and harmonic SIM. In addition, to reduce the out-of-focus problem in widefield images, a simple computational technique which is based on reconstructing 2D data with 3D PSF is developed based on blind-SIM reconstruction. Moreover, to combine the functionalities of SIM and light sheet microscopy, as a proof of concept, we have developed a simple microscope setup which produces a structured light sheet illumination pattern.La microscopie de fluorescence optique est l’un des outils les plus puissants pour étudier les structures cellulaires et moléculaires au niveau subcellulaire. La résolution d’une image de microscope conventionnel à fluorescence est limitée par la diffraction, ce qui permet d’obtenir une résolution spatiale latérale de 200nm et axiale de 500nm. Récemment, de nombreuses techniques de microscopie de fluorescence de super-résolution ont été développées pour permettre d’observer de nombreuses structures biologiques au-delà de la limite de diffraction. La microscopie d’illumination structurée (SIM) est l’une de ces technologies. Le principe de la SIM est basé sur l’utilisation d’une grille de lumière harmonique qui permet de translater les hautes fréquences spatiales de l’échantillon vers la région d’observation du microscope. L’amélioration de la résolution de cette technologie de microscopie dépend fortement de la technique de reconstruction, qui rétablit les hautes fréquences spatiales de l’échantillon dans leur position d’origine. Les méthodes classiques de reconstruction SIM nécessitent une connaissance parfaite de l’illumination de l’échantillon. Cependant, l’implémentation d’un contrôle parfait de l’illumination harmonique sur le plan de l’échantillon n’est pas facile expérimentalement et il présente un grand défi. L’hypothèse de la connaissance parfaite de l’intensité de la lumière illuminant l’échantillon en SIM peut donc introduire des artefacts sur l’image reconstruite de l’échantillon, à cause des erreurs d’alignement de la grille qui peuvent se présenter lors de l’acquisition expérimentale. Afin de surmonter ce défi, nous avons développé dans cette thèse des stratégies de reconstruction «aveugle» qui sont indépendantes de d’illumination. À l’aide de ces stratégies de reconstruction dites «blind-SIM», nous avons étendu la SIM harmonique pour l’appliquer aux cas de «SIM-speckle» qui utilisent des illuminations aléatoires et inconnues qui contrairement à l’illumination harmonique, ne nécessitent pas de controle. Comme il est utile de récupérer des informations sur l’illumination en SIM harmonique, nous avons développé une reconstruction blind-SIM tridimensionnel et filtrée qui confine l’estimation itérative des illuminations au voisinage des pics dans l’espace de Fourier, en utilisant des masques de filtre de Fourier soigneusement conçus. En utilisant des techniques de reconstruction blind-SIM, une résolution latérale d’environ 100 nm et une résolution axiale d’environ 200 nm sont obtenues, à la fois en SIM harmonique et en SIM speckle. En outre, pour réduire le problème de focalisation dans les images de champ large, une technique de calcul simple qui repose sur la reconstruction bidimensionnel de données à partir de PSF tridimensionnel est développée. En outre, afin de combiner à la fois les fonctionnalités de la SIM et de la microscopie á nappe de lumière, en tant que preuve de concept, nous avons développé une configuration de microscope simple qui produit une nappe de lumière structuréePostprint (published version

Super-resolution structured illumination microscopy: past, present and future.

Structured illumination microscopy (SIM) has emerged as an essential technique for three-dimensional (3D) and live-cell super-resolution imaging. However, to date, there has not been a dedicated workshop or journal issue covering the various aspects of SIM, from bespoke hardware and software development and the use of commercial instruments to biological applications. This special issue aims to recap recent developments as well as outline future trends. In addition to SIM, we cover related topics such as complementary super-resolution microscopy techniques, computational imaging, visualization and image processing methods. This article is part of the Theo Murphy meeting issue 'Super-resolution structured illumination microscopy (part 1)'