Realizing a Deterministic Source of Multipartite-Entangled Photonic Qubits

Sources of entangled electromagnetic radiation are a cornerstone in quantum information processing and offer unique opportunities for the study of quantum many-body physics in a controlled experimental setting. While multi-mode entangled states of radiation have been generated in various platforms, all previous experiments are either probabilistic or restricted to generate specific types of states with a moderate entanglement length. Here, we demonstrate the fully deterministic generation of purely photonic entangled states such as the cluster, GHZ, and W state by sequentially emitting microwave photons from a controlled auxiliary system into a waveguide. We tomographically reconstruct the entire quantum many-body state for up to $N=4$ photonic modes and infer the quantum state for even larger $N$ from process tomography. We estimate that localizable entanglement persists over a distance of approximately ten photonic qubits, outperforming any previous deterministic scheme

VLSI Testing and Test Power

This paper first reviews the basics of VLSI testing, focusing on test generation and design for testability. Then it discusses the impact of test power in scan testing, and highlights the need for low-power VLSI testing.2011 International Green Computing Conference and Workshops (IGCC 2011), July 25-28, 2011, Orlando, FL, US

Fault-tolerant computer study

A set of building block circuits is described which can be used with commercially available microprocessors and memories to implement fault tolerant distributed computer systems. Each building block circuit is intended for VLSI implementation as a single chip. Several building blocks and associated processor and memory chips form a self checking computer module with self contained input output and interfaces to redundant communications buses. Fault tolerance is achieved by connecting self checking computer modules into a redundant network in which backup buses and computer modules are provided to circumvent failures. The requirements and design methodology which led to the definition of the building block circuits are discussed