On Timing Model Extraction and Hierarchical Statistical Timing Analysis

In this paper, we investigate the challenges to apply Statistical Static Timing Analysis (SSTA) in hierarchical design flow, where modules supplied by IP vendors are used to hide design details for IP protection and to reduce the complexity of design and verification. For the three basic circuit types, combinational, flip-flop-based and latch-controlled, we propose methods to extract timing models which contain interfacing as well as compressed internal constraints. Using these compact timing models the runtime of full-chip timing analysis can be reduced, while circuit details from IP vendors are not exposed. We also propose a method to reconstruct the correlation between modules during full-chip timing analysis. This correlation can not be incorporated into timing models because it depends on the layout of the corresponding modules in the chip. In addition, we investigate how to apply the extracted timing models with the reconstructed correlation to evaluate the performance of the complete design. Experiments demonstrate that using the extracted timing models and reconstructed correlation full-chip timing analysis can be several times faster than applying the flattened circuit directly, while the accuracy of statistical timing analysis is still well maintained

Modeling and Energy Optimization of LDPC Decoder Circuits with Timing Violations

This paper proposes a "quasi-synchronous" design approach for signal processing circuits, in which timing violations are permitted, but without the need for a hardware compensation mechanism. The case of a low-density parity-check (LDPC) decoder is studied, and a method for accurately modeling the effect of timing violations at a high level of abstraction is presented. The error-correction performance of code ensembles is then evaluated using density evolution while taking into account the effect of timing faults. Following this, several quasi-synchronous LDPC decoder circuits based on the offset min-sum algorithm are optimized, providing a 23%-40% reduction in energy consumption or energy-delay product, while achieving the same performance and occupying the same area as conventional synchronous circuits.Comment: To appear in IEEE Transactions on Communication

Development of reliability methodology for systems engineering. Volume II - Application - Design reliability analysis of a 250 volt-ampere static inverter Final report

Design stage reliability analysis application to static inverte

Neural population coding: combining insights from microscopic and mass signals

Behavior relies on the distributed and coordinated activity of neural populations. Population activity can be measured using multi-neuron recordings and neuroimaging. Neural recordings reveal how the heterogeneity, sparseness, timing, and correlation of population activity shape information processing in local networks, whereas neuroimaging shows how long-range coupling and brain states impact on local activity and perception. To obtain an integrated perspective on neural information processing we need to combine knowledge from both levels of investigation. We review recent progress of how neural recordings, neuroimaging, and computational approaches begin to elucidate how interactions between local neural population activity and large-scale dynamics shape the structure and coding capacity of local information representations, make them state-dependent, and control distributed populations that collectively shape behavior

Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations

We present the detailed results of the application of mathematical optimization algorithms to transistor sizing in a full-adder cell design, to obtain the maximum expected fabrication yield. The approach takes into account all the fabrication process parameter variations specified in an industrial PDK, in addition to operating condition range and NBTI aging. The final design solutions present transistor sizing, which depart from intuitive transistor sizing criteria and show dramatic yield improvements, which have been verified by Monte Carlo SPICE analysis

Reliability analysis of timing channel circuits in a static inverter

Timing channel circuit reliability in static inverte

EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers

At nanometer manufacturing technology nodes, process variations significantly affect circuit performance. To combat them, post- silicon clock tuning buffers can be deployed to balance timing bud- gets of critical paths for each individual chip after manufacturing. The challenge of this method is that path delays should be mea- sured for each chip to configure the tuning buffers properly. Current methods for this delay measurement rely on path-wise frequency stepping. This strategy, however, requires too much time from ex- pensive testers. In this paper, we propose an efficient delay test framework (EffiTest) to solve the post-silicon testing problem by aligning path delays using the already-existing tuning buffers in the circuit. In addition, we only test representative paths and the delays of other paths are estimated by statistical delay prediction. Exper- imental results demonstrate that the proposed method can reduce the number of frequency stepping iterations by more than 94% with only a slight yield loss.Comment: ACM/IEEE Design Automation Conference (DAC), June 201

Statistical Power Supply Dynamic Noise Prediction in Hierarchical Power Grid and Package Networks

One of the most crucial high performance systems-on-chip design challenge is to front their power supply noise sufferance due to high frequencies, huge number of functional blocks and technology scaling down. Marking a difference from traditional post physical-design static voltage drop analysis, /a priori dynamic voltage drop/evaluation is the focus of this work. It takes into account transient currents and on-chip and package /RLC/ parasitics while exploring the power grid design solution space: Design countermeasures can be thus early defined and long post physical-design verification cycles can be shortened. As shown by an extensive set of results, a carefully extracted and modular grid library assures realistic evaluation of parasitics impact on noise and facilitates the power network construction; furthermore statistical analysis guarantees a correct current envelope evaluation and Spice simulations endorse reliable result