An experiment in software reliability

The results of a software reliability experiment conducted in a controlled laboratory setting are reported. The experiment was undertaken to gather data on software failures and is one in a series of experiments being pursued by the Fault Tolerant Systems Branch of NASA Langley Research Center to find a means of credibly performing reliability evaluations of flight control software. The experiment tests a small sample of implementations of radar tracking software having ultra-reliability requirements and uses n-version programming for error detection, and repetitive run modeling for failure and fault rate estimation. The experiment results agree with those of Nagel and Skrivan in that the program error rates suggest an approximate log-linear pattern and the individual faults occurred with significantly different error rates. Additional analysis of the experimental data raises new questions concerning the phenomenon of interacting faults. This phenomenon may provide one explanation for software reliability decay

Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis

FAUSTA: Scaling Dynamic Analysis with Traffic Generation at WhatsApp

We introduce Fausta, an algorithmic traffic gener-ation platform that enables analysis and testing at scale. Fausta has been deployed at Meta to analyze and test the WhatsApp plat-form infrastructure since September 2020, enabling WhatsApp developers to deploy reliable code changes to a code base of millions of lines of code, supporting over 2 billion users who rely on WhatsApp for their daily communications. Fausta covers expected and unexpected program behaviors in a privacy-safe controlled environment to support multiple use cases such as reliability testing, privacy analysis and performance regression detection. It currently supports three different algorithmic input generation strategies, each of which construct realistic backend server traffic that closely simulates production data, without replaying any real user data. Fausta has been deployed and closely integrated into the WhatsApp continuous integration process, catching bugs in development before they hit production. We report on the development and deployment of Fausta's reliability use case between September 2020 and August 2021. During this period it has found 1,876 unique reliability issues, with a fix rate of 74%, indicating a high degree of true positive fault revelation. We also report on the distribution of fault types revealed by Fausta, and the correlation between coverage and faults found. Overall, we do find evidence that higher coverage is correlated with fault revelation

Design of Hardware with Quantifiable Security against Reverse Engineering

Semiconductors are a 412 billion dollar industry and integrated circuits take on important roles in human life, from everyday use in smart-devices to critical applications like healthcare and aviation. Saving today\u27s hardware systems from attackers can be a huge concern considering the budget spent on designing these chips and the sensitive information they may contain. In particular, after fabrication, the chip can be subject to a malicious reverse engineer that tries to invasively figure out the function of the chip or other sensitive data. Subsequent to an attack, a system can be subject to cloning, counterfeiting, or IP theft. This dissertation addresses some issues concerning the security of hardware systems in such scenarios. First, the issue of privacy risks from approximate computing is investigated in Chapter 2. Simulation experiments show that the erroneous outputs produced on each chip instance can reveal the identity of the chip that performed the computation, which jeopardizes user privacy. The next two chapters deal with camouflaging, which is a technique to prevent reverse engineering from extracting circuit information from the layout. Chapter 3 provides a design automation method to protect camouflaged circuits against an adversary with prior knowledge about the circuit\u27s viable functions. Chapter 4 provides a method to reverse engineer camouflaged circuits. The proposed reverse engineering formulation uses Boolean Satisfiability (SAT) solving in a way that incorporates laser fault injection and laser voltage probing capabilities to figure out the function of an aggressively camouflaged circuit with unknown gate functions and connections. Chapter 5 addresses the challenge of secure key storage in hardware by proposing a new key storage method that applies threshold-defined behavior of memory cells to store secret information in a way that achieves a high degree of protection against invasive reverse engineering. This approach requires foundry support to encode the secrets as threshold voltage offsets in transistors. In Chapter 6, a secret key storage approach is introduced that does not rely on a trusted foundry. This approach only relies on the foundry to fabricate the hardware infrastructure for key generation but not to encode the secret key. The key is programmed by the IP integrator or the user after fabrication via directed accelerated aging of transistors. Additionally, this chapter presents the design of a working hardware prototype on PCB that demonstrates this scheme. Finally, chapter 7 concludes the dissertation and summarizes possible future research

cphVB: A System for Automated Runtime Optimization and Parallelization of Vectorized Applications

Modern processor architectures, in addition to having still more cores, also require still more consideration to memory-layout in order to run at full capacity. The usefulness of most languages is deprecating as their abstractions, structures or objects are hard to map onto modern processor architectures efficiently. The work in this paper introduces a new abstract machine framework, cphVB, that enables vector oriented high-level programming languages to map onto a broad range of architectures efficiently. The idea is to close the gap between high-level languages and hardware optimized low-level implementations. By translating high-level vector operations into an intermediate vector bytecode, cphVB enables specialized vector engines to efficiently execute the vector operations. The primary success parameters are to maintain a complete abstraction from low-level details and to provide efficient code execution across different, modern, processors. We evaluate the presented design through a setup that targets multi-core CPU architectures. We evaluate the performance of the implementation using Python implementations of well-known algorithms: a jacobi solver, a kNN search, a shallow water simulation and a synthetic stencil simulation. All demonstrate good performance

An Assessment of PIER Electric Grid Research 2003-2014 White Paper

This white paper describes the circumstances in California around the turn of the 21st century that led the California Energy Commission (CEC) to direct additional Public Interest Energy Research funds to address critical electric grid issues, especially those arising from integrating high penetrations of variable renewable generation with the electric grid. It contains an assessment of the beneficial science and technology advances of the resultant portfolio of electric grid research projects administered under the direction of the CEC by a competitively selected contractor, the University of California’s California Institute for Energy and the Environment, from 2003-2014

Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults

In this work, the effect of randomly distributed stuck-at faults (SAFs) in memristive crosspoint array (CPA)-based single and multi-layer perceptrons (SLPs and MLPs, respectively) intended for pattern recognition tasks is investigated by means of realistic SPICE simulations. The quasi-static memdiode model (QMM) is considered here for the modelling of the synaptic weights implemented with memristors. Following the standard memristive approach, the QMM comprises two coupled equations, one for the electron transport based on the double-diode equation with a single series resistance and a second equation for the internal memory state of the device based on the so-called logistic hysteron. By modifying the state parameter in the current-voltage characteristic, SAFs of different severeness are simulated and the final outcome is analysed. Supervised ex-situ training and two well-known image datasets involving hand-written digits and human faces are employed to assess the inference accuracy of the SLP as a function of the faulty device ratio. The roles played by the memristor’s electrical parameters, line resistance, mapping strategy, image pixelation, and fault type (stuck-at-ON or stuck-at-OFF) on the CPA performance are statistically analysed following a Monte-Carlo approach. Three different re-mapping schemes to help mitigate the effect of the SAFs in the SLP inference phase are thoroughly investigated.In this work, the effect of randomly distributed stuck-at faults (SAFs) in memristive cross-point array (CPA)-based single and multi-layer perceptrons (SLPs and MLPs, respectively) intended for pattern recognition tasks is investigated by means of realistic SPICE simulations. The quasi-static memdiode model (QMM) is considered here for the modelling of the synaptic weights implemented with memristors. Following the standard memristive approach, the QMM comprises two coupled equations, one for the electron transport based on the double-diode equation with a single series resistance and a second equation for the internal memory state of the device based on the so-called logistic hysteron. By modifying the state parameter in the current-voltage characteristic, SAFs of different severeness are simulated and the final outcome is analysed. Supervised ex-situ training and two well-known image datasets involving hand-written digits and human faces are employed to assess the inference accuracy of the SLP as a function of the faulty device ratio. The roles played by the memristor?s electrical parameters, line resistance, mapping strategy, image pixelation, and fault type (stuck-at-ON or stuck-at-OFF) on the CPA performance are statistically analysed following a Monte-Carlo approach. Three different re-mapping schemes to help mitigate the effect of the SAFs in the SLP inference phase are thoroughly investigated.Fil: Aguirre, Fernando Leonel. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina. Universitat Autònoma de Barcelona; España. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Pazos, Sebastián Matías. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Palumbo, Félix Roberto Mario. Universidad Tecnológica Nacional. Facultad Regional Buenos Aires. Unidad de Investigación y Desarrollo de las Ingenierías; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Morell, Antoni. Universitat Autònoma de Barcelona; EspañaFil: Suñé, Jordi. Universitat Autònoma de Barcelona; EspañaFil: Miranda, Enrique. Universitat Autònoma de Barcelona; Españ