One-Tape Turing Machine Variants and Language Recognition

We present two restricted versions of one-tape Turing machines. Both characterize the class of context-free languages. In the first version, proposed by Hibbard in 1967 and called limited automata, each tape cell can be rewritten only in the first $d$ visits, for a fixed constant $d\geq 2$. Furthermore, for $d=2$ deterministic limited automata are equivalent to deterministic pushdown automata, namely they characterize deterministic context-free languages. Further restricting the possible operations, we consider strongly limited automata. These models still characterize context-free languages. However, the deterministic version is less powerful than the deterministic version of limited automata. In fact, there exist deterministic context-free languages that are not accepted by any deterministic strongly limited automaton.Comment: 20 pages. This article will appear in the Complexity Theory Column of the September 2015 issue of SIGACT New

LSI/VLSI design for testability analysis and general approach

The incorporation of testability characteristics into large scale digital design is not only necessary for, but also pertinent to effective device testing and enhancement of device reliability. There are at least three major DFT techniques, namely, the self checking, the LSSD, and the partitioning techniques, each of which can be incorporated into a logic design to achieve a specific set of testability and reliability requirements. Detailed analysis of the design theory, implementation, fault coverage, hardware requirements, application limitations, etc., of each of these techniques are also presented

Optimized synthesis of self-testable finite state machines

A synthesis procedure for self-testable finite state machines is presented. Testability comes under consideration when the behavioral description of the circuit is being transformed into a structural description. To this end, a novel state encoding algorithm, as well as a modified self-test architecture, is developed. Experimental results show that this approach leads to a significant reduction of hardware overhead. Self-testing circuits generally employ linear feedback shift registers for pattern generation. The impact of choosing a particular feedback polynomial on the state encoding is discussed

Area-power-delay trade-off in logic synthesis

This thesis introduces new concepts to perform area-power-delay trade-offs in a logic synthesis system. To achieve this, a new delay model is presented, which gives accurate delay estimations for arbitrary sets of Boolean expressions. This allows use of this delay model already during the very first steps of logic synthesis. Furthermore, new algorithms are presented for a number of different optimization tasks within logic synthesis. There are new algorithms to create prime irredundant Boo lean expressions, to perform technology mapping for use with standard cell generators, and to perform gate sizing. To prove the validity of the presented ideas, benchmark results are given throughout the thesis

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours