Investigation of fast initialization of spacecraft bubble memory systems

Bubble domain technology offers significant improvement in reliability and functionality for spacecraft onboard memory applications. In considering potential memory systems organizations, minimization of power in high capacity bubble memory systems necessitates the activation of only the desired portions of the memory. In power strobing arbitrary memory segments, a capability of fast turn on is required. Bubble device architectures, which provide redundant loop coding in the bubble devices, limit the initialization speed. Alternate initialization techniques are investigated to overcome this design limitation. An initialization technique using a small amount of external storage is demonstrated

Software-Based Self-Test of Set-Associative Cache Memories

Embedded microprocessor cache memories suffer from limited observability and controllability creating problems during in-system tests. This paper presents a procedure to transform traditional march tests into software-based self-test programs for set-associative cache memories with LRU replacement. Among all the different cache blocks in a microprocessor, testing instruction caches represents a major challenge due to limitations in two areas: 1) test patterns which must be composed of valid instruction opcodes and 2) test result observability: the results can only be observed through the results of executed instructions. For these reasons, the proposed methodology will concentrate on the implementation of test programs for instruction caches. The main contribution of this work lies in the possibility of applying state-of-the-art memory test algorithms to embedded cache memories without introducing any hardware or performance overheads and guaranteeing the detection of typical faults arising in nanometer CMOS technologie

Automated Dynamic Firmware Analysis at Scale: A Case Study on Embedded Web Interfaces

Embedded devices are becoming more widespread, interconnected, and web-enabled than ever. However, recent studies showed that these devices are far from being secure. Moreover, many embedded systems rely on web interfaces for user interaction or administration. Unfortunately, web security is known to be difficult, and therefore the web interfaces of embedded systems represent a considerable attack surface. In this paper, we present the first fully automated framework that applies dynamic firmware analysis techniques to achieve, in a scalable manner, automated vulnerability discovery within embedded firmware images. We apply our framework to study the security of embedded web interfaces running in Commercial Off-The-Shelf (COTS) embedded devices, such as routers, DSL/cable modems, VoIP phones, IP/CCTV cameras. We introduce a methodology and implement a scalable framework for discovery of vulnerabilities in embedded web interfaces regardless of the vendor, device, or architecture. To achieve this goal, our framework performs full system emulation to achieve the execution of firmware images in a software-only environment, i.e., without involving any physical embedded devices. Then, we analyze the web interfaces within the firmware using both static and dynamic tools. We also present some interesting case-studies, and discuss the main challenges associated with the dynamic analysis of firmware images and their web interfaces and network services. The observations we make in this paper shed light on an important aspect of embedded devices which was not previously studied at a large scale. We validate our framework by testing it on 1925 firmware images from 54 different vendors. We discover important vulnerabilities in 185 firmware images, affecting nearly a quarter of vendors in our dataset. These experimental results demonstrate the effectiveness of our approach

Vendors are Undermining the Structure of U.S. Elections

As we approach the 2008 general election, the structure of elections in the United States -- once reliant on local representatives accountable to the public -- has become almost wholly dependent on large corporations, which are not accountable to the public. Most local officials charged with running elections are now unable to administer elections without the equipment, services, and trade-secret software of a small number of corporations. If the vendors withdrew their support for elections now, our election structure would collapse. Case studies presented in this report give examples of the pervasive control voting system vendors now have over election administration in almost every state, and the consequences some jurisdictions are already experiencing.However, some states and localities are recognizing the threat that vendor-dependency poses to elections. They are using ingenuity and determination to begin reversing the direction. This report examines the situation, how we got here, and steps we can take to limit corporate control of our elections in 2008 and reduce it even further in the future

Filtered Iterators For Safe and Robust Programs in RIFL

We present a new language construct, filtered iterators, for safe and robust input processing. Filtered iterators are designed to eliminate many common input-processing errors while enabling robust continued execution. The design is inspired by (a) observed common input-processing errors and (b) continued execution strategies that are implemented by developers fixing input validation errors. Filtered iterators decompose inputs into input units, atomically and automatically discarding units that trigger errors. Statistically significant results from a developer study highlight the difficulties that developers encounter when developing input-processing code using standard language constructs. These results also demonstrate the effectiveness of filtered iterators in eliminating many of these difficulties and enabling developers to produce safe and robust input-processing code

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

A Pattern Language for High-Performance Computing Resilience

High-performance computing systems (HPC) provide powerful capabilities for modeling, simulation, and data analytics for a broad class of computational problems. They enable extreme performance of the order of quadrillion floating-point arithmetic calculations per second by aggregating the power of millions of compute, memory, networking and storage components. With the rapidly growing scale and complexity of HPC systems for achieving even greater performance, ensuring their reliable operation in the face of system degradations and failures is a critical challenge. System fault events often lead the scientific applications to produce incorrect results, or may even cause their untimely termination. The sheer number of components in modern extreme-scale HPC systems and the complex interactions and dependencies among the hardware and software components, the applications, and the physical environment makes the design of practical solutions that support fault resilience a complex undertaking. To manage this complexity, we developed a methodology for designing HPC resilience solutions using design patterns. We codified the well-known techniques for handling faults, errors and failures that have been devised, applied and improved upon over the past three decades in the form of design patterns. In this paper, we present a pattern language to enable a structured approach to the development of HPC resilience solutions. The pattern language reveals the relations among the resilience patterns and provides the means to explore alternative techniques for handling a specific fault model that may have different efficiency and complexity characteristics. Using the pattern language enables the design and implementation of comprehensive resilience solutions as a set of interconnected resilience patterns that can be instantiated across layers of the system stack.Comment: Proceedings of the 22nd European Conference on Pattern Languages of Program

Expecting the Unexpected: Radiation Hardened Software

Radiation induced Single Event Effects (SEEs) are a serious problem for spacecraft flight software, potentially leading to a complete loss of mission. Conventional risk mitigation has been focused on hardware, leading to slow, expensive and outdated on-board computing devices, increased power consumption and launch mass. Our approach is to look at SEEs from a software perspective, and to explicitly design flight software so that it can detect and correct the majority of SEES. Radiation hardened flight software will reduce the significant residual residual risk for critical missions and flight phases, and enable more use of inexpensive and fast COTS hardware