Parametric Macromodels of Differential Drivers and Receivers

This paper addresses the modeling of differential drivers and receivers for the analog simulation of high-speed interconnection systems. The proposed models are based on mathematical expressions, whose parameters can be estimated from the transient responses of the modeled devices. The advantages of this macromodeling approach are: improved accuracy with respect to models based on simplified equivalent circuits of devices; improved numerical efficiency with respect to detailed transistor-level models of devices; hiding of the internal structure of devices; straightforward circuit interpretation; or implementations in analog mixed-signal simulators. The proposed methodology is demonstrated on example devices and is applied to the prediction of transient waveforms and eye diagrams of a typical low-voltage differential signaling (LVDS) data link

M[pi]log, Macromodeling via parametric identification of logic gates

This paper addresses the development of computational models of digital integrated circuit input and output buffers via the identification of nonlinear parametric models. The obtained models run in standard circuit simulation environments, offer improved accuracy and good numerical efficiency, and do not disclose information on the structure of the modeled devices. The paper reviews the basics of the parametric identification approach and illustrates its most recent extensions to handle temperature and supply voltage variations as well as power supply ports and tristate devices

Interpolation-based parameterized model order reduction of delayed systems

Three-dimensional electromagnetic methods are fundamental tools for the analysis and design of high-speed systems. These methods often generate large systems of equations, and model order reduction (MOR) methods are used to reduce such a high complexity. When the geometric dimensions become electrically large or signal waveform rise times decrease, time delays must be included in the modeling. Design space optimization and exploration are usually performed during a typical design process that consequently requires repeated simulations for different design parameter values. Efficient performing of these design activities calls for parameterized model order reduction (PMOR) methods, which are able to reduce large systems of equations with respect to frequency and other design parameters of the circuit, such as layout or substrate features. We propose a novel PMOR method for neutral delayed differential systems, which is based on an efficient and reliable combination of univariate model order reduction methods, a procedure to find scaling and frequency shifting coefficients and positive interpolation schemes. The proposed scaling and frequency shifting coefficients enhance and improve the modeling capability of standard positive interpolation schemes and allow accurate modeling of highly dynamic systems with a limited amount of initial univariate models in the design space. The proposed method is able to provide parameterized reduced order models passive by construction over the design space of interest. Pertinent numerical examples validate the proposed PMOR approach

Time-domain green's function-based parametric sensitivity analysis of multiconductor transmission lines

We present a new parametric macromodeling technique for lossy and dispersive multiconductor transmission lines. This technique can handle multiple design parameters, such as substrate or geometrical layout features, and provide time-domain sensitivity information for voltages and currents at the ports of the lines. It is derived from the dyadic Green's function of the 1-D wave propagation problem. The rational nature of the Green's function permits the generation of a time-domain macromodel for the computation of transient voltage and current sensitivities with respect to both electrical and physical parameters, completely avoiding similarity transformation, and it is suited to generate state-space models and synthesize equivalent circuits, which can be easily embedded into conventional SPICE-like solvers. Parametric macromodels that provide sensitivity information are well suited for design space exploration, design optimization, and crosstalk analysis. Two numerical examples validate the proposed approach in both frequency and time-domain

Combinational Circuit Obfuscation through Power Signature Manipulation

Today\u27s military systems are composed of hardware and software systems, many of which are critical technologies, and must be protected to ensure our adversaries cannot gain any information from a various analysis attacks. Side Channel Analysis (SCA) attacks allow an attacker to gain the significant information from the measured signatures leaked by side-channels such as power consumption, and electro-magnetic emission. In this research the focus on detecting, characterizing, and manipulating the power signature by designing a power signature estimation and manipulation method. This research has determined that the proposed method capable of characterizing and altering the type of power signature can provide a protection against adversarial SCA attacks

IC design for reliability

textAs the feature size of integrated circuits goes down to the nanometer scale, transient and permanent reliability issues are becoming a significant concern for circuit designers. Traditionally, the reliability issues were mostly handled at the device level as a device engineering problem. However, the increasing severity of reliability challenges and higher error rates due to transient upsets favor higher-level design for reliability (DFR). In this work, we develop several methods for DFR at the circuit level. A major source of transient errors is the single event upset (SEU). SEUs are caused by high-energy particles present in the cosmic rays or emitted by radioactive contaminants in the chip packaging materials. When these particles hit a N+/P+ depletion region of an MOS transistor, they may generate a temporary logic fault. Depending on where the MOS transistor is located and what state the circuit is at, an SEU may result in a circuit-level error. We analyze SEUs both in combinational logic and memories (SRAM). For combinational logic circuit, we propose FASER, a Fast Analysis tool of Soft ERror susceptibility for cell-based designs. The efficiency of FASER is achieved through its static and vector-less nature. In order to evaluate the impact of SEU on SRAM, a theory for estimating dynamic noise margins is developed analytically. The results allow predicting the transient error susceptibility of an SRAM cell using a closedform expression. Among the many permanent failure mechanisms that include time-dependent oxide breakdown (TDDB), electro-migration (EM), hot carrier effect (HCE), and negative bias temperature instability (NBTI), NBTI has recently become important. Therefore, the main focus of our work is NBTI. NBTI occurs when the gate of PMOS is negatively biased. The voltage stress across the gate generates interface traps, which degrade the threshold voltage of PMOS. The degraded PMOS may eventually fail to meet timing requirement and cause functional errors. NBTI becomes severe at elevated temperatures. In this dissertation, we propose a NBTI degradation model that takes into account the temperature variation on the chip and gives the accurate estimation of the degraded threshold voltage. In order to account for the degradation of devices, traditional design methods add guard-bands to ensure that the circuit will function properly during its lifetime. However, the worst-case based guard-bands lead to significant penalty in performance. In this dissertation, we propose an effective macromodel-based reliability tracking and management framework, based on a hybrid network of on-chip sensors, consisting of temperature sensors and ring oscillators. The model is concerned specifically with NBTIinduced transistor aging. The key feature of our work, in contrast to the traditional tracking techniques that rely solely on direct measurement of the increase of threshold voltage or circuit delay, is an explicit macromodel which maps operating temperature to circuit degradation (the increase of circuit delay). The macromodel allows for costeffective tracking of reliability using temperature sensors and is also essential for enabling the control loop of the reliability management system. The developed methods improve the over-conservatism of the device-level, worstcase reliability estimation techniques. As the severity of reliability challenges continue to grow with technology scaling, it will become more important for circuit designers/CAD tools to be equipped with the developed methods.Electrical and Computer Engineerin