Techniques and Prospects for Fault-tolerance in Post-CMOS ULSI

International audienceThis paper presents a survey of fault-masking techniques suitable for tolerating short-duration transient upsets in minimum-scale switching devices. Two types of fault masking are considered. The first type, coded dual-modular redundancy (cDMR), represents a family of parity-checking methods suitable for correcting a low rate of transient upsets. The second type, Restorative Feedback (RFB), is a triple-modular solution suitable for compensating a higher rate of transient upsets. We show that cDMR can be used efficiently for crossbar-style logic, but is not efficient in general for all logic styles. By contrast, RFB offers a fixed redundancy, and can be applied in general to any logic circuit. Finally, we propose novel circuits for ternary Muller C implementation based on carbon nanotube FET devices

Metastability-Containing Circuits

In digital circuits, metastability can cause deteriorated signals that neither are logical 0 or logical 1, breaking the abstraction of Boolean logic. Unfortunately, any way of reading a signal from an unsynchronized clock domain or performing an analog-to-digital conversion incurs the risk of a metastable upset; no digital circuit can deterministically avoid, resolve, or detect metastability (Marino, 1981). Synchronizers, the only traditional countermeasure, exponentially decrease the odds of maintained metastability over time. Trading synchronization delay for an increased probability to resolve metastability to logical 0 or 1, they do not guarantee success. We propose a fundamentally different approach: It is possible to contain metastability by fine-grained logical masking so that it cannot infect the entire circuit. This technique guarantees a limited degree of metastability in---and uncertainty about---the output. At the heart of our approach lies a time- and value-discrete model for metastability in synchronous clocked digital circuits. Metastability is propagated in a worst-case fashion, allowing to derive deterministic guarantees, without and unlike synchronizers. The proposed model permits positive results and passes the test of reproducing Marino's impossibility results. We fully classify which functions can be computed by circuits with standard registers. Regarding masking registers, we show that they become computationally strictly more powerful with each clock cycle, resulting in a non-trivial hierarchy of computable functions

Fault Tolerance in Carbon Nanotube Transistors Based Multi Valued Logic

This Chapter presents a solution for fault-tolerance in Multi-Valued Logic (MVL) circuits comprised of Carbon Nano-Tube Field Effect Transistors (CNTFET). This chapter reviews basic primitives of MVL and describes ternary implementations of CNTFET circuits. Finally, this chapter describes a method for error correction called Restorative Feedback (RFB). The RFB method is a variant of Triple-Modular Redundancy (TMR) that utilizes the fault masking capabilities of the Muller C element to provide added protection against noisy transient faults. Fault tolerant properties of Muller C element is discussed and error correction capability of RFB method is demonstrated in detail

Survey on Fault Tolerance Startgies for Advance Microelectronics Chip

In the complex advance microelectronics based system, handling units are managing gadgets of littler size, which are delicate to the transient faults. A framework should be fabricated that will perceive the presence of faults and fuses strategies to will endure these faults without troublesome the typical activity A transient fault happens in a circuit caused by the electromagnetic commotions, astronomical beams, crosstalk and power supply clamor. It is extremely hard to recognize these faults amid disconnected testing. Subsequently a region effective fault tolerant full adder for testing and fixing of transient and changeless faults happened in single and multi-net is proposed. Furthermore, the proposed design can likewise identify and fix perpetual faults. This structure acquires much lower equipment overheads with respect to the conventional equipment design. In this paper, talk about various fault tolerant methodology for CMOS and ICs

The Design of Fail-Safe Logic

This paper examines the behavior of digital logic families, specifically identifying the properties and characteristics of digital fail-safe logic. Fail-safe digital design is examined utilizing classical logic and semiconductor theory. The effects of failures internal to the structure of digital integrated circuits are analyzed and a discussion of pertinent logic design is presented. The techniques to detect all types of multiple failure modes are examined. With these results, a method of design for fail-safe logic is presented and analyzed

Quantum-dot Cellular Automata: Review Paper

Quantum-dot Cellular Automata (QCA) is one of the most important discoveries that will be the successful alternative for CMOS technology in the near future. An important feature of this technique, which has attracted the attention of many researchers, is that it is characterized by its low energy consumption, high speed and small size compared with CMOS.  Inverter and majority gate are the basic building blocks for QCA circuits where it can design the most logical circuit using these gates with help of QCA wire. Due to the lack of availability of review papers, this paper will be a destination for many people who are interested in the QCA field and to know how it works and why it had taken lots of attention recentl