27,882 research outputs found
Cross-layer system reliability assessment framework for hardware faults
System reliability estimation during early design phases facilitates informed decisions for the integration of effective protection mechanisms against different classes of hardware faults. When not all system abstraction layers (technology, circuit, microarchitecture, software) are factored in such an estimation model, the delivered reliability reports must be excessively pessimistic and thus lead to unacceptably expensive, over-designed systems. We propose a scalable, cross-layer methodology and supporting suite of tools for accurate but fast estimations of computing systems reliability. The backbone of the methodology is a component-based Bayesian model, which effectively calculates system reliability based on the masking probabilities of individual hardware and software components considering their complex interactions. Our detailed experimental evaluation for different technologies, microarchitectures, and benchmarks demonstrates that the proposed model delivers very accurate reliability estimations (FIT rates) compared to statistically significant but slow fault injection campaigns at the microarchitecture level.Peer ReviewedPostprint (author's final draft
Model-based dependability analysis : state-of-the-art, challenges and future outlook
Abstract: Over the past two decades, the study of model-based dependability analysis has gathered significant research interest. Different approaches have been developed to automate and address various limitations of classical dependability techniques to contend with the increasing complexity and challenges of modern safety-critical system. Two leading paradigms have emerged, one which constructs predictive system failure models from component failure models compositionally using the topology of the system. The other utilizes design models - typically state automata - to explore system behaviour through fault injection. This paper reviews a number of prominent techniques under these two paradigms, and provides an insight into their working mechanism, applicability, strengths and challenges, as well as recent developments within these fields. We also discuss the emerging trends on integrated approaches and advanced analysis capabilities. Lastly, we outline the future outlook for model-based dependability analysis
Mechanistic modeling of architectural vulnerability factor
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an exponential increase in the number of transistors on chip and the reduction in operating voltages with each process generation. Architectural Vulnerability Factor (AVF) modeling using microarchitectural simulators enables architects to make informed performance, power, and reliability tradeoffs. However, such simulators are time-consuming and do not reveal the microarchitectural mechanisms that influence AVF. In this article, we present an accurate first-order mechanistic analytical model to compute AVF, developed using the first principles of an out-of-order superscalar execution. This model provides insight into the fundamental interactions between the workload and microarchitecture that together influence AVF. We use the model to perform design space exploration, parametric sweeps, and workload characterization for AVF
An Experimental Study of Reduced-Voltage Operation in Modern FPGAs for Neural Network Acceleration
We empirically evaluate an undervolting technique, i.e., underscaling the
circuit supply voltage below the nominal level, to improve the power-efficiency
of Convolutional Neural Network (CNN) accelerators mapped to Field Programmable
Gate Arrays (FPGAs). Undervolting below a safe voltage level can lead to timing
faults due to excessive circuit latency increase. We evaluate the
reliability-power trade-off for such accelerators. Specifically, we
experimentally study the reduced-voltage operation of multiple components of
real FPGAs, characterize the corresponding reliability behavior of CNN
accelerators, propose techniques to minimize the drawbacks of reduced-voltage
operation, and combine undervolting with architectural CNN optimization
techniques, i.e., quantization and pruning. We investigate the effect of
environmental temperature on the reliability-power trade-off of such
accelerators. We perform experiments on three identical samples of modern
Xilinx ZCU102 FPGA platforms with five state-of-the-art image classification
CNN benchmarks. This approach allows us to study the effects of our
undervolting technique for both software and hardware variability. We achieve
more than 3X power-efficiency (GOPs/W) gain via undervolting. 2.6X of this gain
is the result of eliminating the voltage guardband region, i.e., the safe
voltage region below the nominal level that is set by FPGA vendor to ensure
correct functionality in worst-case environmental and circuit conditions. 43%
of the power-efficiency gain is due to further undervolting below the
guardband, which comes at the cost of accuracy loss in the CNN accelerator. We
evaluate an effective frequency underscaling technique that prevents this
accuracy loss, and find that it reduces the power-efficiency gain from 43% to
25%.Comment: To appear at the DSN 2020 conferenc
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level
In recent technology nodes, reliability is considered a part of the standard design ¿ow at all levels of embedded system design. While techniques that use only low-level models at gate- and register transfer-level offer high accuracy, they are too inefficient to consider the overall application of the embedded system. Multi-level models with high abstraction are essential to efficiently evaluate the impact of physical defects on the system. This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction-level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system. A case study of a system consisting of hardware and software for image compression and data encryption is presented and the method is compared to a standard gate/RT mixed-level approac
A Pattern Language for High-Performance Computing Resilience
High-performance computing systems (HPC) provide powerful capabilities for
modeling, simulation, and data analytics for a broad class of computational
problems. They enable extreme performance of the order of quadrillion
floating-point arithmetic calculations per second by aggregating the power of
millions of compute, memory, networking and storage components. With the
rapidly growing scale and complexity of HPC systems for achieving even greater
performance, ensuring their reliable operation in the face of system
degradations and failures is a critical challenge. System fault events often
lead the scientific applications to produce incorrect results, or may even
cause their untimely termination. The sheer number of components in modern
extreme-scale HPC systems and the complex interactions and dependencies among
the hardware and software components, the applications, and the physical
environment makes the design of practical solutions that support fault
resilience a complex undertaking. To manage this complexity, we developed a
methodology for designing HPC resilience solutions using design patterns. We
codified the well-known techniques for handling faults, errors and failures
that have been devised, applied and improved upon over the past three decades
in the form of design patterns. In this paper, we present a pattern language to
enable a structured approach to the development of HPC resilience solutions.
The pattern language reveals the relations among the resilience patterns and
provides the means to explore alternative techniques for handling a specific
fault model that may have different efficiency and complexity characteristics.
Using the pattern language enables the design and implementation of
comprehensive resilience solutions as a set of interconnected resilience
patterns that can be instantiated across layers of the system stack.Comment: Proceedings of the 22nd European Conference on Pattern Languages of
Program
Engineering failure analysis and design optimisation with HiP-HOPS
The scale and complexity of computer-based safety critical systems, like those used in the transport and manufacturing industries, pose significant challenges for failure analysis. Over the last decade, research has focused on automating this task. In one approach, predictive models of system failure are constructed from the topology of the system and local component failure models using a process of composition. An alternative approach employs model-checking of state automata to study the effects of failure and verify system safety properties. In this paper, we discuss these two approaches to failure analysis. We then focus on Hierarchically Performed Hazard Origin & Propagation Studies (HiP-HOPS) - one of the more advanced compositional approaches - and discuss its capabilities for automatic synthesis of fault trees, combinatorial Failure Modes and Effects Analyses, and reliability versus cost optimisation of systems via application of automatic model transformations. We summarise these contributions and demonstrate the application of HiP-HOPS on a simplified fuel oil system for a ship engine. In light of this example, we discuss strengths and limitations of the method in relation to other state-of-the-art techniques. In particular, because HiP-HOPS is deductive in nature, relating system failures back to their causes, it is less prone to combinatorial explosion and can more readily be iterated. For this reason, it enables exhaustive assessment of combinations of failures and design optimisation using computationally expensive meta-heuristics. (C) 2010 Elsevier Ltd. All rights reserved
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