5,304 research outputs found

    Fast k-NN classifier for documents based on a graph structure

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    In this paper, a fast k nearest neighbors (k-NN) classifier for documents is presented. Documents are usually represented in a high-dimensional feature space, where terms appeared on it are treated as features and the weight of each term reflects its importance in the document. There are many approaches to find the vicinity of an object, but their performance drastically decreases as the number of dimensions grows. This problem prevents its application for documents. The proposed method is based on a graph index structure with a fast search algorithm. It’s high selectivity permits to obtain a similar classification quality than exhaustive classifier, with a few number of computed distances. Our experimental results show that it is feasible the use of the proposed method in problems of very high dimensionality, such as Text Mining

    Naive Bayes vs. Decision Trees vs. Neural Networks in the Classification of Training Web Pages

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    Web classification has been attempted through many different technologies. In this study we concentrate on the comparison of Neural Networks (NN), NaĂŻve Bayes (NB) and Decision Tree (DT) classifiers for the automatic analysis and classification of attribute data from training course web pages. We introduce an enhanced NB classifier and run the same data sample through the DT and NN classifiers to determine the success rate of our classifier in the training courses domain. This research shows that our enhanced NB classifier not only outperforms the traditional NB classifier, but also performs similarly as good, if not better, than some more popular, rival techniques. This paper also shows that, overall, our NB classifier is the best choice for the training courses domain, achieving an impressive F-Measure value of over 97%, despite it being trained with fewer samples than any of the classification systems we have encountered

    One-Class Classification: Taxonomy of Study and Review of Techniques

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    One-class classification (OCC) algorithms aim to build classification models when the negative class is either absent, poorly sampled or not well defined. This unique situation constrains the learning of efficient classifiers by defining class boundary just with the knowledge of positive class. The OCC problem has been considered and applied under many research themes, such as outlier/novelty detection and concept learning. In this paper we present a unified view of the general problem of OCC by presenting a taxonomy of study for OCC problems, which is based on the availability of training data, algorithms used and the application domains applied. We further delve into each of the categories of the proposed taxonomy and present a comprehensive literature review of the OCC algorithms, techniques and methodologies with a focus on their significance, limitations and applications. We conclude our paper by discussing some open research problems in the field of OCC and present our vision for future research.Comment: 24 pages + 11 pages of references, 8 figure

    A Survey on Metric Learning for Feature Vectors and Structured Data

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    The need for appropriate ways to measure the distance or similarity between data is ubiquitous in machine learning, pattern recognition and data mining, but handcrafting such good metrics for specific problems is generally difficult. This has led to the emergence of metric learning, which aims at automatically learning a metric from data and has attracted a lot of interest in machine learning and related fields for the past ten years. This survey paper proposes a systematic review of the metric learning literature, highlighting the pros and cons of each approach. We pay particular attention to Mahalanobis distance metric learning, a well-studied and successful framework, but additionally present a wide range of methods that have recently emerged as powerful alternatives, including nonlinear metric learning, similarity learning and local metric learning. Recent trends and extensions, such as semi-supervised metric learning, metric learning for histogram data and the derivation of generalization guarantees, are also covered. Finally, this survey addresses metric learning for structured data, in particular edit distance learning, and attempts to give an overview of the remaining challenges in metric learning for the years to come.Comment: Technical report, 59 pages. Changes in v2: fixed typos and improved presentation. Changes in v3: fixed typos. Changes in v4: fixed typos and new method
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