Artificial neural network model for arrival time computation in gate level circuits

Advances in the VLSI process technology lead to variations in the process parameters. These process variations severely affect the delay computation of a digital circuit. Under such variations, the various delays, i.e. net delay, gate delay, etc., are no longer deterministic. They are random in nature and are assumed to be probabilistic. They keep changing, based on factors such as process, voltage, temperature, and a few others. This calls for efficient tools to perform timing checks on a design. This work presents a technique to compute the arrival time of a digital circuit. The arrival time (AT) is computed using two different timing engines, namely, static timing analysis (STA) and statistical static timing analysis (SSTA). This work also aims to eliminate number of false paths. It uses a fast and efficient filtering method by utilizing ATPG stuck-at faults and path delay faults. ISCAS-89 benchmark circuits are used for implementation. The results obtained using the probabilistic approach are more accurate than the conventional STA. It has been verified with an Artificial Neural Network (ANN) model. The arrival time calculated using SSTA shows 7% improvement over that of STA. The absolute error is reduced twofold in the case of the ANN model for SSTA

On Timing Model Extraction and Hierarchical Statistical Timing Analysis

In this paper, we investigate the challenges to apply Statistical Static Timing Analysis (SSTA) in hierarchical design flow, where modules supplied by IP vendors are used to hide design details for IP protection and to reduce the complexity of design and verification. For the three basic circuit types, combinational, flip-flop-based and latch-controlled, we propose methods to extract timing models which contain interfacing as well as compressed internal constraints. Using these compact timing models the runtime of full-chip timing analysis can be reduced, while circuit details from IP vendors are not exposed. We also propose a method to reconstruct the correlation between modules during full-chip timing analysis. This correlation can not be incorporated into timing models because it depends on the layout of the corresponding modules in the chip. In addition, we investigate how to apply the extracted timing models with the reconstructed correlation to evaluate the performance of the complete design. Experiments demonstrate that using the extracted timing models and reconstructed correlation full-chip timing analysis can be several times faster than applying the flattened circuit directly, while the accuracy of statistical timing analysis is still well maintained