High-Performance Energy-Efficient and Reliable Design of Spin-Transfer Torque Magnetic Memory

In this dissertation new computing paradigms, architectures and design philosophy are proposed and evaluated for adopting the STT-MRAM technology as highly reliable, energy efficient and fast memory. For this purpose, a novel cross-layer framework from the cell-level all the way up to the system- and application-level has been developed. In these framework, the reliability issues are modeled accurately with appropriate fault models at different abstraction levels in order to analyze the overall failure rates of the entire memory and its Mean Time To Failure (MTTF) along with considering the temperature and process variation effects. Design-time, compile-time and run-time solutions have been provided to address the challenges associated with STT-MRAM. The effectiveness of the proposed solutions is demonstrated in extensive experiments that show significant improvements in comparison to state-of-the-art solutions, i.e. lower-power, higher-performance and more reliable STT-MRAM design

VLSI Implementation of Multi-Bit Error Detection and Correction Codes for Space Communications

Data transmission in advanced space communications are suffering with the different types of noises. Further, these noises causeburst errors indata. Thus, the error correction codes (ECC) plays the major role to detect and correct the errors. However, the conventional hamming encoders, decoderswere detected and corrected only one bit error. Therefore, this work implementation the Multi-Bit Error Detection and CorrectionCodes (MBE-DCC) for multiple bits error detection and correction. Initially, MBE-DCC encoding operation is implemented by using generator matrix, which contains both identity bits and parity bits. Then, encoded code word is transmitted into the channel of space communication, where encoded data corrupted by different types of noises, errors. Therefore, the MBE-DCC decoding operation performed at receiver side of space communications, which corrected all the errors using syndrome detection, error location detection, and error correction modules.  The simulations revealed that the proposed MBE-DCC resulted in superior performance than conventional ECC method

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems