Particle Swarm Optimisation in Practice: Multiple Applications in a Digital Microscope System

We demonstrate that particle swarm optimisation (PSO) can be used to solve a variety of problems arising during operation of a digital inspection microscope. This is a use case for the feasibility of heuristics in a real-world product. We show solutions to four measurement problems, all based on PSO. This allows for a compact software implementation solving different problems. We have found that PSO can solve a variety of problems with small software footprints and good results in a real-world embedded system. Notably, in the microscope application, this eliminates the need to return the device to the factory for calibration

An Image Denoising Algorithm Based On Curvelet Transform

Aiming at the limitations of the wavelet transform in image denoising, this paper proposes a new image denoising algorithm based on curvelet transform mathematical method. In this paper, the feasibility of this method is proved by the experimental results. The experiment result shows that, using the proposed new algorithm can get high peak signal to noise ratio, visual effect is very good image

A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics Industry

Electronics industry is one of the fastest evolving, innovative, and most competitive industries. In order to meet the high consumption demands on electronics components, quality standards of the products must be well-maintained. Automatic optical inspection (AOI) is one of the non-destructive techniques used in quality inspection of various products. This technique is considered robust and can replace human inspectors who are subjected to dull and fatigue in performing inspection tasks. A fully automated optical inspection system consists of hardware and software setups. Hardware setup include image sensor and illumination settings and is responsible to acquire the digital image, while the software part implements an inspection algorithm to extract the features of the acquired images and classify them into defected and non-defected based on the user requirements. A sorting mechanism can be used to separate the defective products from the good ones. This article provides a comprehensive review of the various AOI systems used in electronics, micro-electronics, and opto-electronics industries. In this review the defects of the commonly inspected electronic components, such as semiconductor wafers, flat panel displays, printed circuit boards and light emitting diodes, are first explained. Hardware setups used in acquiring images are then discussed in terms of the camera and lighting source selection and configuration. The inspection algorithms used for detecting the defects in the electronic components are discussed in terms of the preprocessing, feature extraction and classification tools used for this purpose. Recent articles that used deep learning algorithms are also reviewed. The article concludes by highlighting the current trends and possible future research directions.Framework of the IQONIC Project; European Union’s Horizon 2020 Research and Innovation Program

Applications

Volume 3 describes how resource-aware machine learning methods and techniques are used to successfully solve real-world problems. The book provides numerous specific application examples: in health and medicine for risk modelling, diagnosis, and treatment selection for diseases in electronics, steel production and milling for quality control during manufacturing processes in traffic, logistics for smart cities and for mobile communications

Applications

Volume 3 describes how resource-aware machine learning methods and techniques are used to successfully solve real-world problems. The book provides numerous specific application examples: in health and medicine for risk modelling, diagnosis, and treatment selection for diseases in electronics, steel production and milling for quality control during manufacturing processes in traffic, logistics for smart cities and for mobile communications

Eddy current defect response analysis using sum of Gaussian methods

This dissertation is a study of methods to automatedly detect and produce approximations of eddy current differential coil defect signatures in terms of a summed collection of Gaussian functions (SoG). Datasets consisting of varying material, defect size, inspection frequency, and coil diameter were investigated. Dimensionally reduced representations of the defect responses were obtained utilizing common existing reduction methods and novel enhancements to them utilizing SoG Representations. Efficacy of the SoG enhanced representations were studied utilizing common Machine Learning (ML) interpretable classifier designs with the SoG representations indicating significant improvement of common analysis metrics

Automated damage diagnosis of concrete jack arch beam using optimized deep stacked autoencoders and multi-sensor fusion

A novel hybrid framework of optimized deep learning models combined with multi-sensor fusion is developed for condition diagnosis of concrete arch beam. The vibration responses of structure are first processed by principal component analysis for dimensionality reduction and noise elimination. Then, the deep network based on stacked autoencoders (SAE) is established at each sensor for initial condition diagnosis, where extracted principal components and corresponding condition categories are inputs and output, respectively. To enhance diagnostic accuracy of proposed deep SAE, an enhanced whale optimization algorithm is proposed to optimize network meta-parameters. Eventually, Dempster-Shafer fusion algorithm is employed to combine initial diagnosis results from each sensor to make a final diagnosis. A miniature structural component of Sydney Harbour Bridge with artificial multiple progressive damages is tested in laboratory. The results demonstrate that the proposed method can detect structural damage accurately, even under the condition of limited sensors and high levels of uncertainties

Micro/Nano Manufacturing

Micro manufacturing involves dealing with the fabrication of structures in the size range of 0.1 to 1000 µm. The scope of nano manufacturing extends the size range of manufactured features to even smaller length scales—below 100 nm. A strict borderline between micro and nano manufacturing can hardly be drawn, such that both domains are treated as complementary and mutually beneficial within a closely interconnected scientific community. Both micro and nano manufacturing can be considered as important enablers for high-end products. This Special Issue of Applied Sciences is dedicated to recent advances in research and development within the field of micro and nano manufacturing. The included papers report recent findings and advances in manufacturing technologies for producing products with micro and nano scale features and structures as well as applications underpinned by the advances in these technologies