LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

On the Effect of Quantum Interaction Distance on Quantum Addition Circuits

We investigate the theoretical limits of the effect of the quantum interaction distance on the speed of exact quantum addition circuits. For this study, we exploit graph embedding for quantum circuit analysis. We study a logical mapping of qubits and gates of any $\Omega(\log n)$-depth quantum adder circuit for two $n$-qubit registers onto a practical architecture, which limits interaction distance to the nearest neighbors only and supports only one- and two-qubit logical gates. Unfortunately, on the chosen $k$-dimensional practical architecture, we prove that the depth lower bound of any exact quantum addition circuits is no longer $\Omega(\log {n})$, but $\Omega(\sqrt[k]{n})$. This result, the first application of graph embedding to quantum circuits and devices, provides a new tool for compiler development, emphasizes the impact of quantum computer architecture on performance, and acts as a cautionary note when evaluating the time performance of quantum algorithms.Comment: accepted for ACM Journal on Emerging Technologies in Computing System

Technology Mapping for Circuit Optimization Using Content-Addressable Memory

The growing complexity of Field Programmable Gate Arrays (FPGA's) is leading to architectures with high input cardinality look-up tables (LUT's). This thesis describes a methodology for area-minimizing technology mapping for combinational logic, specifically designed for such FPGA architectures. This methodology, called LURU, leverages the parallel search capabilities of Content-Addressable Memories (CAM's) to outperform traditional mapping algorithms in both execution time and quality of results. The LURU algorithm is fundamentally different from other techniques for technology mapping in that LURU uses textual string representations of circuit topology in order to efficiently store and search for circuit patterns in a CAM. A circuit is mapped to the target LUT technology using both exact and inexact string matching techniques. Common subcircuit expressions (CSE's) are also identified and used for architectural optimization---a small set of CSE's is shown to effectively cover an average of 96% of the test circuits. LURU was tested with the ISCAS'85 suite of combinational benchmark circuits and compared with the mapping algorithms FlowMap and CutMap. The area reduction shown by LURU is, on average, 20% better compared to FlowMap and CutMap. The asymptotic runtime complexity of LURU is shown to be better than that of both FlowMap and CutMap

Transient fault behavior in a microprocessor: A case study

An experimental analysis is described which studies the susceptibility of a microprocessor based jet engine controller to upsets caused by current and voltage transients. A design automation environment which allows the run time injection of transients and the tracing from their impact device to the pin level is described. The resulting error data are categorized by the charge levels of the injected transients by location and by their potential to cause logic upsets, latched errors, and pin errors. The results show a 3 picoCouloumb threshold, below which the transients have little impact. An Arithmetic and Logic Unit transient is most likely to result in logic upsets and pin errors (i.e., impact the external environment). The transients in the countdown unit are potentially serious since they can result in latched errors, thus causing latent faults. Suggestions to protect the processor against these errors, by incorporating internal error detection and transient suppression techniques, are also made

What is the Path to Fast Fault Simulation?

Motivated by the recent advances in fast fault simulation techniques for large combinational circuits, a panel discussion has been organized for the 1988 International Test Conference. This paper is a collective account of the position statements offered by the panelists