Time-efficient fault detection and diagnosis system for analog circuits

Time-efficient fault analysis and diagnosis of analog circuits are the most important prerequisites to achieve online health monitoring of electronic equipments, which are involving continuing challenges of ultra-large-scale integration, component tolerance, limited test points but multiple faults. This work reports an FPGA (field programmable gate array)-based analog fault diagnostic system by applying two-dimensional information fusion, two-port network analysis and interval math theory. The proposed system has three advantages over traditional ones. First, it possesses high processing speed and smart circuit size as the embedded algorithms execute parallel on FPGA. Second, the hardware structure has a good compatibility with other diagnostic algorithms. Third, the equipped Ethernet interface enhances its flexibility for remote monitoring and controlling. The experimental results obtained from two realistic example circuits indicate that the proposed methodology had yielded competitive performance in both diagnosis accuracy and time-effectiveness, with about 96% accuracy while within 60 ms computational time.Peer reviewedFinal Published versio

Feedback Control for Electron Beam Lithography

Scanning-electron-beam lithography (SEBL) is the primary technology to generate arbitrary features at the nano-scale. However, pattern placement accuracy still remains poor compared to its resolution due to the open-loop nature of SEBL systems. Vibration, stray electromagnetic fields, deflection distortion and hysteresis, substrate charging, and other factors prevent the electron-beam from reaching its target position and one has no way to determine the actual beam position during patterning with conventional systems. To improve the pattern placement accuracy, spatial-phase-locked electron-beam lithography (SPLEBL) provides feedback control of electron-beam position by monitoring the secondary electron signal from electron-transparent fiducial grids on the substrate. While scanning the electron beam over the fiducial grids, the phase of the grid signal is analyzed to estimate the electron-beam position error; then the estimates are sent back to beam deflection system to correct the position error. In this way, closed-loop control is provided to ensure pattern placement accuracy. The implementation of spatial-phase-locking on high speed field-programmable gate array (FPGA) provides a low-cost method to create a nano-manufacturing platform with 1 nm precision and significantly improved throughput. Shot-to-shot, or pixel-to-pixel, dose variation during EBL is a significant practical and fundamental problem. Dose variations associated with charging, electron source instability, optical system drift, and ultimately shot noise in the beam itself conspire to increase critical dimension variability and line width roughness and to limit the throughput. It would be an important improvement to e-beam patterning technology if real-time feedback control of electron-dose were provided to improve pattern quality and throughput even beyond the shot noise limit. A novel approach is proposed in this document to achieve the real-time dose control based on the measurement of electron arrival at the sample to be patterned, rather than from the source or another point in the electron-optical system. A dose control algorithm, implementation on FPGA, and initial experiment results for the real-time feedback dose control on the e-beam patterning tool is also presented

Interfacing and Verifying ALHAT Safe Precision Landing Systems with the Morpheus Vehicle

The NASA Autonomous precision Landing and Hazard Avoidance Technology (ALHAT) project developed a suite of prototype sensors to enable autonomous and safe precision landing of robotic or crewed vehicles under any terrain lighting conditions. Development of the ALHAT sensor suite was a cross-NASA effort, culminating in integration and testing on-board a variety of terrestrial vehicles toward infusion into future spaceflight applications. Terrestrial tests were conducted on specialized test gantries, moving trucks, helicopter flights, and a flight test onboard the NASA Morpheus free-flying, rocket-propulsive flight-test vehicle. To accomplish these tests, a tedious integration process was developed and followed, which included both command and telemetry interfacing, as well as sensor alignment and calibration verification to ensure valid test data to analyze ALHAT and Guidance, Navigation and Control (GNC) performance. This was especially true for the flight test campaign of ALHAT onboard Morpheus. For interfacing of ALHAT sensors to the Morpheus flight system, an adaptable command and telemetry architecture was developed to allow for the evolution of per-sensor Interface Control Design/Documents (ICDs). Additionally, individual-sensor and on-vehicle verification testing was developed to ensure functional operation of the ALHAT sensors onboard the vehicle, as well as precision-measurement validity for each ALHAT sensor when integrated within the Morpheus GNC system. This paper provides some insight into the interface development and the integrated-systems verification that were a part of the build-up toward success of the ALHAT and Morpheus flight test campaigns in 2014. These campaigns provided valuable performance data that is refining the path toward spaceflight infusion of the ALHAT sensor suite

The Effelsberg-Bonn HI Survey (EBHIS)

The Effelsberg-Bonn HI survey (EBHIS) comprises an all-sky survey north of Dec = -5 degrees of the Milky Way and the local volume out to a red-shift of z ~ 0.07. Using state of the art Field Programmable Gate Array (FPGA) spectrometers it is feasible to cover the 100 MHz bandwidth with 16.384 spectral channels. High speed storage of HI spectra allows us to minimize the degradation by Radio Frequency Interference (RFI) signals. Regular EBHIS survey observations started during the winter season 2008/2009 after extensive system evaluation and verification tests. Until today, we surveyed about 8000 square degrees, focusing during the first all-sky coverage of the Sloan-Digital Sky Survey (SDSS) area and the northern extension of the Magellanic stream. The first whole sky coverage will be finished in 2011. Already this first coverage will reach the same sensitivity level as the Parkes Milky Way (GASS) and extragalactic surveys (HIPASS). EBHIS data will be calibrated, stray-radiation corrected and freely accessible for the scientific community via a web-interface. In this paper we demonstrate the scientific data quality and explore the expected harvest of this new all-sky survey.Comment: 19 pages, 11 figures, accepted for publication by Astronomical Note

Smart Chips for Smart Surroundings -- 4S

The overall mission of the 4S project (Smart Chips for Smart Surroundings) was to define and develop efficient flexible, reconfigurable core building blocks, including the supporting tools, for future Ambient System Devices. Reconfigurability offers the needed flexibility and adaptability, it provides the efficiency needed for these systems, it enables systems that can adapt to rapidly changing environmental conditions, it enables communication over heterogeneous wireless networks, and it reduces risks: reconfigurable systems can adapt to standards that may vary from place to place or standards that have changed during and after product development. In 4S we focused on heterogeneous building blocks such as analogue, hardwired functions, fine and coarse grain reconfigurable tiles and microprocessors. Such a platform can adapt to a wide application space without the need for specialized ASICs. A novel power aware design flow and runtime system was developed. The runtime system decides dynamically about the near-optimal application mapping to the given hardware platform. The overall concept was verified on hardware platforms based on an existing SoC and in a second step with novel silicon. DRM (Digital Radio Mondiale) and MPEG4 Video applications have been implemented on the platforms demonstrating the adaptability of the 4S concept