Exploiting smallest error to calibrate non-linearity in SAR ADCs

This paper presents a statistics-optimised organisation technique to achieve better element matching in Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) in smart sensor systems. We demonstrate the proposed technique ability to achieve a significant improvement of around 23 dB on Spurious Free Dynamic Range (SFDR) of the ADC than the conventional, testing with a capacitor mismatch σu = 0.2% in a 14 bit SAR ADC system. For the static performance, the max root mean square (rms) value of differential nonlinearity (DNL) reduces from 1.63 to 0.20 LSB and the max rms value of integral nonlinearity (INL) reduces from 2.10 to 0.21 LSB. In addition, it is demonstrated that by applying grouping optimisation and strategy optimisation, the performance boosting on SFDR can be effectively achieved. Such great improvement on the resolution of the ADC only requires an off-line pre-processing digital part

Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

A 7.4-Bit ENOB 600 MS/s FPGA-Based Online Calibrated Slope ADC without External Components

A slope analog-to-digital converter (ADC) amenable to be fully implemented on a digital field programmable gate array (FPGA) without requiring any external active or passive components is proposed in this paper. The amplitude information, encoded in the transition times of a standard LVDS differential input—driven by the analog input and by the reference slope generated by an FPGA output buffer—is retrieved by an FPGA time-to-digital converter. Along with the ADC, a new online calibration algorithm is developed to mitigate the influence of process, voltage, and temperature variations on its performance. Measurements on an ADC prototype reveal an analog input range from 0.3 V to 1.5 V, a least significant bit (LSB) of 2.6 mV, and an effective number of bits (ENOB) of 7.4-bit at 600 MS/s. The differential nonlinearity (DNL) is in the range between −0.78 and 0.70 LSB, and the integral nonlinearity (INL) is in the range from −0.72 to 0.78 LSB

DIGITALLY ASSISTED TECHNIQUES FOR NYQUIST RATE ANALOG-to-DIGITAL CONVERTERS

With the advance of technology and rapid growth of digital systems, low power high speed analog-to-digital converters with great accuracy are in demand. To achieve high effective number of bits Analog-to-Digital Converter(ADC) calibration as a time consuming process is a potential bottleneck for designs. This dissertation presentsa fully digital background calibration algorithm for a 7-bit redundant flash ADC using split structure and look-up table based correction. Redundant comparators are used in the flash ADC design of this work in order to tolerate large offset voltages while minimizing signal input capacitance. The split ADC structure helps by eliminating the unknown input signal from the calibration path. The flash ADC has been designed in 180nm IBM CMOS technology and fabricated through MOSIS. This work was supported by Analog Devices, Wilmington,MA. While much research on ADC design has concentrated on increasing resolution and sample rate, there are many applications (e.g. biomedical devices and sensor networks) that do not require high performance but do require low power energy efficient ADCs. This dissertation also explores on design of a low quiescent current 100kSps Successive Approximation (SAR) ADC that has been used as an error detection ADC for an automotive application in 350nm CD (CMOS-DMOS) technology. This work was supported by ON Semiconductor Corp, East Greenwich,RI

Reform and Practice of Analog Circuits

In the new century, education has become the focus of the reform. At present, cross, penetration and integration between basic courses are the key to improve the quality of teaching and the overall quality of students. University of Electronic Science and Technology of China (UESTC) combines "circuit analysi" and "fundamentals of analog circuits" as one course "electronic circuit", the curriculum reform follows the principles of strengthening the foundation, updating the structure, penetrating the interdisciplinary and simplifying the courses. This paper discusses the principles and ideas of reforms related to the "electronic circuit": the results show that the teaching can broaden the knowledge and vision of students, as a result, the students can better adapt to the requirements of learning and challenge of the new era

A 4-channel 12-bit high-voltage radiation-hardened digital-to-analog converter for low orbit satellite applications

This paper presents a circuit design and an implementation of a four-channel 12-bit digital-to-analog converter (DAC) with high-voltage operation and radiation-tolerant attribute using a specific CSMC H8312 0.5-μm Bi-CMOS technology to achieve the functionality across a wide-temperature range from -55 °C to 125 °C. In this paper, an R-2R resistor network is adopted in the DAC to provide necessary resistors matching which improves the DAC precision and linearity with both the global common centroid and local common centroid layout. Therefore, no additional, complicated digital calibration or laser-trimming are needed in this design. The experimental and measurement results show that the maximum frequency of the single-chip four-channel 12-bit R-2R ladder high-voltage radiation-tolerant DAC is 100 kHz, and the designed DAC achieves the maximum value of differential non-linearity of 0.18 LSB, and the maximum value of integral non-linearity of -0.53 LSB at 125 °C, which is close to the optimal DAC performance. The performance of the proposed DAC keeps constant over the whole temperature range from -55 °C to 125 °C. Furthermore, an enhanced radiation-hardened design has been demonstrated by utilizing a radiation chamber experimental setup. The fabricated radiation-tolerant DAC chipset occupies a die area of 7 mm x 7 mm in total including pads (core active area of 4 mm x 5 mm excluding pads) and consumes less than 525 mW, output voltage ranges from -10 to +10 V

Low-power high-performance SAR ADC with redundancy and digital background calibration

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2013.This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.Cataloged from student-submitted PDF version of thesis.Includes bibliographical references (p. 195-199).As technology scales, the improved speed and energy eciency make the successive- approximation-register (SAR) architecture an attractive alternative for applications that require high-speed and high-accuracy analog-to-digital converters (ADCs). In SAR ADCs, the key linearity and speed limiting factors are capacitor mismatch and incomplete digital-to-analog converter (DAC)/reference voltage settling. In this the- sis, a sub-radix-2 SAR ADC is presented with several new contributions. The main contributions include investigation of using digital error correction (redundancy) in SAR ADCs for dynamic error correction and speed improvement, development of two new calibration algorithms to digitally correct for manufacturing mismatches, design of new architecture to incorporate redundancy within the architecture itself while achieving 94% better energy eciency compared to conventional switching algorithm, development of a new capacitor DAC structure to improve the SNR by four times with improved matching, joint design of the analog and digital circuits to create an asynchronous platform in order to reach the targeted performance, and analysis of key circuit blocks to enable the design to meet noise, power and timing requirements. The design is fabricated in standard 1P9M 65nm CMOS technology with 1.2V supply. The active die area is 0.083mm² with full rail-to-rail input swing of 2.4V p-p . A 67.4dB SNDR, 78.1dB SFDR, +1.0/-0.9 LSB₁₂ INL and +0.5/-0.7 LSB₁₂ DNL are achieved at 50MS/s at Nyquist rate. The total power consumption, including the estimated calibration and reference power, is 2.1mW, corresponding to 21.9fJ/conv.- step FoM. This ADC achieves the best FoM of any ADCs with greater than 10b ENOB and 10MS/s sampling rate.by Albert Hsu Ting Chang.Ph.D

Digitally Interfaced Analog Correlation Filter System for Object Tracking Applications

Advanced correlation filters have been employed in a wide variety of image processing and pattern recognition applications such as automatic target recognition and biometric recognition. Among those, object recognition and tracking have received more attention recently due to their wide range of applications such as autonomous cars, automated surveillance, human-computer interaction, and vehicle navigation.Although digital signal processing has long been used to realize such computational systems, they consume extensive silicon area and power. In fact, computational tasks that require low to moderate signal-to-noise ratios are more efficiently realized in analog than digital. However, analog signal processing has its own caveats. Mainly, noise and offset accumulation which degrades the accuracy, and lack of a scalable and standard input/output interface capable of managing a large number of analog data.Two digitally-interfaced analog correlation filter systems are proposed. While digital interfacing provided a standard and scalable way of communication with pre- and post-processing blocks without undermining the energy efficiency of the system, the multiply-accumulate operations were performed in analog. Moreover, non-volatile floating-gate memories are utilized as storage for coefficients. The proposed systems incorporate techniques to reduce the effects of analog circuit imperfections.The first system implements a 24x57 Gilbert-multiplier-based correlation filter. The I/O interface is implemented with low-power D/A and A/D converters and a correlated double sampling technique is implemented to reduce offset and lowfrequency noise at the output of analog array. The prototype chip occupies an area of 3.23mm2 and demonstrates a 25.2pJ/MAC energy-efficiency at 11.3 kVec/s and 3.2% RMSE.The second system realizes a 24x41 PWM-based correlation filter. Benefiting from a time-domain approach to multiplication, this system eliminates the need for explicit D/A and A/D converters. Careful utilization of clock and available hardware resources in the digital I/O interface, along with application of power management techniques has significantly reduced the circuit complexity and energy consumption of the system. Additionally, programmable transconductance amplifiers are incorporated at the output of the analog array for offset and gain error calibration. The prototype system occupies an area of 0.98mm2 and is expected to achieve an outstanding energy-efficiency of 3.6pJ/MAC at 319kVec/s with 0.28% RMSE