Efficient Path Delay Test Generation with Boolean Satisfiability

This dissertation focuses on improving the accuracy and efficiency of path delay test generation using a Boolean satisfiability (SAT) solver. As part of this research, one of the most commonly used SAT solvers, MiniSat, was integrated into the path delay test generator CodGen. A mixed structural-functional approach was implemented in CodGen where longest paths were detected using the K Longest Path Per Gate (KLPG) algorithm and path justification and dynamic compaction were handled with the SAT solver. Advanced techniques were implemented in CodGen to further speed up the performance of SAT based path delay test generation using the knowledge of the circuit structure. SAT solvers are inherently circuit structure unaware, and significant speedup can be availed if structure information of the circuit is provided to the SAT solver. The advanced techniques explored include: Dynamic SAT Solving (DSS), Circuit Observability Don’t Care (Cir-ODC), SAT based static learning, dynamic learnt clause management and Approximate Observability Don’t Care (ACODC). Both ISCAS 89 and ITC 99 benchmarks as well as industrial circuits were used to demonstrate that the performance of CodGen was significantly improved with MiniSat and the use of circuit structure

Pseudo-functional testing: bridging the gap between manufacturing test and functional operation.

Yuan, Feng.Thesis (M.Phil.)--Chinese University of Hong Kong, 2009.Includes bibliographical references (leaves 60-65).Abstract also in Chinese.Abstract --- p.iAcknowledgement --- p.iiChapter 1 --- Introduction --- p.1Chapter 1.1 --- Manufacturing Test --- p.1Chapter 1.1.1 --- Functional Testing vs. Structural Testing --- p.2Chapter 1.1.2 --- Fault Model --- p.3Chapter 1.1.3 --- Automatic Test Pattern Generation --- p.4Chapter 1.1.4 --- Design for Testability --- p.6Chapter 1.2 --- Pseudo-Functional Manufacturing Test --- p.13Chapter 1.3 --- Thesis Motivation and Organization --- p.16Chapter 2 --- On Systematic Illegal State Identification --- p.19Chapter 2.1 --- Introduction --- p.19Chapter 2.2 --- Preliminaries and Motivation --- p.20Chapter 2.3 --- What is the Root Cause of Illegal States? --- p.22Chapter 2.4 --- Illegal State Identification Flow --- p.26Chapter 2.5 --- Justification Scheme Construction --- p.30Chapter 2.6 --- Experimental Results --- p.34Chapter 2.7 --- Conclusion --- p.35Chapter 3 --- Compression-Aware Pseudo-Functional Testing --- p.36Chapter 3.1 --- Introduction --- p.36Chapter 3.2 --- Motivation --- p.38Chapter 3.3 --- Proposed Methodology --- p.40Chapter 3.4 --- Pattern Generation in Compression-Aware Pseudo-Functional Testing --- p.42Chapter 3.4.1 --- Circuit Pre-Processing --- p.42Chapter 3.4.2 --- Pseudo-Functional Random Pattern Generation with Multi-Launch Cycles --- p.43Chapter 3.4.3 --- Compressible Test Pattern Generation for Pseudo-Functional Testing --- p.45Chapter 3.5 --- Experimental Results --- p.52Chapter 3.5.1 --- Experimental Setup --- p.52Chapter 3.5.2 --- Results and Discussion --- p.54Chapter 3.6 --- Conclusion --- p.56Chapter 4 --- Conclusion and Future Work --- p.58Bibliography --- p.6

Optimization of Pseudo Functional Path Delay Test Through Embedded Memories

Traditional automatic test pattern generation achieves high coverage of logic faults in integrated circuits. Automatic test of embedded memory arrays uses built-in self-test. Testing the memories and logic separately does not fully test the critical timing paths that go into or out of memories. Prior research has developed algorithms and software to test the longest paths into and out of embedded memories. However, in this prior work, the test generation time increased superlinearly with memory size. This is contrary to the intuition that the time should rise approximately linearly with memory size. This behavior limits the algorithm to circuits with relatively small memories. The focus of this research is to analyze the time complexity of the algorithm and propose changes to reduce the time required to test circuits with large memories. We use our prior work on pseudo functional K longest path per gate test generation, and the benchmark circuits with embedded memories developed in the prior work. Since the cells within a memory array are not scan cells, a value that is captured in a memory cell must be moved to a scan cell using low-speed coda cycles. This approach will also support the test of any non-scan flip-flop or latch, in addition to embedded memory arrays. In addition to testing the critical timing paths, testing through memories eliminates the logic “shadows” around the memory where faults cannot be tested. In this research our complexity analysis has identified the reason for the superlinear increase in test generation time with larger memories and verified this analysis with experimental results. We have also developed and implemented several heuristics to increase performance, with experimental results. This research also identifies the major algorithm changes required to further increase performance

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks