Readiness of Quantum Optimization Machines for Industrial Applications

There have been multiple attempts to demonstrate that quantum annealing and, in particular, quantum annealing on quantum annealing machines, has the potential to outperform current classical optimization algorithms implemented on CMOS technologies. The benchmarking of these devices has been controversial. Initially, random spin-glass problems were used, however, these were quickly shown to be not well suited to detect any quantum speedup. Subsequently, benchmarking shifted to carefully crafted synthetic problems designed to highlight the quantum nature of the hardware while (often) ensuring that classical optimization techniques do not perform well on them. Even worse, to date a true sign of improved scaling with the number of problem variables remains elusive when compared to classical optimization techniques. Here, we analyze the readiness of quantum annealing machines for real-world application problems. These are typically not random and have an underlying structure that is hard to capture in synthetic benchmarks, thus posing unexpected challenges for optimization techniques, both classical and quantum alike. We present a comprehensive computational scaling analysis of fault diagnosis in digital circuits, considering architectures beyond D-wave quantum annealers. We find that the instances generated from real data in multiplier circuits are harder than other representative random spin-glass benchmarks with a comparable number of variables. Although our results show that transverse-field quantum annealing is outperformed by state-of-the-art classical optimization algorithms, these benchmark instances are hard and small in the size of the input, therefore representing the first industrial application ideally suited for testing near-term quantum annealers and other quantum algorithmic strategies for optimization problems.Comment: 22 pages, 12 figures. Content updated according to Phys. Rev. Applied versio

Approximate Model-Based Diagnosis Using Greedy Stochastic Search

We propose a StochAstic Fault diagnosis AlgoRIthm, called SAFARI, which trades off guarantees of computing minimal diagnoses for computational efficiency. We empirically demonstrate, using the 74XXX and ISCAS-85 suites of benchmark combinatorial circuits, that SAFARI achieves several orders-of-magnitude speedup over two well-known deterministic algorithms, CDA* and HA*, for multiple-fault diagnoses; further, SAFARI can compute a range of multiple-fault diagnoses that CDA* and HA* cannot. We also prove that SAFARI is optimal for a range of propositional fault models, such as the widely-used weak-fault models (models with ignorance of abnormal behavior). We discuss the optimality of SAFARI in a class of strong-fault circuit models with stuck-at failure modes. By modeling the algorithm itself as a Markov chain, we provide exact bounds on the minimality of the diagnosis computed. SAFARI also displays strong anytime behavior, and will return a diagnosis after any non-trivial inference time

Diagnosability and detectability of multiple faults in nonlinear models

This paper presents a novel method for assessing multiple fault diagnosability and detectability of nonlinear parametrized dynamical models. This method is based on computer algebra algorithms which return precomputed values of algebraic expressions characterizing the presence of some constant multiple fault(s). Estimations of these expressions, obtained from inputs and outputs measurements, permit then the detection and the isolation of multiple faults acting on the system. This method applied on a coupled water-tank model attests the relevance of the suggested approach

Optimal discrimination between transient and permanent faults

An important practical problem in fault diagnosis is discriminating between permanent faults and transient faults. In many computer systems, the majority of errors are due to transient faults. Many heuristic methods have been used for discriminating between transient and permanent faults; however, we have found no previous work stating this decision problem in clear probabilistic terms. We present an optimal procedure for discriminating between transient and permanent faults, based on applying Bayesian inference to the observed events (correct and erroneous results). We describe how the assessed probability that a module is permanently faulty must vary with observed symptoms. We describe and demonstrate our proposed method on a simple application problem, building the appropriate equations and showing numerical examples. The method can be implemented as a run-time diagnosis algorithm at little computational cost; it can also be used to evaluate any heuristic diagnostic procedure by compariso

Any time probabilistic reasoning for sensor validation

For many real time applications, it is important to validate the information received form the sensors before entering higher levels of reasoning. This paper presents an any time probabilistic algorithm for validating the information provided by sensors. The system consists of two Bayesian network models. The first one is a model of the dependencies between sensors and it is used to validate each sensor. It provides a list of potentially faulty sensors. To isolate the real faults, a second Bayesian network is used, which relates the potential faults with the real faults. This second model is also used to make the validation algorithm any time, by validating first the sensors that provide more information. To select the next sensor to validate, and measure the quality of the results at each stage, an entropy function is used. This function captures in a single quantity both the certainty and specificity measures of any time algorithms. Together, both models constitute a mechanism for validating sensors in an any time fashion, providing at each step the probability of correct/faulty for each sensor, and the total quality of theresults. The algorithm has been tested in the validation of temperature sensors of a power plant

Any Time Probabilistic Reasoning for Sensor Validation

For many real time applications, it is important to validate the information received from the sensors before entering higher levels of reasoning. This paper presents an any time probabilistic algorithm for validating the information provided by sensors. The system consists of two Bayesian network models. The first one is a model of the dependencies between sensors and it is used to validate each sensor. It provides a list of potentially faulty sensors. To isolate the real faults, a second Bayesian network is used, which relates the potential faults with the real faults. This second model is also used to make the validation algorithm any time, by validating first the sensors that provide more information. To select the next sensor to validate, and measure the quality of the results at each stage, an entropy function is used. This function captures in a single quantity both the certainty and specificity measures of any time algorithms. Together, both models constitute a mechanism for validating sensors in an any time fashion, providing at each step the probability of correct/faulty for each sensor, and the total quality of the results. The algorithm has been tested in the validation of temperature sensors of a power plant.Comment: Appears in Proceedings of the Fourteenth Conference on Uncertainty in Artificial Intelligence (UAI1998

Parallel Equivalence Class Sorting: Algorithms, Lower Bounds, and Distribution-Based Analysis

We study parallel comparison-based algorithms for finding all equivalence classes of a set of $n$ elements, where sorting according to some total order is not possible. Such scenarios arise, for example, in applications, such as in distributed computer security, where each of $n$ agents are working to identify the private group to which they belong, with the only operation available to them being a zero-knowledge pairwise-comparison (which is sometimes called a "secret handshake") that reveals only whether two agents are in the same group or in different groups. We provide new parallel algorithms for this problem, as well as new lower bounds and distribution-based analysis

Plant-wide fault and disturbance screening using combined transfer entropy and eigenvector centrality analysis

Finding the source of a disturbance or fault in complex systems such as industrial chemical processing plants can be a difficult task and consume a significant number of engineering hours. In many cases, a systematic elimination procedure is considered to be the only feasible approach but can cause undesired process upsets. Practitioners desire robust alternative approaches. This paper presents an unsupervised, data-driven method for ranking process elements according to the magnitude and novelty of their influence. Partial bivariate transfer entropy estimation is used to infer a weighted directed graph of process elements. Eigenvector centrality is applied to rank network nodes according to their overall effect. As the ranking of process elements rely on emerging properties that depend on the aggregate of many connections, the results are robust to errors in the estimation of individual edge properties and the inclusion of indirect connections that do not represent the true causal structure of the process. A monitoring chart of continuously calculated process element importance scores over multiple overlapping time regions can assist with incipient fault detection. Ranking results combined with visual inspection of information transfer networks is also useful for root cause analysis of known faults and disturbances. A software implementation of the proposed method is available.Comment: 21 pages, 9 figure

Machine learning for cognitive networks : technology assessment and research challenges

The field of machine learning has made major strides over the last 20 years. This document summarizes the major problem formulations that the discipline has studied, then reviews three tasks in cognitive networking and briefly discusses how aspects of those tasks fit these formulations. After this, it discusses challenges for machine learning research raised by Knowledge Plane applications and closes with proposals for the evaluation of learning systems developed for these problems

Machine learning and its applications in reliability analysis systems

In this thesis, we are interested in exploring some aspects of Machine Learning (ML) and its application in the Reliability Analysis systems (RAs). We begin by investigating some ML paradigms and their- techniques, go on to discuss the possible applications of ML in improving RAs performance, and lastly give guidelines of the architecture of learning RAs. Our survey of ML covers both levels of Neural Network learning and Symbolic learning. In symbolic process learning, five types of learning and their applications are discussed: rote learning, learning from instruction, learning from analogy, learning from examples, and learning from observation and discovery. The Reliability Analysis systems (RAs) presented in this thesis are mainly designed for maintaining plant safety supported by two functions: risk analysis function, i.e., failure mode effect analysis (FMEA) ; and diagnosis function, i.e., real-time fault location (RTFL). Three approaches have been discussed in creating the RAs. According to the result of our survey, we suggest currently the best design of RAs is to embed model-based RAs, i.e., MORA (as software) in a neural network based computer system (as hardware). However, there are still some improvement which can be made through the applications of Machine Learning. By implanting the 'learning element', the MORA will become learning MORA (La MORA) system, a learning Reliability Analysis system with the power of automatic knowledge acquisition and inconsistency checking, and more. To conclude our thesis, we propose an architecture of La MORA