Enhancing the Accuracy of Microwave Element Models by Artificial Neural Networks

In the recent PSpice programs, five types of the GaAs FET model have been implemented. However, some of them are too sophisticated and therefore very difficult to measure and identify afterwards, especially the realistic model of Parker and Skellern. In the paper, simple enhancements of one of the classical models are proposed first. The resulting modification is usable for the accurate modeling of both GaAs FETs and pHEMTs. Moreover, its updated capacitance function can serve as an accurate representation of microwave varactors, which is also important. The precision of the updated models can be strongly enhanced using the artificial neural networks. In the paper, both using an exclusive neural network without an analytic model and cooperating a corrective neural network with the updated analytic model will be discussed. The accuracy of the analytic models, the models based on the exclusive neural network, and the models created as a combination of the updated analytic model and the corrective neural network will be compared

Advanced Process Monitoring for Industry 4.0

This book reports recent advances on Process Monitoring (PM) to cope with the many challenges raised by the new production systems, sensors and “extreme data” conditions that emerged with Industry 4.0. Concepts such as digital-twins and deep learning are brought to the PM arena, pushing forward the capabilities of existing methodologies to handle more complex scenarios. The evolution of classical paradigms such as Latent Variable modeling, Six Sigma and FMEA are also covered. Applications span a wide range of domains such as microelectronics, semiconductors, chemicals, materials, agriculture, as well as the monitoring of rotating equipment, combustion systems and membrane separation processes

Doctor of Philosophy

dissertationIn order to ensure high production yield of semiconductor devices, it is desirable to characterize intermediate progress towards the final product by using metrology tools to acquire relevant measurements after each sequential processing step. The metrology data are commonly used in feedback and feed-forward loops of Run-to-Run (R2R) controllers to improve process capability and optimize recipes from lot-to-lot or batch-to-batch. In this dissertation, we focus on two related issues. First, we propose a novel non-threaded R2R controller that utilizes all available metrology measurements, even when the data were acquired during prior runs that differed in their contexts from the current fabrication thread. The developed controller is the first known implementation of a non-threaded R2R control strategy that was successfully deployed in the high-volume production semiconductor fab. Its introduction improved the process capability by 8% compared with the traditional threaded R2R control and significantly reduced out of control (OOC) events at one of the most critical steps in NAND memory manufacturing. The second contribution demonstrates the value of developing virtual metrology (VM) estimators using the insight gained from multiphysics models. Unlike the traditional statistical regression techniques, which lead to linear models that depend on a linear combination of the available measurements, we develop VM models, the structure of which and the functional interdependence between their input and output variables are determined from the insight provided by the multiphysics describing the operation of the processing step for which the VM system is being developed. We demonstrate this approach for three different processes, and describe the superior performance of the developed VM systems after their first-of-a-kind deployment in a high-volume semiconductor manufacturing environment

LASER Tech Briefs, Spring 1994

Topics in this Laser Tech Brief include: Electronic Components and Circuits. Electronic Systems, Physical Sciences, Materials, Mechanics, Fabrication Technology, and books and reports

Towards multi-model approaches to predictive maintenance: A systematic literature survey on diagnostics and prognostics

The use of a modern technological system requires a good engineering approach, optimized operations, and proper maintenance in order to keep the system in an optimal state. Predictive maintenance focuses on the organization of maintenance actions according to the actual health state of the system, aiming at giving a precise indication of when a maintenance intervention will be necessary. Predictive maintenance is normally implemented by means of specialized computational systems that incorporate one of several models to fulfil diagnostics and prognostics tasks. As complexity of technological systems increases over time, single-model approaches hardly fulfil all functions and objectives for predictive maintenance systems. It is increasingly common to find research studies that combine different models in multi-model approaches to overcome complexity of predictive maintenance tasks, considering the advantages and disadvantages of each single model and trying to combine the best of them. These multi-model approaches have not been extensively addressed by previous review studies on predictive maintenance. Besides, many of the possible combinations for multi-model approaches remain unexplored in predictive maintenance applications; this offers a vast field of opportunities when architecting new predictive maintenance systems. This systematic survey aims at presenting the current trends in diagnostics and prognostics giving special attention to multi-model approaches and summarizing the current challenges and research opportunities

IoT Applications Computing

The evolution of emerging and innovative technologies based on Industry 4.0 concepts are transforming society and industry into a fully digitized and networked globe. Sensing, communications, and computing embedded with ambient intelligence are at the heart of the Internet of Things (IoT), the Industrial Internet of Things (IIoT), and Industry 4.0 technologies with expanding applications in manufacturing, transportation, health, building automation, agriculture, and the environment. It is expected that the emerging technology clusters of ambient intelligence computing will not only transform modern industry but also advance societal health and wellness, as well as and make the environment more sustainable. This book uses an interdisciplinary approach to explain the complex issue of scientific and technological innovations largely based on intelligent computing

Palmo : a novel pulsed based signal processing technique for programmable mixed-signal VLSI

In this thesis a new signal processing technique is presented. This technique exploits the use of pulses as the signalling mechanism. This Palmo 1 signalling method applied to signal processing is novel, combining the advantages of both digital and analogue techniques. Pulsed signals are robust, inherently low-power, easily regenerated, and easily distributed across and between chips. The Palmo cells used to perform analogue operations on the pulsed signals are compact, fast, simple and programmable

Small business innovation research: Program solicitation

This, the seventh annual SBIR solicitation by NASA, describes the program, identifies eligibility requirements, outlines the required proposal format and content, states proposal preparation and submission requirements, describes the proposal evaluation and award selection process, and provides other information to assist those interested in participating in NASA's SBIR program. It also identifies the Technical Topics and Subtopics in which SBIR Phase 1 proposals are solicited in 1989. These Topics and Subtopics cover a broad range of current NASA interests, but do not necessarily include all areas in which NASA plans or currently conducts research. High-risk high pay-off innovations are desired

Extended field-of-view ultrathin microendoscopes with built-in aberration correction for high-resolution functional imaging with minimal invasiveness

TB