From FPGA to ASIC: A RISC-V processor experience

This work document a correct design flow using these tools in the Lagarto RISC- V Processor and the RTL design considerations that must be taken into account, to move from a design for FPGA to design for ASIC

Hardware Certification for Real-time Safety-critical Systems: State of the Art

This paper discusses issues related to the RTCA document DO-254 Design Assurance Guidance for Airborne Electronic Hardware and its consequences for hardware certification. In particular, problems related to circuits’ compliance with DO-254 in avionics and other industries are considered. Extensive literature review of the subject is given, including current views on and experiences of chip manufacturers and EDA industry with qualification of hardware design tools, including formal approaches to hardware verification. Some results of the authors’ own study on tool qualification are presented

Multisensor knowledge systems

technical reportWe describe an approach which facilitates and makes explicit the organization of the knowledge necessary to map multisensor system requirements onto an appropriate assembly of algorithms, processors, sensors, and actuators. We have previously introduced the Multisensor Kernel System and Logical Sensor Specifications as a means for high-level specification of multisensor systems. The main goals of such a characterization are: to develop a coherent treatment of multisensor information, to allow system reconfiguration for both fault tolerance and dynamic response to environmental conditions, and to permit the explicit description of control. In this paper we show how Logical Sensors can be incorporated into an object-based approach to the organization of multisensor systems. In particular, we discuss: * a multisensor knowledge base, * a sensor specification scheme, and * a multisensor simulation environment. We give an example application of the system to CAD-based 2-D vision

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks