Seven ways to improve example-based single image super resolution

In this paper we present seven techniques that everybody should know to improve example-based single image super resolution (SR): 1) augmentation of data, 2) use of large dictionaries with efficient search structures, 3) cascading, 4) image self-similarities, 5) back projection refinement, 6) enhanced prediction by consistency check, and 7) context reasoning. We validate our seven techniques on standard SR benchmarks (i.e. Set5, Set14, B100) and methods (i.e. A+, SRCNN, ANR, Zeyde, Yang) and achieve substantial improvements.The techniques are widely applicable and require no changes or only minor adjustments of the SR methods. Moreover, our Improved A+ (IA) method sets new state-of-the-art results outperforming A+ by up to 0.9dB on average PSNR whilst maintaining a low time complexity.Comment: 9 page

Sparsity-Based Super Resolution for SEM Images

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.Comment: Final publication available at ACS Nano Letter

Learning a Mixture of Deep Networks for Single Image Super-Resolution

Single image super-resolution (SR) is an ill-posed problem which aims to recover high-resolution (HR) images from their low-resolution (LR) observations. The crux of this problem lies in learning the complex mapping between low-resolution patches and the corresponding high-resolution patches. Prior arts have used either a mixture of simple regression models or a single non-linear neural network for this propose. This paper proposes the method of learning a mixture of SR inference modules in a unified framework to tackle this problem. Specifically, a number of SR inference modules specialized in different image local patterns are first independently applied on the LR image to obtain various HR estimates, and the resultant HR estimates are adaptively aggregated to form the final HR image. By selecting neural networks as the SR inference module, the whole procedure can be incorporated into a unified network and be optimized jointly. Extensive experiments are conducted to investigate the relation between restoration performance and different network architectures. Compared with other current image SR approaches, our proposed method achieves state-of-the-arts restoration results on a wide range of images consistently while allowing more flexible design choices. The source codes are available in http://www.ifp.illinois.edu/~dingliu2/accv2016