Using machine learning techniques to evaluate multicore soft error reliability

Virtual platform frameworks have been extended to allow earlier soft error analysis of more realistic multicore systems (i.e., real software stacks, state-of-the-art ISAs). The high observability and simulation performance of underlying frameworks enable to generate and collect more error/failurerelated data, considering complex software stack configurations, in a reasonable time. When dealing with sizeable failure-related data sets obtained from multiple fault campaigns, it is essential to filter out parameters (i.e., features) without a direct relationship with the system soft error analysis. In this regard, this paper proposes the use of supervised and unsupervised machine learning techniques, aiming to eliminate non-relevant information as well as identify the correlation between fault injection results and application and platform characteristics. This novel approach provides engineers with appropriate means that able are able to investigate new and more efficient fault mitigation techniques. The underlying approach is validated with an extensive data set gathered from more than 1.2 million fault injections, comprising several benchmarks, a Linux OS and parallelization libraries (e.g., MPI, OpenMP), as well as through a realistic automotive case study

An extensive study on iterative solver resilience : characterization, detection and prediction

Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's behavior. This has motivated the design of an array of techniques to detect, isolate, and correct soft errors using microarchitectural, architectural, compilation­based, or application-level techniques to minimize their impact on the executing application. The first step toward the design of good error detection/correction techniques involves an understanding of an application's vulnerability to soft errors. This work focuses on silent data e orruption's effects on iterative solvers and efforts to mitigate those effects. In this thesis, we first present the first comprehensive characterizalion of !he impact of soft errors on !he convergen ce characteris tics of six iterative methods using application-level fault injection. We analyze the impact of soft errors In terms of the type of error (single-vs multi-bit), the distribution and location of bits affected, the data structure and statement impacted, and varialion with time. We create a public access database with more than 1.5 million fault injection results. We then analyze the performance of soft error detection mechanisms and present the comparalive results. Molivated by our observations, we evaluate a machine-learning based detector that takes as features that are the runtime features observed by the individual detectors to arrive al their conclusions. Our evalualion demonstrates improved results over individual detectors. We then propase amachine learning based method to predict a program's error behavior to make fault injection studies more efficient. We demonstrate this method on asse ssing the performance of soft error detectors. We show that our method maintains 84% accuracy on average with up to 53% less cost. We also show, once a model is trained further fault injection tests would cost 10% of the expected full fault injection runs.“Soft errors” causados por cambios de estado transitorios en bits, tienen el potencial de impactar significativamente el comportamiento de una aplicación. Esto, ha motivado el diseño de una variedad de técnicas para detectar, aislar y corregir soft errors aplicadas a micro-arquitecturas, arquitecturas, tiempo de compilación y a nivel de aplicación para minimizar su impacto en la ejecución de una aplicación. El primer paso para diseñar una buna técnica de detección/corrección de errores, implica el conocimiento de las vulnerabilidades de la aplicación ante posibles soft errors. Este trabajo se centra en los efectos de la corrupción silenciosa de datos en soluciones iterativas, así como en los esfuerzos para mitigar esos efectos. En esta tesis, primeramente, presentamos la primera caracterización extensiva del impacto de soft errors sobre las características convergentes de seis métodos iterativos usando inyección de fallos a nivel de aplicación. Analizamos el impacto de los soft errors en términos del tipo de error (único vs múltiples-bits), de la distribución y posición de los bits afectados, las estructuras de datos, instrucciones afectadas y de las variaciones en el tiempo. Creamos una base de datos pública con más de 1.5 millones de resultados de inyección de fallos. Después, analizamos el desempeño de mecanismos de detección de soft errors actuales y presentamos los resultados de su comparación. Motivados por las observaciones de los resultados presentados, evaluamos un detector de soft errors basado en técnicas de machine learning que toma como entrada las características observadas en el tiempo de ejecución individual de los detectores anteriores al llegar a su conclusión. La evaluación de los resultados obtenidos muestra una mejora por sobre los detectores individualmente. Basados en estos resultados propusimos un método basado en machine learning para predecir el comportamiento de los errores en un programa con el fin de hacer el estudio de inyección de errores mas eficiente. Presentamos este método para evaluar el rendimiento de los detectores de soft errors. Demostramos que nuestro método mantiene una precisión del 84% en promedio con hasta un 53% de mejora en el tiempo de ejecución. También mostramos que una vez que un modelo ha sido entrenado, las pruebas de inyección de errores siguientes costarían 10% del tiempo esperado de ejecución.Postprint (published version

From detection to optimization: impact of soft errors on high-performance computing applications

As high-performance computing (HPC) continues to progress, constraints on HPC system design forces the handling of errors to higher levels in the software stack. Of the types of errors facing HPC, soft errors that silently corrupt system or application state are among the most severe. The behavior of HPC applications in the presence of soft errors is critical to gain insight for effective utilization of HPC systems. The need to understand this behavior can be used in developing algorithm-based error detection guided by application characteristics from fault injection and error propagation studies. Furthermore, the realization that applications are tolerant to small errors allows optimizations such as lossy compression on high-cost data transfers. Lossy compression adds small user controllable amounts of error when compressing data, to reduce data size before expensive data transfers saving time. This dissertation investigates and improves the resiliency of HPC applications to soft errors, and explores lossy compression as a new form of optimization for expensive, time-consuming data transfers

Toward Reliable and Efficient Message Passing Software for HPC Systems: Fault Tolerance and Vector Extension

As the scale of High-performance Computing (HPC) systems continues to grow, researchers are devoted themselves to achieve the best performance of running long computing jobs on these systems. My research focus on reliability and efficiency study for HPC software. First, as systems become larger, mean-time-to-failure (MTTF) of these HPC systems is negatively impacted and tends to decrease. Handling system failures becomes a prime challenge. My research aims to present a general design and implementation of an efficient runtime-level failure detection and propagation strategy targeting large-scale, dynamic systems that is able to detect both node and process failures. Using multiple overlapping topologies to optimize the detection and propagation, minimizing the incurred overhead sand guaranteeing the scalability of the entire framework. Results from different machines and benchmarks compared to related works shows that my design and implementation outperforms non-HPC solutions significantly, and is competitive with specialized HPC solutions that can manage only MPI applications. Second, I endeavor to implore instruction level parallelization to achieve optimal performance. Novel processors support long vector extensions, which enables researchers to exploit the potential peak performance of target architectures. Intel introduced Advanced Vector Extension (AVX512 and AVX2) instructions for x86 Instruction Set Architecture (ISA). Arm introduced Scalable Vector Extension (SVE) with a new set of A64 instructions. Both enable greater parallelisms. My research utilizes long vector reduction instructions to improve the performance of MPI reduction operations. Also, I use gather and scatter feature to speed up the packing and unpacking operation in MPI. The evaluation of the resulting software stack under different scenarios demonstrates that the approach is not only efficient but also generalizable to many vector architecture and efficient

Exploiting eager register release in a redundantly multi-threaded processor

Journal ArticleDue to shrinking transistor sizes and lower supply voltages, transient faults (soft errors) in computer systems are projected to increase by orders of magnitude. Fault detection and recovery can be achieved through redundancy. Redundant multithreading (RMT) is one attractive approach to detect and recover from these errors. However, redundant threads can impose significant performance overheads by competing with the main program for resources such as the register file. In this paper, we propose using eager register release in the main program thread by exploiting the availability of register values in the trailing thread's register space. This performance optimization can help support a smaller register file and potentially reduce register file access time, power consumption, and increase its immunity towards soft errors

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Techniques for Aging, Soft Errors and Temperature to Increase the Reliability of Embedded On-Chip Systems

This thesis investigates the challenge of providing an abstracted, yet sufficiently accurate reliability estimation for embedded on-chip systems. In addition, it also proposes new techniques to increase the reliability of register files within processors against aging effects and soft errors. It also introduces a novel thermal measurement setup that perspicuously captures the infrared images of modern multi-core processors