1,894 research outputs found
COLOR CONVERSION AND WATER SHED SEGMENTATION FOR RGB IMAGES
In this paper we describes the conversion preserves feature discriminability and reasonable color ordering, while respecting the original lightness of colors, by simple optimization of a nonlinear global mapping. Experimental results show that our method produces convincing results for a variety of color images. The required luminance adjustments are small and always lie within 1% of the mean luminance. Since all adapting lights are of the same luminance, zero luminance adjustments (dashed lines) are predicted for the asymmetric color matches under the hypothesis that adaptation is confined to the L–2M, the S – (L + M) and the L + 2M.The recovery of shape from texture under perspective projection. This is made possible by imposing a notion of homogeneity for the original texture, according it which the deformation gradient is equal to the velocity of the texture gradient equation this work studies a method called Normalized Cut and proposes an image segmentation strategy utilizing two ways to convert images into graphs: Pixel affinity and watershed transform
DART: Dependable VLSI Test Architecture and Its Implementation
Although many electronic safety-related systems require very high reliability, it is becoming harder and harder to achieve it because of delay-related failures, which are caused by decreased noise margin. This paper describes a technology named DART and its implementation. The DART repeatedly measures the maximum delay of a circuit and the amount of degradation in field, in consequence, confirms the marginality of the circuit. The system employing the DART will be informed the significant reduction of delay margin in advance of a failure and be able to repair it at an appropriate time. The DART also equips a technique to improve the test coverage using the rotating test and a technique to consider the test environment such as temperature or voltage using novel ring-oscillator-based monitors. The authors applied the proposed technology to an industrial design and confirmed its effectiveness and availability with reasonable resources.2012 IEEE International Test Conference, 5-8 November 2012, Anaheim, CA, US
Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests
As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing is indispensable to guarantee the correct timing behavior of the circuits. In this dissertation, we describe methods developed for three aspects of delay testing in scan-based circuits: test generation, path selection and built-in test generation.
We first describe a deterministic broadside test generation procedure for a path delay fault model named the transition path delay fault model, which captures both large and small delay defects. Under this fault model, a path delay fault is detected only if all the individual transition faults along the path are detected by the same test. To reduce the complexity of test generation, sub-procedures with low complexity are applied before a complete branch-and-bound procedure. Next, we describe a method based on static timing analysis to select critical paths for test generation. Logic conditions that are necessary for detecting a path delay fault are considered to refine the accuracy of static timing analysis, using input necessary assignments. Input necessary assignments are input values that must be assigned to detect a fault. The method calculates more accurate path delays, selects paths that are critical during test application, and identifies undetectable path delay faults. These two methods are applicable to off-line test generation. For large circuits with high complexity and frequency, built-in test generation is a cost-effective method for delay testing. For a circuit that is embedded in a larger design, we developed a method for built-in generation of functional broadside tests to avoid excessive power dissipation during test application and the overtesting of delay faults, taking the functional constraints on the primary input sequences of the circuit into consideration. Functional broadside tests are scan-based two-pattern tests for delay faults that create functional operation conditions during test application. To avoid the potential fault coverage loss due to the exclusive use of functional broadside tests, we also developed an optional DFT method based on state holding to improve fault coverage. High delay fault coverage can be achieved by the developed method for benchmark circuits using simple hardware
Automated Pilot Advisory System
An Automated Pilot Advisory System (APAS) was developed and operationally tested to demonstrate the concept that low cost automated systems can provide air traffic and aviation weather advisory information at high density uncontrolled airports. The system was designed to enhance the see and be seen rule of flight, and pilots who used the system preferred it over the self announcement system presently used at uncontrolled airports
フィールドにおけるテスト印加と低電力論理BISTに関する研究
Advances in semiconductor process technology have resulted in various aging issues in field operation of Very Large Scale Integration (VLSI) circuits. For example, HCI (Hot carrier injection), BTI (Bias Temperature Instability), TDDB (Time Dependent Dielectric Breakdown) are well-known aging phenomena, and they can increase the circuit delay resulting in serious reliability problems. In order to avoid system failures caused by aging, recent design usually sets a certain timing margin in operational frequency of the circuit. However, it is difficult to determine the size of the proper timing margin because of the difficulty of prediction of its aging speed in actual use that is related to operational environment. Pessimistic prediction may result in performance sacrificing although it will improve the reliability of the system. BIST-based field test is a promising way to guarantee the reliability of the circuit through detecting the aging-induced faults during the circuit operation. However, the field test has a limitation on test application time, which makes it difficult to achieve high test quality. Therefore an effective test application method at field is required. In addition to the requirement of short test application time, the BIST-based field test requires performing at-speed testing in order to detect timing-related defects. However, it is well known that power dissipation during testing is much higher than that in normal circuit operation. Because excessive power dissipation causes higher IR-drop and higher temperature, it results in delay increase during testing, and in turn, causing false at-speed testing and yield loss. While many low power test methods have been proposed to tackle the test power issue, inadequate test power reduction and lower fault coverage still remain as important issues. Moreover, low power testing that just focuses on power reduction is insufficient. When the test power is reduced to a very low level, a timing-related defect may be missed by the test, and a defective circuit will appear to be a good part passing the test. Therefore, appropriate test power control is necessary though it was out of considering in the existing methods. In this dissertation, we first proposed a new test application to satisfy the limitation of short test application time for BIST-based field test, and then we proposed a new low power BIST scheme that focuses on controlling the test power to a specified value for improving the field test quality. In chapter 3, a new field test application method named “rotating test” is presented in which a set of generated test patterns to detect aging-induced faults is partitioned into several subsets, and apply each subset in one test session at field. In order to maximize the test quality for rotating test, we proposed test partitioning methods that refer to two items: First one aims at maximizing fault coverage of each subset obtained by partitioning. Second one aims at minimizing the detection time interval of all faults in rotating test to avoid system failures. Experimental results demonstrated the effectiveness of the proposed partitioning methods. In chapter 4, we proposed a new low power BIST scheme which can control the scan-in power, scan-out power and capture power while keeping test coverage at high level. In this scheme, a new circuit called pseudo low-pass filter (PLPF) is developed for scan-in power control, and a multi-cycle capture test technique is employed to reduce the capture power. In order to control scan-out power dissipated by test responses, we proposed a novel method that selects some flip-flops in scan chains at logic design phase, and fills the selected flip-flops with proper values before starting scan-shift operation so as to reduce the switching activity associated with scan-out. The experimental results for ISCAS-89 and ITC-99 benchmark circuits show that significant scan-in power reduction rate (the original rate of 50% is reduced to 7~8%) and capture power reduction rate (the original rate of 20% is reduced to 6~7%) were derived. With the scan-out controlling method, the scan-out power can be reduced from 17.2% to 8.4%, which could not be achieved by the conventional methods. Moreover, in order to control the test power to the specified rate to accommodate the various test power requirements. A scan-shift power controlling scheme was also discussed. It showed the capability of controlling any scan-shift toggle rate between 6.7% and 50%.九州工業大学博士学位論文 学位記番号:情工博甲第289号 学位授与年月日:平成26年3月25日1. INTRODUCTION|2. PRELIMINARY|3. BIST-BASED FIELD ROTATING TEST FOR AGING-INDUCED FAULT DETECTION|4. TEST POWER REDUCTION FOR LOGIC-BIST|5. SUMMARY九州工業大学平成25年
NASA Tech Briefs, October 2011
Topics covered include: Laser Truss Sensor for Segmented Telescope Phasing; Qualifications of Bonding Process of Temperature Sensors to Deep-Space Missions; Optical Sensors for Monitoring Gamma and Neutron Radiation; Compliant Tactile Sensors; Cytometer on a Chip; Measuring Input Thresholds on an Existing Board; Scanning and Defocusing Properties of Microstrip Reflectarray Antennas; Cable Tester Box; Programmable Oscillator; Fault-Tolerant, Radiation-Hard DSP; Sub-Shot Noise Power Source for Microelectronics; Asynchronous Message Service Reference Implementation; Zero-Copy Objects System; Delay and Disruption Tolerant Networking MACHETE Model; Contact Graph Routing; Parallel Eclipse Project Checkout; Technique for Configuring an Actively Cooled Thermal Shield in a Flight System; Use of Additives to Improve Performance of Methyl Butyrate-Based Lithium-Ion Electrolytes; Li-Ion Cells Employing Electrolytes with Methyl Propionate and Ethyl Butyrate Co-Solvents; Improved Devices for Collecting Sweat for Chemical Analysis; Tissue Photolithography; Method for Impeding Degradation of Porous Silicon Structures; External Cooling Coupled to Reduced Extremity Pressure Device; A Zero-Gravity Cup for Drinking Beverages in Microgravity; Co-Flow Hollow Cathode Technology; Programmable Aperture with MEMS Microshutter Arrays; Polished Panel Optical Receiver for Simultaneous RF/Optical Telemetry with Large DSN Antennas; Adaptive System Modeling for Spacecraft Simulation; Lidar-Based Navigation Algorithm for Safe Lunar Landing; Tracking Object Existence From an Autonomous Patrol Vehicle; Rad-Hard, Miniaturized, Scalable, High-Voltage Switching Module for Power Applications; and Architecture for a 1-GHz Digital RADAR
Space Shuttle/TDRSS communication and tracking systems analysis
In order to evaluate the technical and operational problem areas and provide a recommendation, the enhancements to the Tracking and Data Delay Satellite System (TDRSS) and Shuttle must be evaluated through simulation and analysis. These enhancement techniques must first be characterized, then modeled mathematically, and finally updated into LinCsim (analytical simulation package). The LinCsim package can then be used as an evaluation tool. Three areas of potential enhancements were identified: shuttle payload accommodations, TDRSS SSA and KSA services, and shuttle tracking system and navigation sensors. Recommendations for each area were discussed
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