Pushing towards the Limit of Sampling Rate: Adaptive Chasing Sampling

Measurement samples are often taken in various monitoring applications. To reduce the sensing cost, it is desirable to achieve better sensing quality while using fewer samples. Compressive Sensing (CS) technique finds its role when the signal to be sampled meets certain sparsity requirements. In this paper we investigate the possibility and basic techniques that could further reduce the number of samples involved in conventional CS theory by exploiting learning-based non-uniform adaptive sampling. Based on a typical signal sensing application, we illustrate and evaluate the performance of two of our algorithms, Individual Chasing and Centroid Chasing, for signals of different distribution features. Our proposed learning-based adaptive sampling schemes complement existing efforts in CS fields and do not depend on any specific signal reconstruction technique. Compared to conventional sparse sampling methods, the simulation results demonstrate that our algorithms allow $46\%$ less number of samples for accurate signal reconstruction and achieve up to $57\%$ smaller signal reconstruction error under the same noise condition.Comment: 9 pages, IEEE MASS 201

Communication channel analysis and real time compressed sensing for high density neural recording devices

Next generation neural recording and Brain- Machine Interface (BMI) devices call for high density or distributed systems with more than 1000 recording sites. As the recording site density grows, the device generates data on the scale of several hundred megabits per second (Mbps). Transmitting such large amounts of data induces significant power consumption and heat dissipation for the implanted electronics. Facing these constraints, efficient on-chip compression techniques become essential to the reduction of implanted systems power consumption. This paper analyzes the communication channel constraints for high density neural recording devices. This paper then quantifies the improvement on communication channel using efficient on-chip compression methods. Finally, This paper describes a Compressed Sensing (CS) based system that can reduce the data rate by > 10x times while using power on the order of a few hundred nW per recording channel

Efficient high-dimensional entanglement imaging with a compressive sensing, double-pixel camera

We implement a double-pixel, compressive sensing camera to efficiently characterize, at high resolution, the spatially entangled fields produced by spontaneous parametric downconversion. This technique leverages sparsity in spatial correlations between entangled photons to improve acquisition times over raster-scanning by a scaling factor up to n^2/log(n) for n-dimensional images. We image at resolutions up to 1024 dimensions per detector and demonstrate a channel capacity of 8.4 bits per photon. By comparing the classical mutual information in conjugate bases, we violate an entropic Einstein-Podolsky-Rosen separability criterion for all measured resolutions. More broadly, our result indicates compressive sensing can be especially effective for higher-order measurements on correlated systems.Comment: 10 pages, 7 figure

Sparsity-Based Super Resolution for SEM Images

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.Comment: Final publication available at ACS Nano Letter