1,371 research outputs found
Doctor of Philosophy
dissertationPortable electronic devices will be limited to available energy of existing battery chemistries for the foreseeable future. However, system-on-chips (SoCs) used in these devices are under a demand to offer more functionality and increased battery life. A difficult problem in SoC design is providing energy-efficient communication between its components while maintaining the required performance. This dissertation introduces a novel energy-efficient network-on-chip (NoC) communication architecture. A NoC is used within complex SoCs due it its superior performance, energy usage, modularity, and scalability over traditional bus and point-to-point methods of connecting SoC components. This is the first academic research that combines asynchronous NoC circuits, a focus on energy-efficient design, and a software framework to customize a NoC for a particular SoC. Its key contribution is demonstrating that a simple, asynchronous NoC concept is a good match for low-power devices, and is a fruitful area for additional investigation. The proposed NoC is energy-efficient in several ways: simple switch and arbitration logic, low port radix, latch-based router buffering, a topology with the minimum number of 3-port routers, and the asynchronous advantages of zero dynamic power consumption while idle and the lack of a clock tree. The tool framework developed for this work uses novel methods to optimize the topology and router oorplan based on simulated annealing and force-directed movement. It studies link pipelining techniques that yield improved throughput in an energy-efficient manner. A simulator is automatically generated for each customized NoC, and its traffic generators use a self-similar message distribution, as opposed to Poisson, to better match application behavior. Compared to a conventional synchronous NoC, this design is superior by achieving comparable message latency with half the energy
Enhancing Power Efficient Design Techniques in Deep Submicron Era
Excessive power dissipation has been one of the major bottlenecks for design and
manufacture in the past couple of decades. Power efficient design has become
more and more challenging when technology scales down to the deep submicron era
that features the dominance of leakage, the manufacture variation, the on-chip
temperature variation and higher reliability requirements, among others. Most of the computer aided design (CAD) tools and algorithms currently used in industry
were developed in the pre deep submicron era and did not consider the new features explicitly and adequately.
Recent research advances in deep submicron design, such as the mechanisms of leakage, the source and characterization of manufacture variation, the cause and
models of on-chip temperature variation, provide us the opportunity to incorporate these important issues in power efficient design. We explore this opportunity in this dissertation by demonstrating that significant power reduction can be achieved with only minor modification to the existing CAD tools and algorithms.
First, we consider peak current, which has become critical for circuit's reliability in deep submicron design. Traditional low power design techniques focus on
the reduction of average power. We propose to reduce peak current while keeping the overhead on average power as small as possible. Second, dual Vt technique and gate sizing have been used simultaneously for leakage savings. However, this approach becomes less effective in deep submicron design. We propose to use the newly developed process-induced mechanical stress to enhance its performance.
Finally, in deep submicron design, the impact of on-chip temperature variation on leakage and performance becomes more and more significant. We propose a temperature-aware dual Vt approach to alleviate hot spots and achieve further leakage reduction. We also consider this leakage-temperature dependency in the dynamic voltage scaling approach and discover that a commonly accepted result is incorrect for the current technology.
We conduct extensive experiments with popular design benchmarks, using the latest industry CAD tools and design libraries. The results show that our proposed enhancements are promising in power saving and are practical to solve the low power design challenges in deep submicron era
Circuits and Systems Advances in Near Threshold Computing
Modern society is witnessing a sea change in ubiquitous computing, in which people have embraced computing systems as an indispensable part of day-to-day existence. Computation, storage, and communication abilities of smartphones, for example, have undergone monumental changes over the past decade. However, global emphasis on creating and sustaining green environments is leading to a rapid and ongoing proliferation of edge computing systems and applications. As a broad spectrum of healthcare, home, and transport applications shift to the edge of the network, near-threshold computing (NTC) is emerging as one of the promising low-power computing platforms. An NTC device sets its supply voltage close to its threshold voltage, dramatically reducing the energy consumption. Despite showing substantial promise in terms of energy efficiency, NTC is yet to see widescale commercial adoption. This is because circuits and systems operating with NTC suffer from several problems, including increased sensitivity to process variation, reliability problems, performance degradation, and security vulnerabilities, to name a few. To realize its potential, we need designs, techniques, and solutions to overcome these challenges associated with NTC circuits and systems. The readers of this book will be able to familiarize themselves with recent advances in electronics systems, focusing on near-threshold computing
Dynamic Voltage and Frequency Scaling for Wireless Network-on-Chip
Previously, research and design of Network-on-Chip (NoC) paradigms where mainly focused on improving the performance of the interconnection networks. With emerging wide range of low-power applications and energy constrained high-performance applications, it is highly desirable to have NoCs that are highly energy efficient without incurring performance penalty. In the design of high-performance massive multi-core chips, power and heat have become dominant constrains. Increased power consumption can raise chip temperature, which in turn can decrease chip reliability and performance and increase cooling costs.
It was proven that Small-world Wireless Network-on-Chip (SWNoC) architecture which replaces multi-hop wire-line path in a NoC by high-bandwidth single hop long range wireless links, reduces the overall energy dissipation when compared to wire-line mesh-based NoC architecture. However, the overall energy dissipation of the wireless NoC is still dominated by wire-line links and switches (buffers).
Dynamic Voltage Scaling is an efficient technique for significant power savings in microprocessors. It has been proposed and deployed in modern microprocessors by exploiting the variance in processor utilization. On a Network-on-Chip paradigm, it is more likely that the wire-line links and buffers are not always fully utilized even for different applications. Hence, by exploiting these characteristics of the links and buffers over different traffic, DVFS technique can be incorporated on these switches and wire-line links for huge power savings.
In this thesis, a history based DVFS mechanism is proposed. This mechanism uses the past utilization of the wire-line links & buffers to predict the future traffic and accordingly tune the voltage and frequency for the links and buffers dynamically for each time window. This mechanism dynamically minimizes the power consumption while substantially maintaining a high performance over the system. Performance analysis on these DVFS enabled Wireless NoC shows that, the overall energy dissipation is improved by around 40% when compared Small-world Wireless NoCs
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Ultra-Low Leakage, Energy-Efficient Digital Integrated Circuit and System Design
The advances of the complementary metal-oxide-semiconductor (CMOS) technology manufacturing and design over the years have enabled a diverse range of applications across the power consumption, performance, and area (PPA) spectra. Many of the recent and prospective applications rely on the availability of energy-autonomous, miniaturized systems, i.e., ultra-low power (ULP) VLSI systems, which are generally characterized by extreme resource limitations. Some examples of applications are wireless sensing platforms, body-area sensor networks (BASN), biomedical and implantable devices, wearables, hearables, and monitors. Within the context of such applications, the key requirements are long lifetime and miniaturized size (sub-/millimeter-scale). In order to enable both requirements, energy-efficiency is the key metric. It allows for extended battery lifetime and operation with the energy that can be harvested from the environment, and it limits the size (volume) of the energy sources utilized to power these systems.
Ultra-low voltage (ULV) operation is a key technique in which the VDD of circuits is reduced from nominal to near or below the threshold voltage of the transistor. It is a powerful knob that has been largely exploited by designers in order to achieve ultra-low power consumption and high energy-efficiency in CMOS. Existing ULP VLSI systems typically operate at a lower supply voltage thereby reducing their energy consumption by one to two orders of magnitude in order to enable the aforementioned applications.
While supply voltage scaling is a promising measure for achieving low power and reducing energy consumption, it brings up several challenges. One critical issue is the leakage energy dissipated by the devices, which is magnified in portion to the total energy consumption at ULV. The reason is that, as VDD scales from nominal to near-threshold and sub-threshold, transistors become increasingly slower and they accumulate more leakage (i.e., static) power over longer cycle times. This energy waste accounts for a significant portion of the system's total energy consumption, offsets the gains provided by voltage scaling, defines the minimum energy per operation, and poses a practical limit for the system's energy-efficiency.
This thesis presents selected research works on ultra-low leakage, energy-efficient digital integrated circuit design. More specifically, it describes novel and key techniques for minimizing the energy waste of idle/underutilized and always-on hardware. The main goal of such techniques is to push the envelope of energy-efficiency in energy-autonomous, miniaturized VLSI systems. Such techniques are applied to key building blocks of emerging mobile and embedded computing devices resulting in state-of-the-art energy-efficiencies
Vector processing-aware advanced clock-gating techniques for low-power fused multiply-add
The need for power efficiency is driving a rethink of design decisions in processor architectures. While vector processors succeeded in the high-performance market in the past, they need a retailoring for the mobile market that they are entering now. Floating-point (FP) fused multiply-add (FMA), being a functional unit with high power consumption, deserves special attention. Although clock gating is a well-known method to reduce switching power in synchronous designs, there are unexplored opportunities for its application to vector processors, especially when considering active operating mode. In this research, we comprehensively identify, propose, and evaluate the most suitable clock-gating techniques for vector FMA units (VFUs). These techniques ensure power savings without jeopardizing the timing. We evaluate the proposed techniques using both synthetic and “real-world” application-based benchmarking. Using vector masking and vector multilane-aware clock gating, we report power reductions of up to 52%, assuming active VFU operating at the peak performance. Among other findings, we observe that vector instruction-based clock-gating techniques achieve power savings for all vector FP instructions. Finally, when evaluating all techniques together, using “real-world” benchmarking, the power reductions are up to 80%. Additionally, in accordance with processor design trends, we perform this research in a fully parameterizable and automated fashion.The research leading to these results has received funding from the RoMoL ERC Advanced Grant GA 321253 and is supported in part by the European Union (FEDER funds) under contract TTIN2015-65316-P.
The work of I. Ratkovic was supported by a FPU research grant from the Spanish MECD.Peer ReviewedPostprint (author's final draft
Asynchronous Data Processing Platforms for Energy Efficiency, Performance, and Scalability
The global technology revolution is changing the integrated circuit industry from the one driven by performance to the one driven by energy, scalability and more-balanced design goals. Without clock-related issues, asynchronous circuits enable further design tradeoffs and in operation adaptive adjustments for energy efficiency. This dissertation work presents the design methodology of the asynchronous circuit using NULL Convention Logic (NCL) and multi-threshold CMOS techniques for energy efficiency and throughput optimization in digital signal processing circuits. Parallel homogeneous and heterogeneous platforms implementing adaptive dynamic voltage scaling (DVS) based on the observation of system fullness and workload prediction are developed for balanced control of the performance and energy efficiency. Datapath control logic with NULL Cycle Reduction (NCR) and arbitration network are incorporated in the heterogeneous platform for large scale cascading. The platforms have been integrated with the data processing units using the IBM 130 nm 8RF process and fabricated using the MITLL 90 nm FDSOI process. Simulation and physical testing results show the energy efficiency advantage of asynchronous designs and the effective of the adaptive DVS mechanism in balancing the energy and performance in both platforms
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MANAGING AND LEVERAGING VARIATIONS AND NOISE IN NANOMETER CMOS
Advanced CMOS technologies have enabled high density designs at the cost of complex fabrication process. Variation in oxide thickness and Random Dopant Fluctuation (RDF) lead to variation in transistor threshold voltage Vth. Current photo-lithography process used for printing decreasing critical dimensions result in variation in transistor channel length and width. A related challenge in nanometer CMOS is that of on-chip random noise. With decreasing threshold voltage and operating voltage; and increasing operating temperature, CMOS devices are more sensitive to random on-chip noise in advanced technologies.
In this thesis, we explore novel circuit techniques to manage the impact of process variation in nanometer CMOS technologies. We also analyze the impact of on-chip noise on CMOS circuits and propose techniques to leverage or manage impact of noise based on the application. True Random Number Generator (TRNG) is an interesting cryptographic primitive that leverages on-chip noise to generate random bits; however, it is highly sensitive to process variation. We explore novel metastability circuits to alleviate the impact of variations and at the same time leverage on-chip noise sources like Random Thermal Noise and Random Telegraph Noise (RTN) to generate high quality random bits. We develop stochastic models for metastability based TRNG circuits to analyze the impact of variation and noise. The stochastic models are used to analyze and compare low power, energy efficient and lightweight post-processing techniques targeted to low power applications like System on Chip (SoC) and RFID. We also propose variation aware circuit calibration techniques to increase reliability. We extended this technique to a more generic application of designing Post-Si Tunable (PST) clock buffers to increase parametric yield in the presence of process variation. Apart from one time variation due to fabrication process, transistors undergo constant change in threshold voltage due to aging/wear-out effects and RTN. Process variation affects conventional sensors and introduces inaccuracies during measurement. We present a lightweight wear-out sensor that is tolerant to process variation and provides a fine grained wear-out sensing. A similar circuit is designed to sense fluctuation in transistor threshold voltage due to RTN. Although thermal noise and RTN are leveraged in applications like TRNG, they affect the stability of sensitive circuits like Static Random Access Memory (SRAM). We analyze the impact of on-chip noise on Bit Error Rate (BER) and post-Si test coverage of SRAM cells
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