DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

A Survey on the Best Choice for Modulus of Residue Code

Nowadays, the development of technology and the growing need for dense and complex chips have led chip industries to increase their attention on the circuit testability. Also, using the electronic chips in certain industries, such as the space industry, makes the design of fault tolerant circuits a challenging issue. Coding is one of the most suitable methods for error detection and correction. The residue code, as one of the best choices for error detection aims, is wildly used in large arithmetic circuits such as multiplier and also finds a wide range of applications in processors and digital filters. The modulus value in this technique directly effect on the area overhead parameter. A large area overhead is one of the most important disadvantages especially for testing the small circuits. The purpose of this paper is to study and investigate the best choice for residue code check base that is used for simple and small circuits such as a simple ripple carry adder. The performances are evaluated by applying stuck-at-faults and transition-faults by simulators. The efficiency is defined based on fault coverage and normalized area overhead. The results show that the modulus 3 with 95% efficiency provided the best result. Residue code with this modulus for checking a ripple carry adder, in comparison with duplex circuit, 30% improves the efficiency

Reliable Low-Latency and Low-Complexity Viterbi Architectures Benchmarked on ASIC and FPGA

The Viterbi algorithm is commonly applied in a number of sensitive usage models including decoding convolutional codes used in communications such as satellite communication, cellular relay, and wireless local area networks. Moreover, the algorithm has been applied to automatic speech recognition and storage devices. In this thesis, efficient error detection schemes for architectures based on low-latency, low-complexity Viterbi decoders are presented. The merit of the proposed schemes is that reliability requirements, overhead tolerance, and performance degradation limits are embedded in the structures and can be adapted accordingly. We also present three variants of recomputing with encoded operands and its modifications to detect both transient and permanent faults, coupled with signature-based schemes. The instrumented decoder architecture has been subjected to extensive error detection assessments through simulations, and application-specific integrated circuit (ASIC) [32nm library] and field-programmable gate array (FPGA) [Xilinx Virtex-6 family] implementations for benchmark. The proposed fine-grained approaches can be utilized based on reliability objectives and performance/implementation metrics degradation tolerance

DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

Efficient modular arithmetic units for low power cryptographic applications

The demand for high security in energy constrained devices such as mobiles and PDAs is growing rapidly. This leads to the need for efficient design of cryptographic algorithms which offer data integrity, authentication, non-repudiation and confidentiality of the encrypted data and communication channels. The public key cryptography is an ideal choice for data integrity, authentication and non-repudiation whereas the private key cryptography ensures the confidentiality of the data transmitted. The latter has an extremely high encryption speed but it has certain limitations which make it unsuitable for use in certain applications. Numerous public key cryptographic algorithms are available in the literature which comprise modular arithmetic modules such as modular addition, multiplication, inversion and exponentiation. Recently, numerous cryptographic algorithms have been proposed based on modular arithmetic which are scalable, do word based operations and efficient in various aspects. The modular arithmetic modules play a crucial role in the overall performance of the cryptographic processor. Hence, better results can be obtained by designing efficient arithmetic modules such as modular addition, multiplication, exponentiation and squaring. This thesis is organized into three papers, describes the efficient implementation of modular arithmetic units, application of these modules in International Data Encryption Algorithm (IDEA). Second paper describes the IDEA algorithm implementation using the existing techniques and using the proposed efficient modular units. The third paper describes the fault tolerant design of a modular unit which has online self-checking capability --Abstract, page iv

Fault-tolerant sub-lithographic design with rollback recovery

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf = 10^-7) in systems with 10^12 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme

Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

DESIGN FOR TESTABILITY TECHNIQUES FOR VIDEO CODING SYSTEMS

Motion estimation algorithms are used in various video coding systems. While focusing on the testing of ME in a video coding system, this work presents an error detection and data recovery (EDDR) design, based on the residue-andquotient (RQ) code, to embed into ME for video coding testing applications. An error in processing elements (PEs), i.e. key components of a ME, can be detected and recovered effectively by using the proposed EDDR design. Therefore, paper describes a novel testing scheme of motion estimation. The key part of this scheme is to offer high reliability for motion estimation architecture. The experimental result shows the design achieve 100% fault coverage. And, the main advantages of this scheme are minimal performance degradation, small cost of hardware overhead and the benefit of at speed testing