3,983 research outputs found

    A framework for fine-grain synthesis optimization of operational amplifiers

    Get PDF
    This thesis presents a cell-level framework for Operational Amplifiers Synthesis (OASYN) coupling both circuit design and layout. For circuit design, the tool applies a corner-driven optimization, accounting for on-chip performance variations. By exploring the process, voltage, and temperature variations space, the tool extracts design worst case solution. The tool undergoes sensitivity analysis along with Pareto-optimality to achieve required specifications. For layout phase, OASYN generates a DRC proved automated layout based on a sized circuit-level description. Morata et al. (1996) introduced an elegant representation of block placement called sequence pair for general floorplans (SP). Like TCG and BSG, but unlike O-tree, B*tree, and CBL, SP is P-admissible. Unlike SP, TCG supports incremental update during operation and keeps the information of the boundary modules as well as their relative positions in the representation. Block placement algorithms that are based on SP use heuristic optimization algorithms, e.g., simulated annealing where generation of large number of sequence pairs are required. Therefore a fast algorithm is needed to generate sequence pairs after each solution perturbation. The thesis presents a new simple and efficient O(n) runtime algorithm for fast realization of incremental update for cost evaluation. The algorithm integrates sequence pair and transitive closure graph advantages into TCG-S* a superior topology update scheme which facilitates the search for optimum desired floorplan. Experiments show that TCG-S* is better than existing works in terms of area utilization and convergence speed. Routing-aware placement is implemented in OASYN, handling symmetry constraints, e.g., interdigitization, common centroid, along with congestion elimination and the enhancement of placement routability

    34th Midwest Symposium on Circuits and Systems-Final Program

    Get PDF
    Organized by the Naval Postgraduate School Monterey California. Cosponsored by the IEEE Circuits and Systems Society. Symposium Organizing Committee: General Chairman-Sherif Michael, Technical Program-Roberto Cristi, Publications-Michael Soderstrand, Special Sessions- Charles W. Therrien, Publicity: Jeffrey Burl, Finance: Ralph Hippenstiel, and Local Arrangements: Barbara Cristi

    VLSI Design

    Get PDF
    This book provides some recent advances in design nanometer VLSI chips. The selected topics try to present some open problems and challenges with important topics ranging from design tools, new post-silicon devices, GPU-based parallel computing, emerging 3D integration, and antenna design. The book consists of two parts, with chapters such as: VLSI design for multi-sensor smart systems on a chip, Three-dimensional integrated circuits design for thousand-core processors, Parallel symbolic analysis of large analog circuits on GPU platforms, Algorithms for CAD tools VLSI design, A multilevel memetic algorithm for large SAT-encoded problems, etc

    Analogue filter networks: developments in theory, design and analyses

    Get PDF
    Not availabl

    Learning Approaches to Analog and Mixed Signal Verification and Analysis

    Get PDF
    The increased integration and interaction of analog and digital components within a system has amplified the need for a fast, automated, combined analog, and digital verification methodology. There are many automated characterization, test, and verification methods used in practice for digital circuits, but analog and mixed signal circuits suffer from long simulation times brought on by transistor-level analysis. Due to the substantial amount of simulations required to properly characterize and verify an analog circuit, many undetected issues manifest themselves in the manufactured chips. Creating behavioral models, a circuit abstraction of analog components assists in reducing simulation time which allows for faster exploration of the design space. Traditionally, creating behavioral models for non-linear circuits is a manual process which relies heavily on design knowledge for proper parameter extraction and circuit abstraction. Manual modeling requires a high level of circuit knowledge and often fails to capture critical effects stemming from block interactions and second order device effects. For this reason, it is of interest to extract the models directly from the SPICE level descriptions so that these effects and interactions can be properly captured. As the devices are scaled, process variations have a more profound effect on the circuit behaviors and performances. Creating behavior models from the SPICE level descriptions, which include input parameters and a large process variation space, is a non-trivial task. In this dissertation, we focus on addressing various problems related to the design automation of analog and mixed signal circuits. Analog circuits are typically highly specialized and fined tuned to fit the desired specifications for any given system reducing the reusability of circuits from design to design. This hinders the advancement of automating various aspects of analog design, test, and layout. At the core of many automation techniques, simulations, or data collection are required. Unfortunately, for some complex analog circuits, a single simulation may take many days. This prohibits performing any type of behavior characterization or verification of the circuit. This leads us to the first fundamental problem with the automation of analog devices. How can we reduce the simulation cost while maintaining the robustness of transistor level simulations? As analog circuits can vary vastly from one design to the next and are hardly ever comprised of standard library based building blocks, the second fundamental question is how to create automated processes that are general enough to be applied to all or most circuit types? Finally, what circuit characteristics can we utilize to enhance the automation procedures? The objective of this dissertation is to explore these questions and provide suitable evidence that they can be answered. We begin by exploring machine learning techniques to model the design space using minimal simulation effort. Circuit partitioning is employed to reduce the complexity of the machine learning algorithms. Using the same partitioning algorithm we further explore the behavior characterization of analog circuits undergoing process variation. The circuit partitioning is general enough to be used by any CMOS based analog circuit. The ideas and learning gained from behavioral modeling during behavior characterization are used to improve the simulation through event propagation, input space search, complexity and information measurements. The reduction of the input space and behavioral modeling of low complexity, low information primitive elements reduces the simulation time of large analog and mixed signal circuits by 50-75%. The method is extended and applied to assist in analyzing analog circuit layout. All of the proposed methods are implemented on analog circuits ranging from small benchmark circuits to large, highly complex and specialized circuits. The proposed dependency based partitioning of large analog circuits in the time domain allows for fast identification of highly sensitive transistors as well as provides a natural division of circuit components. Modeling analog circuits in the time domain with this partitioning technique and SVM learning algorithms allows for very fast transient behavior predictions, three orders of magnitude faster than traditional simulators, while maintaining 95% accuracy. Analog verification can be explored through a reduction of simulation time by utilizing the partitions, information and complexity measures, and input space reduction. Behavioral models are created using supervised learning techniques for detected primitive elements. We will show the effectiveness of the method on four analog circuits where the simulation time is decreased by 55-75%. Utilizing the reduced simulation method, critical nodes can be found quickly and efficiently. The nodes found using this method match those found by an experienced layout engineer, but are detected automatically given the design and input specifications. The technique is further extended to find the tolerance of transistors to both process variation and power supply fluctuation. This information allows for corrections in layout overdesign or guidance in placing noise reducing components such as guard rings or decoupling capacitors. The proposed approaches significantly reduce the simulation time required to perform the tasks traditionally, maintain high accuracy, and can be automated

    A Holistic Approach to Functional Safety for Networked Cyber-Physical Systems

    Get PDF
    Functional safety is a significant concern in today's networked cyber-physical systems such as connected machines, autonomous vehicles, and intelligent environments. Simulation is a well-known methodology for the assessment of functional safety. Simulation models of networked cyber-physical systems are very heterogeneous relying on digital hardware, analog hardware, and network domains. Current functional safety assessment is mainly focused on digital hardware failures while minor attention is devoted to analog hardware and not at all to the interconnecting network. In this work we believe that in networked cyber-physical systems, the dependability must be verified not only for the nodes in isolation but also by taking into account their interaction through the communication channel. For this reason, this work proposes a holistic methodology for simulation-based safety assessment in which safety mechanisms are tested in a simulation environment reproducing the high-level behavior of digital hardware, analog hardware, and network communication. The methodology relies on three main automatic processes: 1) abstraction of analog models to transform them into system-level descriptions, 2) synthesis of network infrastructures to combine multiple cyber-physical systems, and 3) multi-domain fault injection in digital, analog, and network. Ultimately, the flow produces a homogeneous optimized description written in C++ for fast and reliable simulation which can have many applications. The focus of this thesis is performing extensive fault simulation and evaluating different functional safety metrics, \eg, fault and diagnostic coverage of all the safety mechanisms

    Circuit paradigm in the 21

    Get PDF
    reviewe

    Sensitivity Analysis and Distortion Decomposition of Mildly Nonlinear Circuits

    Get PDF
    Volterra Series (VS) is often used in the analysis of mildly nonlinear circuits. In this approach, nonlinear circuit analysis is converted into the analysis of a series of linear circuits. The main benefit of this approach is that linear circuit analysis is well established and direct frequency domain analysis of a nonlinear circuit becomes possible. Sensitivity analysis is useful in comparing the quality of two designs and the evaluation of gradient, Jacobian or Hessian matrices, in analog Computer Aided Design. This thesis presents, for the first time, the sensitivity analysis of mildly nonlinear circuits in the frequency domain as an extension of the VS approach. To overcome efficiency limitation due to multiple mixing effects, Nonlinear Transfer Matrix (NTM) is introduced. It is the first explicit analytical representation of the complicated multiple mixing effects. The application of NTM in sensitivity analysis is capable of two orders of magnitude speedup. Per-element distortion decomposition determines the contribution towards the total distortion from an individual nonlinearity. It is useful in design optimization, symbolic simplification and nonlinear model reduction. In this thesis, a numerical distortion decomposition technique is introduced which combines the insight of traditional symbolic analysis with the numerical advantages of SPICE like simulators. The use of NTM leads to an efficient implementation. The proposed method greatly extends the size of the circuit and the complexity of the transistor model over what previous approaches could handle. For example, industry standard compact model, such as BSIM3V3 [35] was used for the first time in distortion analysis. The decomposition can be achieved at device, transistor and block level, all with device level accuracy. The theories have been implemented in a computer program and validated on examples. The proposed methods will leverage the performance of present VS based distortion analysis to the next level
    corecore