Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems

RÉSUMÉ La croissance exponentielle du nombre de transistors par puce a apporté des progrès considérables aux performances et fonctionnalités des dispositifs semi-conducteurs avec une miniaturisation des dimensions physiques ainsi qu’une augmentation de vitesse. De nos jours, les appareils électroniques utilisés dans un large éventail d’applications telles que les systèmes de divertissement personnels, l’industrie automobile, les systèmes électroniques médicaux, et le secteur financier ont changé notre façon de vivre. Cependant, des études récentes ont démontré que le rétrécissement permanent de la taille des transistors qui s’approchent des dimensions nanométriques fait surgir des défis majeurs. La réduction de la fiabilité au sens large (c.-à-d., la capacité à fournir la fonction attendue) est l’un d’entre eux. Lorsqu’un système est conçu avec une technologie avancée, on s’attend à ce qu’ il connaît plus de défaillances dans sa durée de vie. De telles défaillances peuvent avoir des conséquences graves allant des pertes financières aux pertes humaines. Les erreurs douces induites par la radiation, qui sont apparues d’abord comme une source de panne plutôt exotique causant des anomalies dans les satellites, sont devenues l’un des problèmes les plus difficiles qui influencent la fiabilité des systèmes microélectroniques modernes, y compris les dispositifs terrestres. Dans le secteur médical par exemple, les erreurs douces ont été responsables de l’échec et du rappel de plusieurs stimulateurs cardiaques implantables. En fonction du transistor affecté lors de la fabrication, le passage d’une particule peut induire des perturbations isolées qui se manifestent comme un basculement du contenu d’une cellule de mémoire (c.-à-d., Single Event Upsets (SEU)) ou un changement temporaire de la sortie (sous forme de bruit) dans la logique combinatoire (c.-à-d., Single Event Transients (SETs)). Les SEU ont été largement étudiés au cours des trois dernières décennies, car ils étaient considérés comme la cause principale des erreurs douces. Néanmoins, des études expérimentales ont montré qu’avec plus de miniaturisation technologique, la contribution des SET au taux d’erreurs douces est remarquable et qu’elle peut même dépasser celui des SEU dans les systèmes à haute fréquence [1], [2]. Afin de minimiser l’impact des erreurs douces, l’effet des SET doit être modélisé, prédit et atténué. Toutefois, malgré les progrès considérables accomplis dans la vérification fonctionnelle des circuits numériques, il y a eu très peu de progrès en matiàre de vérification non-fonctionnelle (par exemple, l’analyse des erreurs douces). Ceci est dû au fait que la modélisation et l’analyse des propriétés non-fonctionnelles des SET pose un grand défi. Cela est lié à la nature aléatoire des défauts et à la difficulté de modéliser la variation de leurs caractéristiques lorsqu’ils se propagent.----------ABSTRACT The exponential growth in the number of transistors per chip brought tremendous progress in the performance and the functionality of semiconductor devices associated with reduced physical dimensions and higher speed. Electronic devices used in a wide range of applications such as personal entertainment systems, automotive industry, medical electronic systems, and financial sector changed the way we live nowadays. However, recent studies reveal that further downscaling of the transistor size at nano-scale technology leads to major challenges. Reliability (i.e., ability to provide intended functionality) is one of them, where a system designed in nano-scale nodes is expected to experience more failures in its lifetime than if it was designed using larger technology node size. Such failures can lead to serious conséquences ranging from financial losses to even loss of human life. Soft errors induced by radiation, which were initially considered as a rather exotic failure mechanism causing anomalies in satellites, have become one of the most challenging issues that impact the reliability of modern microelectronic systems, including devices at terrestrial altitudes. For instance, in the medical industry, soft errors have been responsible of the failure and recall of many implantable cardiac pacemakers. Depending on the affected transistor in the design, a particle strike can manifest as a bit flip in a state element (i.e., Single Event Upset (SEU)) or temporally change the output of a combinational gate (i.e., Single Event Transients (SETs)). Initially, SEUs have been widely studied over the last three decades as they were considered to be the main source of soft errors. However, recent experiments show that with further technology downscaling, the contribution of SETs to the overall soft error rate is remarkable and in high frequency systems, it might exceed that of SEUs [1], [2]. In order to minimize the impact of soft errors, the impact of SETs needs to be modeled, predicted, and mitigated. However, despite considerable progress towards developing efficient methodologies for the functional verification of digital designs, advances in non-functional verification (e.g., soft error analysis) have been lagging. This is due to the fact that the modeling and analysis of non-functional properties related to SETs is very challenging. This can be related to the random nature of these faults and the difficulty of modeling the variation in its characteristics while propagating. Moreover, many details about the design structure and the SETs characteristics may not be available at high abstraction levels. Thus, in high level analysis, many assumptions about the SETs behavior are usually made, which impacts the accuracy of the generated results. Consequently, the lowcost detection of soft errors due to SETs is very challenging and requires more sophisticated techniques

Fast and accurate SER estimation for large combinational blocks in early stages of the design

Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the increased vulnerability brought by technology scaling. This paper presents a methodology to estimate in early stages of the design the susceptibility of combinational circuits to particle strikes. In the core of the framework lies MASkIt , a novel approach that combines signal probabilities with technology characterization to swiftly compute the logical, electrical, and timing masking effects of the circuit under study taking into account all input combinations and pulse widths at once. Signal probabilities are estimated applying a new hybrid approach that integrates heuristics along with selective simulation of reconvergent subnetworks. The experimental results validate our proposed technique, showing a speedup of two orders of magnitude in comparison with traditional fault injection estimation with an average estimation error of 5 percent. Finally, we analyze the vulnerability of the Decoder, Scheduler, ALU, and FPU of an out-of-order, superscalar processor design.This work has been partially supported by the Spanish Ministry of Economy and Competitiveness and Feder Funds under grant TIN2013-44375-R, by the Generalitat de Catalunya under grant FI-DGR 2016, and by the FP7 program of the EU under contract FP7-611404 (CLERECO).Peer ReviewedPostprint (author's final draft

Advances and Technologies in High Voltage Power Systems Operation, Control, Protection and Security

The electrical demands in several countries around the world are increasing due to the huge energy requirements of prosperous economies and the human activities of modern life. In order to economically transfer electrical powers from the generation side to the demand side, these powers need to be transferred at high-voltage levels through suitable transmission systems and power substations. To this end, high-voltage transmission systems and power substations are in demand. Actually, they are at the heart of interconnected power systems, in which any faults might lead to unsuitable consequences, abnormal operation situations, security issues, and even power cuts and blackouts. In order to cope with the ever-increasing operation and control complexity and security in interconnected high-voltage power systems, new architectures, concepts, algorithms, and procedures are essential. This book aims to encourage researchers to address the technical issues and research gaps in high-voltage transmission systems and power substations in modern energy systems

A Review on Artificial Intelligence Applications for Grid-Connected Solar Photovoltaic Systems

The use of artificial intelligence (AI) is increasing in various sectors of photovoltaic (PV) systems, due to the increasing computational power, tools and data generation. The currently employed methods for various functions of the solar PV industry related to design, forecasting, control, and maintenance have been found to deliver relatively inaccurate results. Further, the use of AI to perform these tasks achieved a higher degree of accuracy and precision and is now a highly interesting topic. In this context, this paper aims to investigate how AI techniques impact the PV value chain. The investigation consists of mapping the currently available AI technologies, identifying possible future uses of AI, and also quantifying their advantages and disadvantages in regard to the conventional mechanisms

Cross-layer Soft Error Analysis and Mitigation at Nanoscale Technologies

This thesis addresses the challenge of soft error modeling and mitigation in nansoscale technology nodes and pushes the state-of-the-art forward by proposing novel modeling, analyze and mitigation techniques. The proposed soft error sensitivity analysis platform accurately models both error generation and propagation starting from a technology dependent device level simulations all the way to workload dependent application level analysis

High-Level Analysis of the Impact of Soft-Faults in Cyberphysical Systems

As digital systems grow in complexity and are used in a broader variety of safety-critical applications, there is an ever-increasing demand for assessing the dependability and safety of such systems, especially when subjected to hazardous environments. As a result, it is important to identify and correct any functional abnormalities and component faults as early as possible in order to minimize performance degradation and to avoid potential perilous situations. Existing techniques often lack the capacity to perform a comprehensive and exhaustive analysis on complex redundant architectures, leading to less than optimal risk evaluation. Hence, an early analysis of dependability of such safety-critical applications enables designers to develop systems that meets high dependability requirements. Existing techniques in the field often lack the capacity to perform full system analyses due to state-explosion limitations (such as transistor and gate-level analyses), or due to the time and monetary costs attached to them (such as simulation, emulation, and physical testing). In this work we develop a system-level methodology to model and analyze the effects of Single Event Upsets (SEUs) in cyberphysical system designs. The proposed methodology investigates the impacts of SEUs in the entire system model (fault tree level), including SEU propagation paths, logical masking of errors, vulnerability to specific events, and critical nodes. The methodology also provides insights on a system's weaknesses, such as the impact of each component to the system's vulnerability, as well as hidden sources of failure, such as latent faults. Moreover, the proposed methodology is able to identify and categorize the system's components in order of criticality, and to evaluate different approaches to the mitigation of such criticality (in the form of different configurations of TMR) in order to obtain the most efficient mitigation solution available. The proposed methodology is also able to model and analyze system components individually (system component level), in order to more accurately estimate the component's vulnerability to SEUs. In this case, a more refined analysis of the component is conducted, which enables us to identify the source of the component's criticality. Thereafter, a second mitigation mechanic (internal to the component) takes place, in order to evaluate the gains and costs of applying different configurations of TMR to the component internally. Finally, our approach will draw a comparison between the results obtained at both levels of analysis in order to evaluate the most efficient way of improving the targeted system design

Soft Error Analysis and Mitigation at High Abstraction Levels

Radiation-induced soft errors, as one of the major reliability challenges in future technology nodes, have to be carefully taken into consideration in the design space exploration. This thesis presents several novel and efficient techniques for soft error evaluation and mitigation at high abstract levels, i.e. from register transfer level up to behavioral algorithmic level. The effectiveness of proposed techniques is demonstrated with extensive synthesis experiments

Delta STATCOM with partially rated energy storage for intended provision of ancillary services

This thesis presents research on two distinct areas, where the work carried out in the first half highlights the challenges posed by the declining system inertia in the future power systems and the potential capability of the energy storage systems in bridging the gap, supporting a safe and reliable operation. A comparison of various energy storage technologies based on their specific energy, specific power, response time, life-cycle, efficiency, cost and further correlating these characteristics to the timescale requirements of frequency and RoCoF services showed that supercapacitors (SC) and Li-ion batteries present the most suitable candidates. Results of a network stability study showed that for a power system rated at 2940 MVA with a high RES contribution of 1688 MVA, equating to 57% of the energy mix, during a power imbalance of 200 MW, an ESS designed to provide emulated inertia response (EIR) in isolation required a power and energy rating of 39.54 MW and 0.0365 MWh respectively. Similarly, providing primary frequency response (PFR) on its own required a power and energy rating of 114.52 MW and 2.14 MWh respectively. ESS providing these services in isolation was not able to maintain all the frequency operating limits and similar results were also seen in the case of the recently introduced Dynamic Containment service. However, with the introduction of a combined response capability, a significantly improved performance, comparable to that of the synchronous generators was observed. In order to maintain the RoCoF and the statutory frequency limit of 0.5 Hz/s and ±0.5 Hz respectively, an ESS must be able to respond with a delay time of no more than 0.2 seconds and be able to ramp up to full response within 0.3 seconds (0.5 seconds from the start of contingency) for a frequency deviation of ±0.5 Hz. The second half of the thesis focused on investigating the current state-of-the-art power conversion system topologies, with the objective of identifying a suitable topology for interfacing ESSs to the grid at MV level. A delta-connected Modular Multilevel STATCOM with partially rated storage (PRS-STATCOM) is proposed, capable of providing both reactive and active power support. The purpose is to provide short-term energy storage enabled grid support services such as inertial and frequency response, either alongside or temporarily instead of standard STATCOM voltage support. The topology proposed here contains two types of sub-modules (SM) in each phase-leg: standard sub-modules (STD-SMs) and energy storage element sub-modules (ESE-SMs) with a DC-DC interface converter between the SM capacitor and the ESE. A control structure has been developed that allows energy transfer between the SM capacitor and the ESE, resulting in an active power exchange between the converter and the grid. A 3rd harmonic current injection into the converter waveforms was used to increase the amount of power that can be extracted from the ESE-SMs and so reduce the required ESE-SMs fraction in each phase-leg. Simulation results demonstrate that for three selected active power ratings, 1 pu, 2/3 pu, & 1/3 pu, the fraction of SMs that need to be converted to ESE-SMs are only 69%, 59% & 38%. Thus, the proposed topology is effective in adding real power capability to a STATCOM without a large increase in equipment cost. Furthermore, modifying the initially proposed topology with the use of Silicon Carbide (SiC) switching devices and interleaved DC-DC interface converter with inverse coupled inductors resulted in similar efficiencies when operated in STATCOM mode.Open Acces

False data injection attack detection in smart grid

Smart grid is a distributed and autonomous energy delivery infrastructure that constantly monitors the operational state of its overall network using smart techniques and state estimation. State estimation is a powerful technique that is used to determine the overall operational state of the system based on a limited set of measurements collected through metering systems. Cyber-attacks pose serious risks to a smart grid state estimation that can cause disruptions and power outages resulting in huge economical losses and are therefore a big concern to a reliable national grid operation. False data injection attacks (FDIAs), engineered on the basis of the knowledge of the network configuration, are difficult to detect using the traditional data detection mechanisms. These detection schemes have been found vulnerable and failed to detect these FDIAs. FDIAs specifically target the state data and can manipulate the state measurements in such a way that these false measurements appear real to the main control systems. This research work explores the possibility of FDIA detection using state estimation in a distributed and partitioned smart grid. In order to detect FDIAs we use measurements for residual-based testing which creates an objective function; and the probability of erroneous data is determined from this residual test. In this test, a preset threshold is determined based on the prior history of the state data. FDIA cases are simulated within a smart grid considering that the Chi-square detection state estimator fails in identifying such attacks. We compute the objective function using the standard weighted least problem and then test the objective function against the value in the Chi-square table. The gain matrix and the Jacobian matrix are computed. The state variables are computed in the form of a voltage magnitude. The state variables are computed after the inception of an attack to assess these state magnitude results. Different sizes of partitioning are used to improve the overall sensitivity of the Chi-square results. Our additional estimator is based on a Kalman estimation that consists of the state prediction and state correction steps. In the first step, it obtains the state and matrix covariance prediction, and in the second step, it calculates the Kalman gain and the state and matrix covariance update steps. The set of points is created for the state vector x at a time instant t. The initial vector and covariance matrix are based on a priori knowledge of the historical estimates. A set of sigma points is estimated by the state update function. Sigma points refer to the minimal set of sampling points that are selected and transformed using nonlinear function, and the new mean and the covariance are formed out of these transformed points. The idea behind this is that it is easier to compute a Gaussian distribution than an arbitrary nonlinear function. The filter gain, the mean and the covariance are used to estimate the next state. Our simulation results show that the combination of Kalman estimation and distributed state estimation improves the overall stability index and vulnerability assessment score of the smart grid. We built a stability index table for a smart grid based on the state estimates value after the inception of an FDIA. The vulnerability assessment score of the smart grid is based on common vulnerability scoring system (CVSS) and state estimates under the influence of an FDIA. The simulations are conducted in the MATPOWER program and different electrical bus systems such as IEEE 14, 30, 39, 118 and 300 are tested. All the contributions have been published in reputable journals and conferences.Doctor of Philosoph

Renewable Energy

Renewable Energy is energy generated from natural resources - such as sunlight, wind, rain, tides and geothermal heat - which are naturally replenished. In 2008, about 18% of global final energy consumption came from renewables, with 13% coming from traditional biomass, such as wood burning. Hydroelectricity was the next largest renewable source, providing 3% (15% of global electricity generation), followed by solar hot water/heating, which contributed with 1.3%. Modern technologies, such as geothermal energy, wind power, solar power, and ocean energy together provided some 0.8% of final energy consumption. The book provides a forum for dissemination and exchange of up - to - date scientific information on theoretical, generic and applied areas of knowledge. The topics deal with new devices and circuits for energy systems, photovoltaic and solar thermal, wind energy systems, tidal and wave energy, fuel cell systems, bio energy and geo-energy, sustainable energy resources and systems, energy storage systems, energy market management and economics, off-grid isolated energy systems, energy in transportation systems, energy resources for portable electronics, intelligent energy power transmission, distribution and inter - connectors, energy efficient utilization, environmental issues, energy harvesting, nanotechnology in energy, policy issues on renewable energy, building design, power electronics in energy conversion, new materials for energy resources, and RF and magnetic field energy devices