Efficient digital self-calibration of video-rate pipeline ADCs using white gaussian noise

Proceedings of IEEE, ISCAS 2003, Vol.I, pp. 877-880A digital-domain self-calibration technique for video-rate pipeline A/D converters based on a white Gaussian noise input signal is presented. The implementation of the proposed algorithm requires simple digital circuitv. An application design example of the self-calibration of a IZb. 40 MUS CMOSpipeline ADC is shown to illustrate that the overall linearity of the ADC can be highly improved using this technique

New simple digital self-calibration technique for pipeline ADCs using the internal thermal noise

IEEE International Symposium on Circuits and Systems, pp. 232 – 235, Seattle, EUAThis paper describes a new digital-domain selfcalibration technique for high-speed pipeline A/D converters using the internal thermal noise as input stimulus. This lowamplitude noise is amplified and recycled by the ADC itself and, due to the successive foldings, it is naturally converted into uniform noise. This noise is then used to calculate the required calibrating-codes. As an example, the calibration of a 13-bit pipeline ADC shows that the overall linearity can be significantly improved using this technique

Digital-domain self-calibration technique for video-rate pipeline A/D converters using Gaussian white noise

Electronics Letters Vol.38, nº 19A digital-domain selfsalibmtion technique for video-rate pipeline AID converters based an a Gaussian white noise input signal is presented. The pmposed algorithm is simple and efficient. A design example is shown 10 illustrate that the overall linemiry of a pipeline ADC can be highly improved using this technique

Pixels for focal-plane scale space generation and for high dynamic range imaging

Focal-plane processing allows for parallel processing throughout the entire pixel matrix, which can help increasing the speed of vision systems. The fabrication of circuits inside the pixel matrix increases the pixel pitch and reduces the fill factor, which leads to reduced image quality. To take advantage of the focal-plane processing capabilities and minimize image quality reduction, we first consider the inclusion of only two extra transistors in the pixel, allowing for scale space generation at the focal plane. We assess the conditions in which the proposed circuitry is advantageous. We perform a time and energy analysis of this approach in comparison to a digital solution. Considering that a SAR ADC per column is used and the clock frequency is equal to 5.6 MHz, the proposed analysis show that the focal-plane approach is 26 times faster if the digital solution uses 10 processing elements, and 49 times more energy-efficient. Another way of taking advantage of the focal-plane signal processing capability is by using focal-plane processing for increasing image quality itself, such as in the case of high dynamic range imaging pixels. This work also presents the design and study of a pixel that captures high dynamic range images by sensing the matrix average luminance, and then adjusting the integration time of each pixel according to the global average and to the local value of the pixel. This pixel was implemented considering small structural variations, such as different photodiode sizes for global average luminance measurement. Schematic and post-layout simulations were performed with the implemented pixel using an input image of 76 dB, presenting results with details in both dark and bright image areas.O processamento no plano focal de imageadores permite que a imagem capturada seja processada em paralelo por toda a matrix de pixels, característica que pode aumentar a velocidade de sistemas de visão. Ao fabricar circuitos dentro da matrix de pixels, o tamanho do pixel aumenta e a razão entre área fotossensível e a área total do pixel diminui, reduzindo a qualidade da imagem. Para utilizar as vantagens do processamento no plano focal e minimizar a redução da qualidade da imagem, a primeira parte da tese propõe a inclusão de dois transistores no pixel, o que permite que o espaço de escalas da imagem capturada seja gerado. Nós então avaliamos em quais condições o circuito proposto é vantajoso. Nós analisamos o tempo de processamento e o consumo de energia dessa proposta em comparação com uma solução digital. Utilizando um conversor de aproximações sucessivas com frequência de 5.6 MHz, a análise proposta mostra que a abordagem no plano focal é 26 vezes mais rápida que o circuito digital com 10 elementos de processamento, e consome 49 vezes menos energia. Outra maneira de utilizar processamento no plano focal consiste em aplicá-lo para melhorar a qualidade da imagem, como na captura de imagens em alta faixa dinâmica. Esta tese também apresenta o estudo e projeto de um pixel que realiza a captura de imagens em alta faixa dinâmica através do ajuste do tempo de integração de cada pixel utilizando a iluminação média e o valor do próprio pixel. Esse pixel foi projetado considerando pequenas variações estruturais, como diferentes tamanhos do fotodiodo que realiza a captura do valor de iluminação médio. Simulações de esquemático e pós-layout foram realizadas com o pixel projetado utilizando uma imagem com faixa dinâmica de 76 dB, apresentando resultados com detalhes tanto na parte clara como na parte escura da imagem

Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

All Digital, Background Calibration for Time-Interleaved and Successive Approximation Register Analog-to-Digital Converters

The growth of digital systems underscores the need to convert analog information to the digital domain at high speeds and with great accuracy. Analog-to-Digital Converter (ADC) calibration is often a limiting factor, requiring longer calibration times to achieve higher accuracy. The goal of this dissertation is to perform a fully digital background calibration using an arbitrary input signal for A/D converters. The work presented here adapts the cyclic Split-ADC calibration method to the time interleaved (TI) and successive approximation register (SAR) architectures. The TI architecture has three types of linear mismatch errors: offset, gain and aperture time delay. By correcting all three mismatch errors in the digital domain, each converter is capable of operating at the fastest speed allowed by the process technology. The total number of correction parameters required for calibration is dependent on the interleaving ratio, M. To adapt the Split-ADC method to a TI system, 2M+1 half-sized converters are required to estimate 3(2M+1) correction parameters. This thesis presents a 4:1 Split-TI converter that achieves full convergence in less than 400,000 samples. The SAR architecture employs a binary weight capacitor array to convert analog inputs into digital output codes. Mismatch in the capacitor weights results in non-linear distortion error. By adding redundant bits and dividing the array into individual unit capacitors, the Split-SAR method can estimate the mismatch and correct the digital output code. The results from this work show a reduction in the non-linear distortion with the ability to converge in less than 750,000 samples

Correlated level shifting as a power-saving method to reduce the effects of finite DC gain and signal swing in opamps

This thesis presents methods to reduce the effects of finite opamp DC gain, output voltage swing limitations in opamps, and component mismatches. The primary contribution of this thesis is a new switched-capacitor method named correlated level shifting (CLS). CLS enables true rail-to-rail operation by storing an estimate of the desired signal on a capacitor during an "estimate" phase, and subtracting the signal from the active circuitry (typically an opamp) during a "level shift" phase. This is done within the confines of a feedback loop. The effective loop-gain is the product of the loop-gains during the estimate and level shift phases. This enables, for example, a two-stage opamp to have the accuracy of a four-stage opamp. It also enables full utilization of the power supply since the gain block's output voltage can exceed the power supply. The thesis shows that the full utilization of the power supply and the increased DC effective loop gain leads to a significant power savings compared to existing techniques. The methods are presented in the context of pipelined analog-to-digital converters, although the methods can be used with other circuits that use opamps or are sensitive to component mismatch. An overview of the detrimental effects of reduced signal swing and low DC gain is given with an emphasis on the cost in power to correct these deficiencies when limited to existing circuit techniques. CLS is then shown to correct these deficiencies without increasing power. A detailed explanation of CLS operation is given, as are measured results from a 12-bit pipelined analog-to-digital converter that was fabricated using a 0.18μ CMOS process. The results include greater than 10-bit performance with true rail-to-rail operation. An overview of calibration is also given and the limitations are discussed. An argument is made that using CLS in addition to calibration will reduce power by increasing signal-to-noise ratio and reducing and linearizing the errors due to finite opamp gain. In addition, a method to reduce the effects of mismatch by measuring the relative size of elements is presented. Finally, several avenues for future research into CLS are given