Test Generation Based on CLP

Functional ATPGs based on simulation are fast, but generally, they are unable to cover corner cases, and they cannot prove untestability. On the contrary, functional ATPGs exploiting formal methods, being exhaustive, cover corner cases, but they tend to suffer of the state explosion problem when adopted for verifying large designs. In this context, we have defined a functional ATPG that relies on the joint use of pseudo-deterministic simulation and Constraint Logic Programming (CLP), to generate high-quality test sequences for solving complex problems. Thus, the advantages of both simulation-based and static-based verification techniques are preserved, while their respective drawbacks are limited. In particular, CLP, a form of constraint programming in which logic programming is extended to include concepts from constraint satisfaction, is well-suited to be jointly used with simulation. In fact, information learned during design exploration by simulation can be effectively exploited for guiding the search of a CLP solver towards DUV areas not covered yet. The test generation procedure relies on constraint logic programming (CLP) techniques in different phases of the test generation procedure. The ATPG framework is composed of three functional ATPG engines working on three different models of the same DUV: the hardware description language (HDL) model of the DUV, a set of concurrent EFSMs extracted from the HDL description, and a set of logic constraints modeling the EFSMs. The EFSM paradigm has been selected since it allows a compact representation of the DUV state space that limits the state explosion problem typical of more traditional FSMs. The first engine is randombased, the second is transition-oriented, while the last is fault-oriented. The test generation is guided by means of transition coverage and fault coverage. In particular, 100% transition coverage is desired as a necessary condition for fault detection, while the bit coverage functional fault model is used to evaluate the effectiveness of the generated test patterns by measuring the related fault coverage. A random engine is first used to explore the DUV state space by performing a simulation-based random walk. This allows us to quickly fire easy-to-traverse (ETT) transitions and, consequently, to quickly cover easy-to-detect (ETD) faults. However, the majority of hard-to-traverse (HTT) transitions remain, generally, uncovered. Thus, a transition-oriented engine is applied to cover the remaining HTT transitions by exploiting a learning/backjumping-based strategy. The ATPG works on a special kind of EFSM, called SSEFSM, whose transitions present the most uniformly distributed probability of being activated and can be effectively integrated to CLP, since it allows the ATPG to invoke the constraint solver when moving between EFSM states. A constraint logic programming-based (CLP) strategy is adopted to deterministically generate test vectors that satisfy the guard of the EFSM transitions selected to be traversed. Given a transition of the SSEFSM, the solver is required to generate opportune values for PIs that enable the SSEFSM to move across such a transition. Moreover, backjumping, also known as nonchronological backtracking, is a special kind of backtracking strategy which rollbacks from an unsuccessful situation directly to the cause of the failure. Thus, the transition-oriented engine deterministically backjumps to the source of failure when a transition, whose guard depends on previously set registers, cannot be traversed. Next it modifies the EFSM configuration to satisfy the condition on registers and successfully comes back to the target state to activate the transition. The transition-oriented engine generally allows us to achieve 100% transition coverage. However, 100% transition coverage does not guarantee to explore all DUV corner cases, thus some hard-to-detect (HTD) faults can escape detection preventing the achievement of 100% fault coverage. Therefore, the CLP-based fault-oriented engine is finally applied to focus on the remaining HTD faults. The CLP solver is used to deterministically search for sequences that propagate the HTD faults observed, but not detected, by the random and the transition-oriented engine. The fault-oriented engine needs a CLP-based representation of the DUV, and some searching functions to generate test sequences. The CLP-based representation is automatically derived from the S2EFSM models according to the defined rules, which follow the syntax of the ECLiPSe CLP solver. This is not a trivial task, since modeling the evolution in time of an EFSM by using logic constraints is really different with respect to model the same behavior by means of a traditional HW description language. At first, the concept of time steps is introduced, required to model the SSEFSM evolution through the time via CLP. Then, this study deals with modeling of logical variables and constraints to represent enabling functions and update functions of the SSEFSM. Formal tools that exhaustively search for a solution frequently run out of resources when the state space to be analyzed is too large. The same happens for the CLP solver, when it is asked to find a propagation sequence on large sequential designs. Therefore we have defined a set of strategies that allow to prune the search space and to manage the complexity problem for the solver

Testability Analysis of Synchronous Sequential Circuits Based On Structural Data

Bounds on test sequence length can be used as a testability measure. We give a procedure to compute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds

A Flip-Flop Matching Engine to Verify Sequential Optimizations

Equivalence checking tools often use a flip-flop matching step to avoid the state space traversal. Due to sequential optimizations performed during synthesis (merge, replication, redundancy removal, ...) and don't care conditions, the matching step can be very complex as well as incomplete. If the matching is incomplete, even the use of a fast and efficient SAT solver during the combinational equivalence-checking step may not prevent the failure of this approach. In this paper, we present a flip-flop matching engine, which is able to verify optimized circuits and handle don't care conditions

Automatic test pattern generation for asynchronous circuits

The testability of integrated circuits becomes worse with transistor dimensions reaching nanometer scales. Testing, the process of ensuring that circuits are fabricated without defects, becomes inevitably part of the design process; a technique called design for test (DFT). Asynchronous circuits have a number of desirable properties making them suitable for the challenges posed by modern technologies, but are severely limited by the unavailability of EDA tools for DFT and automatic test-pattern generation (ATPG). This thesis is motivated towards developing test generation methodologies for asynchronous circuits. In total four methods were developed which are aimed at two different fault models: stuck-at faults at the basic logic gate level and transistor-level faults. The methods were evaluated using a set of benchmark circuits and compared favorably to previously published work. First, ABALLAST is a partial-scan DFT method adapting the well-known BALLAST technique for asynchronous circuits where balanced structures are used to guide the selection of the state-holding elements that will be scanned. The test inputs are automatically provided by a novel test pattern generator, which uses time frame unrolling to deal with the remaining, non-scanned sequential C-elements. The second method, called AGLOB, uses algorithms from strongly-connected components in graph graph theory as a method for finding the optimal position of breaking the loops in the asynchronous circuit and adding scan registers. The corresponding ATPG method converts cyclic circuits into acyclic for which standard tools can provide test patterns. These patterns are then automatically converted for use in the original cyclic circuits. The third method, ASCP, employs a new cycle enumeration method to find the loops present in a circuit. Enumerated cycles are then processed using an efficient set covering heuristic to select the scan elements for the circuit to be tested.Applying these methods to the benchmark circuits shows an improvement in fault coverage compared to previous work, which, for some circuits, was substantial. As no single method consistently outperforms the others in all benchmarks, they are all valuable as a designer’s suite of tools for testing. Moreover, since they are all scan-based, they are compatible and thus can be simultaneously used in different parts of a larger circuit. In the final method, ATRANTE, the main motivation of developing ATPG is supplemented by transistor level test generation. It is developed for asynchronous circuits designed using a State Transition Graph (STG) as their specification. The transistor-level circuit faults are efficiently mapped onto faults that modify the original STG. For each potential STG fault, the ATPG tool provides a sequence of test vectors that expose the difference in behavior to the output ports. The fault coverage obtained was 52-72 % higher than the coverage obtained using the gate level tests. Overall, four different design for test (DFT) methods for automatic test pattern generation (ATPG) for asynchronous circuits at both gate and transistor level were introduced in this thesis. A circuit extraction method for representing the asynchronous circuits at a higher level of abstraction was also implemented. Developing new methods for the test generation of asynchronous circuits in this thesis facilitates the test generation for asynchronous designs using the CAD tools available for testing the synchronous designs. Lessons learned and the research questions raised due to this work will impact the future work to probe the possibilities of developing robust CAD tools for testing the future asynchronous designs

Synthesis for circuit reliability

textElectrical and Computer Engineerin

Doctor of Philosophy

dissertationFormal verification of hardware designs has become an essential component of the overall system design flow. The designs are generally modeled as finite state machines, on which property and equivalence checking problems are solved for verification. Reachability analysis forms the core of these techniques. However, increasing size and complexity of the circuits causes the state explosion problem. Abstraction is the key to tackling the scalability challenges. This dissertation presents new techniques for word-level abstraction with applications in sequential design verification. By bundling together k bit-level state-variables into one word-level constraint expression, the state-space is construed as solutions (variety) to a set of polynomial constraints (ideal), modeled over the finite (Galois) field of 2^k elements. Subsequently, techniques from algebraic geometry -- notably, Groebner basis theory and technology -- are researched to perform reachability analysis and verification of sequential circuits. This approach adds a "word-level dimension" to state-space abstraction and verification to make the process more efficient. While algebraic geometry provides powerful abstraction and reasoning capabilities, the algorithms exhibit high computational complexity. In the dissertation, we show that by analyzing the constraints, it is possible to obtain more insights about the polynomial ideals, which can be exploited to overcome the complexity. Using our algorithm design and implementations, we demonstrate how to perform reachability analysis of finite-state machines purely at the word level. Using this concept, we perform scalable verification of sequential arithmetic circuits. As contemporary approaches make use of resolution proofs and unsatisfiable cores for state-space abstraction, we introduce the algebraic geometry analog of unsatisfiable cores, and present algorithms to extract and refine unsatisfiable cores of polynomial ideals. Experiments are performed to demonstrate the efficacy of our approaches

Novel Computational Methods for Integrated Circuit Reverse Engineering

Production of Integrated Circuits (ICs) has been largely strengthened by globalization. System-on-chip providers are capable of utilizing many different providers which can be responsible for a single task. This horizontal structure drastically improves to time-to-market and reduces manufacturing cost. However, untrust of oversea foundries threatens to dismantle the complex economic model currently in place. Many Intellectual Property (IP) consumers become concerned over what potentially malicious or unspecified logic might reside within their application. This logic which is inserted with the intention of causing harm to a consumer has been referred to as a Hardware Trojan (HT). To help IP consumers, researchers have looked into methods for finding HTs. Such methods tend to rely on high-level information relating to the circuit, which might not be accessible. There is a high possibility that IP is delivered in the gate or layout level. Some services and image processing methods can be leveraged to convert layout level information to gate-level, but such formats are incompatible with detection schemes that require hardware description language. By leveraging standard graph and dynamic programming algorithms a set of tools is developed that can help bridge the gap between gate-level netlist access and HT detection. To help in this endeavor this dissertation focuses on several problems associated with reverse engineering ICs. Logic signal identification is used to find malicious signals, and logic desynthesis is used to extract high level details. Each of the proposed method have their results analyzed for accuracy and runtime. It is found that method for finding logic tends to be the most difficult task, in part due to the degree of heuristic\u27s inaccuracy. With minor improvements moderate sized ICs could have their high-level function recovered within minutes, which would allow for a trained eye or automated methods to more easily detect discrepancies within a circuit\u27s design