Accessing on-chip temperature health monitors using the IEEE 1687 standard

The IEEE 1687 (IJTAG) is a newly IEEE approved standard to access embedded instruments. The usage of these embedded instruments (health monitors) is increasing in order to perform different online measurements for testing purposes as dependability is becoming a key concern in today’s electronics. Aging and intermittent resistive faults (IRF) are two threats to a highly dependable system, and temperature can accelerate these two phenomena. In this paper, the work carried out for enabling online IJTAG control, observation and reconfiguration of the health monitors will be discussed. Three temperature monitors along with an IJTAG controller are used to demonstrate online temperature measurements using an IJTAG network interface. The simulation results show that the proposed (on-chip)methodology can reduce the dependency on the PC while observing the (static) embedded instruments in the field

Securing IEEE P1687 On-chip Instrumentation Access Using PUF

As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip designs increases at an exponential rate. Such structures serve various purposes throughout the life-cycle of VLSI circuits, e.g. in post-silicon validation and debug, production test and diagnosis, as well as during in-field test and maintenance. Reliable access mechanisms for embedded instruments are therefore key to rapid chip development and secure system maintenance. Reconfigurable scan networks defined by IEEE Std. P1687 emerge as a scalable and cost-effective access medium for on-chip instrumentation. The accessibility offered by reconfigurable scan networks contradicts security and safety requirements for embedded instrumentation. Embedded instrumentation is an integral system component that remains functional throughout the lifetime of a chip. To prevent harmful activities, such as tampering with safety-critical systems, and reduce the risk of intellectual property infringement, the access to embedded instrumentation requires protection. This thesis provides a novel, Physical Unclonable Function (PUF) based secure access method for on-chip instruments which enhances the security of IJTAG network at low hardware cost and with less routing congestion

A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring

Efficient handling of faults during operation is highly dependent on the interval (latency) from the time embedded instruments detect errors to the time when the fault manager localizes the errors. In this paper, we propose a self-reconfiguring IEEE 1687 network in which all instruments that have detected errors are automatically included in the scan path. To enable self-reconfiguration, we propose a modified segment insertion bit (SIB) compliant to IEEE 1687. We provide time analyses on error detection and fault localization for single and multiple faults, and we suggest how the self-reconfiguring IEEE 1687 network should be designed such that time for error detection and fault localization is kept low and deterministic. For validation, we implemented and performed post-layout simulations for one self-reconfiguring network. We show that compared to previous schemes, our proposed network significantly reduces the fault localization time

A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks

With the complexity of nanoelectronic devices rapidly increasing, an efficient way to handle large number of embedded instruments became a necessity. The IEEE 1687 standard was introduced to provide flexibility in accessing and controlling such instrumentation through a reconfigurable scan chain. Nowadays, together with testing the system for defects that may affect the scan chains themselves, the diagnosis of such faults is also important. This article proposes a method for generating stimuli to precisely identify permanent high-level faults in a IEEE 1687 reconfigurable scan chain: the system is modeled as a finite state automaton where faults correspond to multiple incorrect transitions; then, a dynamic greedy algorithm is used to select a sequence of inputs able to distinguish between all possible faults. Experimental results on the widely-adopted ITC'02 and ITC'16 benchmark suites, as well as on synthetically generated circuits, clearly demonstrate the applicability and effectiveness of the proposed approach: generated sequences are two orders of magnitude shorter compared to previous methodologies, while the computational resources required remain acceptable even for larger benchmarks

Synergizing Roadway Infrastructure Investment with Digital Infrastructure for Infrastructure-Based Connected Vehicle Applications: Review of Current Status and Future Directions

The file attached to this record is the author's final peer reviewed version. The Publisher's final version can be found by following the DOI link.The safety, mobility, environmental and economic benefits of Connected and Autonomous Vehicles (CAVs) are potentially dramatic. However, realization of these benefits largely hinges on the timely upgrading of the existing transportation system. CAVs must be enabled to send and receive data to and from other vehicles and drivers (V2V communication) and to and from infrastructure (V2I communication). Further, infrastructure and the transportation agencies that manage it must be able to collect, process, distribute and archive these data quickly, reliably, and securely. This paper focuses on current digital roadway infrastructure initiatives and highlights the importance of including digital infrastructure investment alongside more traditional infrastructure investment to keep up with the auto industry's push towards this real time communication and data processing capability. Agencies responsible for transportation infrastructure construction and management must collaborate, establishing national and international platforms to guide the planning, deployment and management of digital infrastructure in their jurisdictions. This will help create standardized interoperable national and international systems so that CAV technology is not deployed in a haphazard and uncoordinated manner

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

DETECTION AND REMOVAL OF DUST PARTICLES IN PIPELINES USING 3-D MEMS

Currently, the detection of dust particles is realized through manual sampling. Thus it is desirable to develop an automated online technique. Generally, industries run with the help of pipelines through which liquid can flow. The main aim of the work is to detect the dust particles which are present inside the pipeline when liquid is flowing through it. Distributed Acoustic Sensing (DAS) is a recent addition to the pipeline security world. Opta sense system is designed to prevent the damage in pipeline by providing the advance warning to the concern department and make them alert. The dust particles are detected by using MEMS, which can sense in three axis (Heat, Vibration, Movement). It is identified by the IR sensor. The approach can also be simulated by using MATLAB

A dependable anisotropic magnetoresistance sensor system for automotive applications

The increasing usage of electronic systems in automotive applications aims to enhance passenger safety as well as the performance of the cars. In modern vehicles, the mechanical and hydraulic systems traditionally used have been replaced by X-by-wire systems in which the functions are performed by electronic components. However, the components required should be reliable, have a high-performance, low-cost and capable of operating for a long time in a highly dependable manner despite the harsh operating conditions in automotive applications. Dependability represents the reliance that a user justifiably poses on the service offered by a system, being this especially important in safety-critical applications in which a failure can constitute a threat to people or the environment. An Anisotropic Magnetoresistance (AMR) sensor is a type of magnetic sensor often used for angle measurements in cars. This sensor is affected by performance degradation and catastrophic faults that in principle cause the sensor to stop working suddenly. Therefore, the sensor dependability should be improved in order to guarantee that it will satisfy the continuous increasing dependability as well as accuracy requirements demanded by automotive applications. This research proposes an AMR sensor system that includes a fault-tolerant approach to handle catastrophic faults and self-X properties to maintain the performance of the sensor during its lifetime. Additionally, an interface with the IEEE 1687 standard has been considered, so the sensor is able to communicate with other components of the system in which it is integrated