Cost modelling and concurrent engineering for testable design

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.As integrated circuits and printed circuit boards increase in complexity, testing becomes a major cost factor of the design and production of the complex devices. Testability has to be considered during the design of complex electronic systems, and automatic test systems have to be used in order to facilitate the test. This fact is now widely accepted in industry. Both design for testability and the usage of automatic test systems aim at reducing the cost of production testing or, sometimes, making it possible at all. Many design for testability methods and test systems are available which can be configured into a production test strategy, in order to achieve high quality of the final product. The designer has to select from the various options for creating a test strategy, by maximising the quality and minimising the total cost for the electronic system. This thesis presents a methodology for test strategy generation which is based on consideration of the economics during the life cycle of the electronic system. This methodology is a concurrent engineering approach which takes into account all effects of a test strategy on the electronic system during its life cycle by evaluating its related cost. This objective methodology is used in an original test strategy planning advisory system, which allows for test strategy planning for VLSI circuits as well as for digital electronic systems. The cost models which are used for evaluating the economics of test strategies are described in detail and the test strategy planning system is presented. A methodology for making decisions which are based on estimated costing data is presented. Results of using the cost models and the test strategy planning system for evaluating the economics of test strategies for selected industrial designs are presented

Constraint-driven RF test stimulus generation and built-in test

With the explosive growth in wireless applications, the last decade witnessed an ever-increasing test challenge for radio frequency (RF) circuits. While the design community has pushed the envelope far into the future, by expanding CMOS process to be used with high-frequency wireless devices, test methodology has not advanced at the same pace. Consequently, testing such devices has become a major bottleneck in high-volume production, further driven by the growing need for tighter quality control. RF devices undergo testing during the prototype phase and during high-volume manufacturing (HVM). The benchtop test equipment used throughout prototyping is very precise yet specialized for a subset of functionalities. HVM calls for a different kind of test paradigm that emphasizes throughput and sufficiency, during which the projected performance parameters are measured one by one for each device by automated test equipment (ATE) and compared against defined limits called specifications. The set of tests required for each product differs greatly in terms of the equipment required and the time taken to test individual devices. Together with signal integrity, precision, and repeatability concerns, the initial cost of RF ATE is prohibitively high. As more functionality and protocols are integrated into a single RF device, the required number of specifications to be tested also increases, adding to the overall cost of testing, both in terms of the initial and recurring operating costs. In addition to the cost problem, RF testing proposes another challenge when these components are integrated into package-level system solutions. In systems-on-packages (SOP), the test problems resulting from signal integrity, input/output bandwidth (IO), and limited controllability and observability have initiated a paradigm shift in high-speed analog testing, favoring alternative approaches such as built-in tests (BIT) where the test functionality is brought into the package. This scheme can make use of a low-cost external tester connected through a low-bandwidth link in order to perform demanding response evaluations, as well as make use of the analog-to-digital converters and the digital signal processors available in the package to facilitate testing. Although research on analog built-in test has demonstrated hardware solutions for single specifications, the paradigm shift calls for a rather general approach in which a single methodology can be applied across different devices, and multiple specifications can be verified through a single test hardware unit, minimizing the area overhead. Specification-based alternate test methodology provides a suitable and flexible platform for handling the challenges addressed above. In this thesis, a framework that integrates ATE and system constraints into test stimulus generation and test response extraction is presented for the efficient production testing of high-performance RF devices using specification-based alternate tests. The main components of the presented framework are as follows: Constraint-driven RF alternate test stimulus generation: An automated test stimulus generation algorithm for RF devices that are evaluated by a specification-based alternate test solution is developed. The high-level models of the test signal path define constraints in the search space of the optimized test stimulus. These models are generated in enough detail such that they inherently define limitations of the low-cost ATE and the I/O restrictions of the device under test (DUT), yet they are simple enough that the non-linear optimization problem can be solved empirically in a reasonable amount of time. Feature extractors for BIT: A methodology for the built-in testing of RF devices integrated into SOPs is developed using additional hardware components. These hardware components correlate the high-bandwidth test response to low bandwidth signatures while extracting the test-critical features of the DUT. Supervised learning is used to map these extracted features, which otherwise are too complicated to decipher by plain mathematical analysis, into the specifications under test. Defect-based alternate testing of RF circuits: A methodology for the efficient testing of RF devices with low-cost defect-based alternate tests is developed. The signature of the DUT is probabilistically compared with a class of defect-free device signatures to explore possible corners under acceptable levels of process parameter variations. Such a defect filter applies discrimination rules generated by a supervised classifier and eliminates the need for a library of possible catastrophic defects.Ph.D.Committee Chair: Chatterjee, Abhijit; Committee Member: Durgin, Greg; Committee Member: Keezer, David; Committee Member: Milor, Linda; Committee Member: Sitaraman, Sures

Doctor of Philosophy

dissertationPortable electronic devices will be limited to available energy of existing battery chemistries for the foreseeable future. However, system-on-chips (SoCs) used in these devices are under a demand to offer more functionality and increased battery life. A difficult problem in SoC design is providing energy-efficient communication between its components while maintaining the required performance. This dissertation introduces a novel energy-efficient network-on-chip (NoC) communication architecture. A NoC is used within complex SoCs due it its superior performance, energy usage, modularity, and scalability over traditional bus and point-to-point methods of connecting SoC components. This is the first academic research that combines asynchronous NoC circuits, a focus on energy-efficient design, and a software framework to customize a NoC for a particular SoC. Its key contribution is demonstrating that a simple, asynchronous NoC concept is a good match for low-power devices, and is a fruitful area for additional investigation. The proposed NoC is energy-efficient in several ways: simple switch and arbitration logic, low port radix, latch-based router buffering, a topology with the minimum number of 3-port routers, and the asynchronous advantages of zero dynamic power consumption while idle and the lack of a clock tree. The tool framework developed for this work uses novel methods to optimize the topology and router oorplan based on simulated annealing and force-directed movement. It studies link pipelining techniques that yield improved throughput in an energy-efficient manner. A simulator is automatically generated for each customized NoC, and its traffic generators use a self-similar message distribution, as opposed to Poisson, to better match application behavior. Compared to a conventional synchronous NoC, this design is superior by achieving comparable message latency with half the energy

Advancing automation and robotics technology for the Space Station and for the US economy, volume 2

In response to Public Law 98-371, dated July 18, 1984, the NASA Advanced Technology Advisory Committee has studied automation and robotics for use in the Space Station. The Technical Report, Volume 2, provides background information on automation and robotics technologies and their potential and documents: the relevant aspects of Space Station design; representative examples of automation and robotics; applications; the state of the technology and advances needed; and considerations for technology transfer to U.S. industry and for space commercialization

Just-in-time Hardware generation for abstracted reconfigurable computing

This thesis addresses the use of reconfigurable hardware in computing platforms, in order to harness the performance benefits of dedicated hardware whilst maintaining the flexibility associated with software. Although the reconfigurable computing concept is not new, the low level nature of the supporting tools normally used, together with the consequent limited level of abstraction and resultant lack of backwards compatibility, has prevented the widespread adoption of this technology. In addition, bandwidth and architectural limitations, have seriously constrained the potential improvements in performance. A review of existing approaches and tools flows is conducted to highlight the current problems being faced in this field. The objective of the work presented in this thesis is to introduce a radically new approach to reconfigurable computing tool flows. The runtime based tool flow introduces complete abstraction between the application developer and the underlying hardware. This new technique eliminates the ease of use and backwards compatibility issues that have plagued the reconfigurable computing concept, and could pave the way for viable mainstream reconfigurable computing platforms. An easy to use, cycle accurate behavioural modelling system is also presented, which was used extensively during the early exploration of new concepts and architectures. Some performance improvements produced by the new reconfigurable computing tool flow, when applied to both a MIPS based embedded platform, and the Cray XDl, are also presented. These results are then analyzed and the hardware and software factors affecting the performance increases that were obtained are discussed, together with potential techniques that could be used to further increase the performance of the system. Lastly a heterogenous computing concept is proposed, in which, a computer system, containing multiple types of computational resource is envisaged, each having their own strengths and weaknesses (e.g. DSPs, CPUs, FPGAs). A revolutionary new method of fully exploiting the potential of such a system, whilst maintaining scalability, backwards compatibility, and ease of use is also presented

Investigations carried out under the Director's Discretionary Fund

This annual report comprises a set of summaries, describing task objectives, progress and results or accomplishments, future outlook, and financial status for each director's discretionary fund (DDF) task that was active during fiscal year 1984. Publications and conference presentations related to the work are listed. The individual reports are categorized as interim or final according to whether the task efforts are ongoing or completed. A partial list of new tasks to be initiated with fiscal year 1985 funds and a glossary of abbreviations and acronyms, used by the task authors in their summaries are included. The table of contents lists the DDF reports in sequence by their task number, which is derived from the 13-digit code assigned to account for the fund awarded to the task project