내장형 프로세서에서의 코드 크기 최적화를 위한 아키텍처 설계 및 컴파일러 지원

학위논문 (박사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2014. 2. 백윤흥.Embedded processors usually need to satisfy very tight design constraints to achieve low power consumption, small chip area, and high performance. One of the obstacles to meeting these requirements is related to delivering instructions from instruction memory/caches. The size of instruction memory/cache considerably contributes total chip area. Further, frequent access to caches incurs high power/energy consumption and significantly hampers overall system performance due to cache misses. To reduce the negative effects of the instruction delivery, therefore, this study focuses on the sizing of instruction memory/cache through code size optimization. One observation for code size optimization is that very long instruction word (VLIW) architectures often consume more power and memory space than necessary due to long instruction bit-width. One way to lessen this problem is to adopt a reduced bit-width ISA (Instruction Set Architecture) that has a narrower instruction word length. In practice, however, it is impossible to convert a given ISA fully into an equivalent reduced bit-width one because the narrow instruction word, due to bitwidth restrictions, can encode only a small subset of normal instructions in the original ISA. To explore the possibility of complete conversion of an existing 32-bit ISA into a 16-bit one that supports effectively all 32-bit instructions, we propose the reduced bit-width (e.g. 16-bit × 4-way) VLIW architectures that equivalently behave as their original bit-width (e.g. 32-bit × 4-way) architectures with the help of dynamic implied addressing mode (DIAM). Second, we observe that code duplication techniques have been proposed to increase the reliability against soft errors in multi-issue embedded systems such as VLIW by exploiting empty slots for duplicated instructions. Unfortunately, all duplicated instructions cannot be allocated to empty slots, which enforces generating additional VLIW packets to include the duplicated instructions. The increase of code size due to the extra VLIW packets is necessarily accompanied with the enhanced reliability. In order to minimize code size, we propose a novel approach compiler-assisted dynamic code duplication scheme, which accepts an assembly code composed of only original instructions as input, and generates duplicated instructions at runtime with the help of encoded information attached to original instructions. Since the duplicates of original instructions are not explicitly present in the assembly code, the increase of code size due to the duplicated instructions can be avoided in the proposed scheme. Lastly, the third observation is that, to cope with soft errors similarly to the second observation, a recently proposed software-based technique with TMR (Triple Modular Redundancy) implemented on coarse-grained reconfigurable architectures (CGRA) incurs the increase of configuration size, which is corresponding to the code size of CGRA, and thus extreme overheads in terms of runtime and energy consumption mainly due to expensive voting mechanisms for the outputs from the triplication of every operation. To reduce the expensive performance overhead due to the large configuration from the validation mechanism, we propose selective validation mechanisms for efficient modular redundancy techniques in the datapath on CGRA. The proposed techniques selectively validate the results at synchronous operations rather than every operation.Abstract i Chapter 1 Introduction 1 1.1 Instruction Delivery . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1.2 The causes of code size increase . . . . . . . . . . . . . . . . . . . . 2 1.2.1 Instruction Bit-width in VLIW Architectures . . . . . . . . . 2 1.2.2 Instruction Redundancy . . . . . . . . . . . . . . . . . . . . 3 Chapter 2 Reducing Instruction Bit-width with Dynamic Implied Addressing Mode (DIAM) 7 2.1 Conceptual View . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 2.2 Architecture Design . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 2.2.1 ISA Design . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 2.2.2 Remote Operand Array Buffer . . . . . . . . . . . . . . . . . 15 2.2.3 Microarchitecture . . . . . . . . . . . . . . . . . . . . . . . . 17 2.3 Compiler Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 2.3.1 16-bit Instruction Generation . . . . . . . . . . . . . . . . . . 24 2.3.2 DDG Construction & Scheduling . . . . . . . . . . . . . . . 26 2.4 VLES(Variable Length Execution Set) Architecture with a Reduced Bit-width Instruction Set . . . . . . . . . . . . . . . . . . . . . . . . 29 2.4.1 Architecture Design . . . . . . . . . . . . . . . . . . . . . . 30 2.4.2 Compiler Support . . . . . . . . . . . . . . . . . . . . . . . . 34 2.5 Experiments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 2.5.1 Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 2.5.2 Results . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 2.5.3 Sensitivity Analysis . . . . . . . . . . . . . . . . . . . . . . 48 2.6 Related Work . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49 Chapter 3 Compiler-assisted Dynamic Code Duplication Scheme for Soft Error Resilient VLIW Architectures 53 3.1 Related Work . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54 3.2 Compiler-assisted Dynamic Code Duplication . . . . . . . . . . . . . 58 3.2.1 ISA Design . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 3.2.2 Modified Fetch Stage . . . . . . . . . . . . . . . . . . . . . . 62 3.3 Compilation Techniques . . . . . . . . . . . . . . . . . . . . . . . . 66 3.3.1 Static Code Duplication Algorithm . . . . . . . . . . . . . . 67 3.3.2 Vulnerability-aware Duplication Algorithm . . . . . . . . . . 68 3.4 Experiments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 71 3.4.1 Experimental Setup . . . . . . . . . . . . . . . . . . . . . . . 71 3.4.2 Effectiveness of Compiler-assisted Dynamic Code Duplication 73 3.4.3 Effectiveness of Vulnerability-aware Duplication Algorithm . 77 Chapter 4 Selective Validation Techniques for Robust CGRAs against Soft Errors 85 4.1 Related Works . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86 4.2 Motivation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88 4.3 Our Approach . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91 4.3.1 Selective Validation Mechanism . . . . . . . . . . . . . . . . 91 4.3.2 Compilation Flow and Performance Analysis . . . . . . . . . 92 4.3.3 Fault Coverage Analysis . . . . . . . . . . . . . . . . . . . . 96 4.3.4 Our Optimization - Minimizing Store Operation . . . . . . . . 97 4.4 Experiments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99 4.4.1 Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 99 4.4.2 Experimental Results . . . . . . . . . . . . . . . . . . . . . . 100 Chapter 5 Conculsion 110 초록 122Docto

DeSyRe: on-Demand System Reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect and fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints

Conception de systèmes embarqués fiables et auto-réglables : applications sur les systèmes de transport ferroviaire

During the last few decades, a tremendous progress in the performance of semiconductor devices has been accomplished. In this emerging era of high performance applications, machines need not only to be efficient but also need to be dependable at circuit and system levels. Several works have been proposed to increase embedded systems efficiency by reducing the gap between software flexibility and hardware high-performance. Due to their reconfigurable aspect, Field Programmable Gate Arrays (FPGAs) represented a relevant step towards bridging this performance/flexibility gap. Nevertheless, Dynamic Reconfiguration (DR) has been continuously suffering from a bottleneck corresponding to a long reconfiguration time.In this thesis, we propose a novel medium-grained high-speed dynamic reconfiguration technique for DSP48E1-based circuits. The idea is to take advantage of the DSP48E1 slices runtime reprogrammability coupled with a re-routable interconnection block to change the overall circuit functionality in one clock cycle. In addition to the embedded systems efficiency, this thesis deals with the reliability chanllenges in new sub-micron electronic systems. In fact, as new technologies rely on reduced transistor size and lower supply voltages to improve performance, electronic circuits are becoming remarkably sensitive and increasingly susceptible to transient errors. The system-level impact of these errors can be far-reaching and Single Event Transients (SETs) have become a serious threat to embedded systems reliability, especially for especially for safety critical applications such as transportation systems. The reliability enhancement techniques that are based on overestimated soft error rates (SERs) can lead to unnecessary resource overheads as well as high power consumption. Considering error masking phenomena is a fundamental element for an accurate estimation of SERs.This thesis proposes a new cross-layer model of circuits vulnerability based on a combined modeling of Transistor Level (TLM) and System Level Masking (SLM) mechanisms. We then use this model to build a self adaptive fault tolerant architecture that evaluates the circuit’s effective vulnerability at runtime. Accordingly, the reliability enhancement strategy is adapted to protect only vulnerable parts of the system leading to a reliable circuit with optimized overheads. Experimentations performed on a radar-based obstacle detection system for railway transportation show that the proposed approach allows relevant reliability/resource utilization tradeoffs.Un énorme progrès dans les performances des semiconducteurs a été accompli ces dernières années. Avec l’´émergence d’applications complexes, les systèmes embarqués doivent être à la fois performants et fiables. Une multitude de travaux ont été proposés pour améliorer l’efficacité des systèmes embarqués en réduisant le décalage entre la flexibilité des solutions logicielles et la haute performance des solutions matérielles. En vertu de leur nature reconfigurable, les FPGAs (Field Programmable Gate Arrays) représentent un pas considérable pour réduire ce décalage performance/flexibilité. Cependant, la reconfiguration dynamique a toujours souffert d’une limitation liée à la latence de reconfiguration.Dans cette thèse, une nouvelle technique de reconfiguration dynamiqueau niveau ”grain-moyen” pour les circuits à base de blocks DSP48E1 est proposée. L’idée est de profiter de la reprogrammabilité des blocks DSP48E1 couplée avec un circuit d’interconnection reconfigurable afin de changer la fonction implémentée par le circuit en un cycle horloge. D’autre part, comme les nouvelles technologies s’appuient sur la réduction des dimensions des transistors ainsi que les tensions d’alimentation, les circuits électroniques sont devenus de plus en plus susceptibles aux fautes transitoires. L’impact de ces erreurs au niveau système peut être catastrophique et les SETs (Single Event Transients) sont devenus une menace tangible à la fiabilité des systèmes embarqués, en l’occurrence pour les applications critiques comme les systèmes de transport. Les techniques de fiabilité qui se basent sur des taux d’erreurs (SERs) surestimés peuvent conduire à un gaspillage de ressources et par conséquent un cout en consommation de puissance électrique. Il est primordial de prendre en compte le phénomène de masquage d’erreur pour une estimation précise des SERs.Cette thèse propose une nouvelle modélisation inter-couches de la vulnérabilité des circuits qui combine les mécanismes de masquage au niveau transistor (TLM) et le masquage au niveau Système (SLM). Ce modèle est ensuite utilisé afin de construire une architecture adaptative tolérante aux fautes qui évalue la vulnérabilité effective du circuit en runtime. La stratégie d’amélioration de fiabilité est adaptée pour ne protéger que les parties vulnérables du système, ce qui engendre un circuit fiable avec un cout optimisé. Les expérimentations effectuées sur un système de détection d’obstacles à base de radar pour le transport ferroviaire montre que l’approche proposée permet d’´établir un compromis fiabilité/ressources utilisées

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

DeSyRe: On-demand system reliability

The DeSyRe project builds on-demand adaptive and reliable Systems-on-Chips (SoCs). As fabrication technology scales down, chips are becoming less reliable, thereby incurring increased power and performance costs for fault tolerance. To make matters worse, power density is becoming a significant limiting factor in SoC design, in general. In the face of such changes in the technological landscape, current solutions for fault tolerance are expected to introduce excessive overheads in future systems. Moreover, attempting to design and manufacture a totally defect-/fault-free system, would impact heavily, even prohibitively, the design, manufacturing, and testing costs, as well as the system performance and power consumption. In this context, DeSyRe delivers a new generation of systems that are reliable by design at well-balanced power, performance, and design costs. In our attempt to reduce the overheads of fault-tolerance, only a small fraction of the chip is built to be fault-free. This fault-free part is then employed to manage the remaining fault-prone resources of the SoC. The DeSyRe framework is applied to two medical systems with high safety requirements (measured using the IEC 61508 functional safety standard) and tight power and performance constraints. (C) 2013 Elsevier B.V. All rights reserved

Optimizing whole programs for code size

Reducing code size has benefits at every scale. It can help fit embedded software into strictly limited storage space, reduce mobile app download time, and improve the cache usage of supercomputer software. There are many optimizations available that reduce code size, but research has often neglected this goal in favor of speed, and some recently developed compiler techniques have not yet been applied for size reduction. My work shows that newly practical compiler techniques can be used to develop novel code size optimizations. These optimizations complement each other, and other existing methods, in minimizing code size. I introduce two new optimizations, Guided Linking and Semantic Outlining, and also present a comparison framework for code size reduction methods that explains how and when my new optimizations work well with other, existing optimizations. Guided Linking builds on recent work that optimizes multiple programs and shared libraries together. It links an arbitrary set of programs and libraries into a single module. The module can then be optimized with arbitrary existing link-time optimizations, without changes to the optimization code, allowing them to work across program and library boundaries; for example, a library function can be inlined into a plugin module. I also demonstrate that deduplicating functions in the merged module can significantly reduce code size in some cases. Guided Linking ensures that all necessary dynamic linker behavior, such as plugin loading, still works correctly; it relies on developer-provided constraints to indicate which behavior must be preserved. Guided Linking can achieve a 13% to 57% size reduction in some scenarios, and can speed up the Python interpreter by 9%. Semantic Outlining relies on the use of automated theorem provers to check semantic equivalence of pieces of code, which has only recently become feasible to perform at scale. It extends outlining, an established technique for deduplicating structurally equivalent pieces of code, to work on code pieces that are semantically equivalent even if their structure is completely different. My comparison framework covers a large number of different code size reduction methods from the literature, in addition to my new methods. It describes several different aspects by which each method can be compared; in particular, there are multiple types of redundancy in program code that can be exploited to reduce code size, and methods that exploit different types of redundancy are likely to work well in combination with each other. This explains why Guided Linking and Semantic Outlining can be effective when used together, along with some kinds of existing optimizations

Reliable Software for Unreliable Hardware - A Cross-Layer Approach

A novel cross-layer reliability analysis, modeling, and optimization approach is proposed in this thesis that leverages multiple layers in the system design abstraction (i.e. hardware, compiler, system software, and application program) to exploit the available reliability enhancing potential at each system layer and to exchange this information across multiple system layers

Timing speculation and adaptive reliable overclocking techniques for aggressive computer systems

Computers have changed our lives beyond our own imagination in the past several decades. The continued and progressive advancements in VLSI technology and numerous micro-architectural innovations have played a key role in the design of spectacular low-cost high performance computing systems that have become omnipresent in today\u27s technology driven world. Performance and dependability have become key concerns as these ubiquitous computing machines continue to drive our everyday life. Every application has unique demands, as they run in diverse operating environments. Dependable, aggressive and adaptive systems improve efficiency in terms of speed, reliability and energy consumption. Traditional computing systems run at a fixed clock frequency, which is determined by taking into account the worst-case timing paths, operating conditions, and process variations. Timing speculation based reliable overclocking advocates going beyond worst-case limits to achieve best performance while not avoiding, but detecting and correcting a modest number of timing errors. The success of this design methodology relies on the fact that timing critical paths are rarely exercised in a design, and typical execution happens much faster than the timing requirements dictated by worst-case design methodology. Better-than-worst-case design methodology is advocated by several recent research pursuits, which exploit dependability techniques to enhance computer system performance. In this dissertation, we address different aspects of timing speculation based adaptive reliable overclocking schemes, and evaluate their role in the design of low-cost, high performance, energy efficient and dependable systems. We visualize various control knobs in the design that can be favorably controlled to ensure different design targets. As part of this research, we extend the SPRIT3E, or Superscalar PeRformance Improvement Through Tolerating Timing Errors, framework, and characterize the extent of application dependent performance acceleration achievable in superscalar processors by scrutinizing the various parameters that impact the operation beyond worst-case limits. We study the limitations imposed by short-path constraints on our technique, and present ways to exploit them to maximize performance gains. We analyze the sensitivity of our technique\u27s adaptiveness by exploring the necessary hardware requirements for dynamic overclocking schemes. Experimental analysis based on SPEC2000 benchmarks running on a SimpleScalar Alpha processor simulator, augmented with error rate data obtained from hardware simulations of a superscalar processor, are presented. Even though reliable overclocking guarantees functional correctness, it leads to higher power consumption. As a consequence, reliable overclocking without considering on-chip temperatures will bring down the lifetime reliability of the chip. In this thesis, we analyze how reliable overclocking impacts the on-chip temperature of a microprocessor and evaluate the effects of overheating, due to such reliable dynamic frequency tuning mechanisms, on the lifetime reliability of these systems. We then evaluate the effect of performing thermal throttling, a technique that clamps the on-chip temperature below a predefined value, on system performance and reliability. Our study shows that a reliably overclocked system with dynamic thermal management achieves 25% performance improvement, while lasting for 14 years when being operated within 353K. Over the past five decades, technology scaling, as predicted by Moore\u27s law, has been the bedrock of semiconductor technology evolution. The continued downscaling of CMOS technology to deep sub-micron gate lengths has been the primary reason for its dominance in today\u27s omnipresent silicon microchips. Even as the transition to the next technology node is indispensable, the initial cost and time associated in doing so presents a non-level playing field for the competitors in the semiconductor business. As part of this thesis, we evaluate the capability of speculative reliable overclocking mechanisms to maximize performance at a given technology level. We evaluate its competitiveness when compared to technology scaling, in terms of performance, power consumption, energy and energy delay product. We present a comprehensive comparison for integer and floating point SPEC2000 benchmarks running on a simulated Alpha processor at three different technology nodes in normal and enhanced modes. Our results suggest that adopting reliable overclocking strategies will help skip a technology node altogether, or be competitive in the market, while porting to the next technology node. Reliability has become a serious concern as systems embrace nanometer technologies. In this dissertation, we propose a novel fault tolerant aggressive system that combines soft error protection and timing error tolerance. We replicate both the pipeline registers and the pipeline stage combinational logic. The replicated logic receives its inputs from the primary pipeline registers while writing its output to the replicated pipeline registers. The organization of redundancy in the proposed Conjoined Pipeline system supports overclocking, provides concurrent error detection and recovery capability for soft errors, intermittent faults and timing errors, and flags permanent silicon defects. The fast recovery process requires no checkpointing and takes three cycles. Back annotated post-layout gate-level timing simulations, using 45nm technology, of a conjoined two-stage arithmetic pipeline and a conjoined five-stage DLX pipeline processor, with forwarding logic, show that our approach, even under a severe fault injection campaign, achieves near 100% fault coverage and an average performance improvement of about 20%, when dynamically overclocked