Behavioral Modelling of Digital Devices Via Composite Local-Linear State-Space Relations

This paper addresses the generation of accurate and efficient behavioral models of digital ICs. The proposed approach is based on the approximation of the device port characteristics by means of composite local linear state-space relations whose parameters can effectively be estimated from device port transient responses via well-established system identification techniques. The proposedmodels have been proven to overcome some inherent limitations of the state-of-the-art models used so far, and they can effectively be implemented in any commercial tool as Simulation Program with Integrated Circuit Emphasis (SPICE) subcircuits or VHDL-AMS hardware descriptions. A systematic study of the performances of the proposed state-space models is carried out on a synthetic test device. The effectiveness of the proposed approach has been demonstrated on a real application problem involving commercial devices and a data link of a mobile phon

Single-Piece State-Space Behavioral Models for IC Output Buffers

In this paper enhancements of parametric behavioral models for the output buffers of digital ICs are explored. A model based on a single-piece structure, which offers improved accuracy in describing state transition events for arbitrary load conditions, is proposed. This model exploits the potentiality of local-linear state-space parametric relations. These relations can be effectively estimated from input-output port responses only, and provide better stability properties and improved efficienc

REPP-H: runtime estimation of power and performance on heterogeneous data centers

Modern data centers increasingly demand improved performance with minimal power consumption. Managing the power and performance requirements of the applications is challenging because these data centers, incidentally or intentionally, have to deal with server architecture heterogeneity [19], [22]. One critical challenge that data centers have to face is how to manage system power and performance given the different application behavior across multiple different architectures.This work has been supported by the EU FP7 program (Mont-Blanc 2, ICT-610402), by the Ministerio de Economia (CAP-VII, TIN2015-65316-P), and the Generalitat de Catalunya (MPEXPAR, 2014-SGR-1051). The material herein is based in part upon work supported by the US NSF, grant numbers ACI-1535232 and CNS-1305220.Peer ReviewedPostprint (author's final draft

Locally-Stable Macromodels of Integrated Digital Devices for Multimedia Applications

This paper addresses the development of accurate and efficient behavioral models of digital integrated circuits for the assessment of high-speed systems. Device models are based on suitable parametric expressions estimated from port transient responses and are effective at system level, where the quality of functional signals and the impact of supply noise need to be simulated. A potential limitation of some state-of-the-art modeling techniques resides in hidden instabilities manifesting themselves in the use of models, without being evident in the building phase of the same models. This contribution compares three recently-proposed model structures, and selects the local-linear state-space modeling technique as an optimal candidate for the signal integrity assessment of data links. In fact, this technique combines a simple verification of the local stability of models with a limited model size and an easy implementation in commercial simulation tools. An application of the proposed methodology to a real problem involving commercial devices and a data-link of a wireless device demonstrates the validity of this approac

Automating defects simulation and fault modeling for SRAMs

The continues improvement in manufacturing process density for very deep sub micron technologies constantly leads to new classes of defects in memory devices. Exploring the effect of fabrication defects in future technologies, and identifying new classes of realistic functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper proposes a new approach to automate this procedure. The proposed method exploits the capabilities of evolutionary algorithms to automatically identify faulty behaviors into defective memories and to define the corresponding fault models and relevant test sequences. Target defects are modeled at the electrical level in order to optimize the results to the specific technology and memory architecture

Parametric Macromodels of Drivers for SSN Simulations

This paper addresses the modeling of output and power supply ports of digital drivers for accurate and efficient SSN simulations. The proposed macromodels are defined by parametric relations, whose parameters are estimated from measured or simulated port transient responses, and are implemented as SPICE subcircuits. The modeling technique is applied to commercial high-speed devices and a realistic simulation example is shown