Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

Multilevel Runtime Verification for Safety and Security Critical Cyber Physical Systems from a Model Based Engineering Perspective

Advanced embedded system technology is one of the key driving forces behind the rapid growth of Cyber-Physical System (CPS) applications. CPS consists of multiple coordinating and cooperating components, which are often software-intensive and interact with each other to achieve unprecedented tasks. Such highly integrated CPSs have complex interaction failures, attack surfaces, and attack vectors that we have to protect and secure against. This dissertation advances the state-of-the-art by developing a multilevel runtime monitoring approach for safety and security critical CPSs where there are monitors at each level of processing and integration. Given that computation and data processing vulnerabilities may exist at multiple levels in an embedded CPS, it follows that solutions present at the levels where the faults or vulnerabilities originate are beneficial in timely detection of anomalies. Further, increasing functional and architectural complexity of critical CPSs have significant safety and security operational implications. These challenges are leading to a need for new methods where there is a continuum between design time assurance and runtime or operational assurance. Towards this end, this dissertation explores Model Based Engineering methods by which design assurance can be carried forward to the runtime domain, creating a shared responsibility for reducing the overall risk associated with the system at operation. Therefore, a synergistic combination of Verification & Validation at design time and runtime monitoring at multiple levels is beneficial in assuring safety and security of critical CPS. Furthermore, we realize our multilevel runtime monitor framework on hardware using a stream-based runtime verification language

Protection and Disturbance Mitigation of Next Generation Shipboard Power Systems

Today, thanks to modern advances mainly in the power electronics field, megawatt-level electric drives and magnetic levitation are being integrated into the marine power grids. These technologies operate based on Direct Current (DC) power which require Alternating Current (AC) to DC conversion within the current grid. Medium-voltage Direct Current (MVDC) and Flywheel Energy Storage Systems (FESS) are the next state-of-the-art technologies that researchers are leaning on to produce, convert, store, and distribute power with improved power quality, reliability, and flexibility. On the other hand, with the extensive integration of high-frequency power electronic converters, system stability analysis and the true system dynamic behaviors assessment following grid disturbances have become a serious concern for system control designs and protection. This dissertation first explores emerging shipboard power distribution topologies such as MVDC networks and FESS operation with charge and discharge dynamics. Furthermore, the important topic of how these systems perform in dynamic conditions with pulsed power load, faults, arc fault and system protection are studied. Secondly, a communication-based fault detection and isolation system controller that improves upon a directional AC overcurrent relay protection system is proposed offering additional protection discrimination between faults and pulsed-power Load (PPL) in MVDC systems. The controller is designed to segregate between system dynamic short-circuit fault and bus current disturbances due to a PPL. Finally, to validate the effectiveness of the proposed protection controller, different bus current disturbances are simulated within a time-domain electromagnetic transient simulation of a shipboard power system including a PPL system operating with different ramp rate profiles, pulse widths, peak powers, and fault locations. This overarching goal of this work is to address some of the critical issues facing the US Navy as warfighter mission requirements increase exponentially and move towards advanced and sophisticated pulsed power load devices such as high energy weapon systems, high energy sensor and radar systems. The analyses and proposed solutions in this dissertation support current shipbuilding industry priorities to improve shipboard power system reliability and de-risk the integration of new power system technologies for next generation naval vessels

Integrated circuit outlier identification by multiple parameter correlation

Semiconductor manufacturers must ensure that chips conform to their specifications before they are shipped to customers. This is achieved by testing various parameters of a chip to determine whether it is defective or not. Separating defective chips from fault-free ones is relatively straightforward for functional or other Boolean tests that produce a go/no-go type of result. However, making this distinction is extremely challenging for parametric tests. Owing to continuous distributions of parameters, any pass/fail threshold results in yield loss and/or test escapes. The continuous advances in process technology, increased process variations and inaccurate fault models all make this even worse. The pass/fail thresholds for such tests are usually set using prior experience or by a combination of visual inspection and engineering judgment. Many chips have parameters that exceed certain thresholds but pass Boolean tests. Owing to the imperfect nature of tests, to determine whether these chips (called "outliers") are indeed defective is nontrivial. To avoid wasted investment in packaging or further testing it is important to screen defective chips early in a test flow. Moreover, if seemingly strange behavior of outlier chips can be explained with the help of certain process parameters or by correlating additional test data, such chips can be retained in the test flow before they are proved to be fatally flawed. In this research, we investigate several methods to identify true outliers (defective chips, or chips that lead to functional failure) from apparent outliers (seemingly defective, but fault-free chips). The outlier identification methods in this research primarily rely on wafer-level spatial correlation, but also use additional test parameters. These methods are evaluated and validated using industrial test data. The potential of these methods to reduce burn-in is discussed