On-Chip Analog Circuit Design Using Built-In Self-Test and an Integrated Multi-Dimensional Optimization Platform

Nowadays, the rapid development of system-on-chip (SoC) market introduces tremendous complexity into the integrated circuit (IC) design. Meanwhile, the IC fabrication process is scaling down to allow higher density of integration but makes the chips more sensitive to the process-voltage-temperature (PVT) variations. A successful IC product not only imposes great pressure on the IC designers, who have to handle wider variations and enforce more design margins, but also challenges the test procedure, leading to more check points and longer test time. To relax the designers’ burden and reduce the cost of testing, it is valuable to make the IC chips able to test and tune itself to some extent. In this dissertation, a fully integrated in-situ design validation and optimization (VO) hardware for analog circuits is proposed. It implements in-situ built-in self-test (BIST) techniques for analog circuits. Based on the data collected from BIST, the error between the measured and the desired performance of the target circuit is evaluated using a cost function. A digital multi-dimensional optimization engine is implemented to adaptively adjust the analog circuit parameters, seeking the minimum value of the cost function and achieving the desired performance. To verify this concept, study cases of a 2nd/4th active-RC band-pass filter (BPF) and a 2nd order Gm-C BPF, as well as all BIST and optimization blocks, are adopted on-chip. Apart from the VO system, several improved BIST techniques are also proposed in this dissertation. A single-tone sinusoidal waveform generator based on a finite-impulse-response (FIR) architecture, which utilizes an optimization algorithm to enhance its spur free dynamic range (SFDR), is proposed. It achieves an SFDR of 59 to 70 dBc from 150 to 850 MHz after the optimization procedure. A low-distortion current-steering two-tone sinusoidal signal synthesizer based on a mixing-FIR architecture is also proposed. The two-tone synthesizer extends the FIR architecture to two stages and implements an up-conversion mixer to generate the two tones, achieving better than -68 dBc IM3 below 480 MHz LO frequency without calibration. Moreover, an on-chip RF receiver linearity BIST methodology for continuous and discrete-time hybrid baseband chain is proposed. The proposed receiver chain implements a charge-domain FIR filter to notch the two excitation signals but expose the third order intermodulation (IM3) tones. It simplifies the linearity measurement procedure–using a power detector is enough to analyze the receiver’s linearity. Finally, a low cost fully digital built-in analog tester for linear-time-invariant (LTI) analog blocks is proposed. It adopts a time-to-digital converter (TDC) to measure the delays corresponded to a ramp excitation signal and is able to estimate the pole or zero locations of a low-pass LTI system