Background Digital Error Correction Technique for Pipelined Analog-Digital Converters

This paper describes a technique for digital error correction in pipelined analog-digital converters. It makes use of a slow, high resolution ADC in conjunction with an LMS algorithm to perform error correction in the background during normal conversion. The algorithm will be shown to correct for errors due to capacitor ratio mismatch, finite amplifier gain and charge injection within the same framework

Pipeline ADC with a Nonlinear Gain Stage and Digital Correction

The goal of this work was to design a pipeline analog to digital converter that can be calibrated and corrected in the digital domain. The scope of this work included the design, simulation and layout of major analog design blocks. The design uses an open loop gain stage to reduce power consumption, increase speed and relax small process size design requirements. These nonlinearities are corrected using a digital correction algorithm implemented in MATLAB

Calibration of pipeline ADC with pruned Volterra kernels

A Volterra model is used to calibrate a pipeline ADC simulated in Cadence Virtuoso using the STMicroelectronics CMOS 45 nm process. The ADC was designed to work at 50 MSps, but it is simulated at up to 125 MSps, proving that calibration using a Volterra model can significantly increase sampling frequency. Equivalent number of bits (ENOB) improves by 1-2.5 bits (6-15 dB) with 37101 model parameters. The complexity of the calibration algorithm is reduced using different lengths for each Volterra kernels and performing iterative pruning. System identification is performed by least squares techniques with a set of sinusoids at different frequencies spanning the whole Nyquist band. A comparison with simplified Volterra models proposed in the literature shows better performance for the pruned Volterra model with comparable complexity, improving linearity by as much as 1.5 bits more than the other techniques

Circuits and algorithms for pipelined ADCs in scaled CMOS technologies

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.MIT Barker Engineering Library copy: printed in pages.Also issued printed in pages.Includes bibliographical references (leaves 179-184).CMOS technology scaling is creating significant issues for analog circuit design. For example, reduced signal swing and device gain make it increasingly difficult to realize high-speed, high-gain feedback loops traditionally used in switched capacitor circuits. This research involves two complementary methods for addressing scaling issues. First is the development of two blind digital calibration techniques. Decision Boundary Gap Estimation (DBGE) removes static non-linearities and Chopper Offset Estimation (COE) nulls offsets in pipelined ADCs. Second is the development of circuits for a new architecture called zero-crossing based circuits (ZCBC) that is more amenable to scaling trends. To demonstrate these circuits and algorithms, two different ADCs were designed: an 8 bit, 200MS/s in TSMC 180nm technology, and a 12 bit, 50 MS/s in IBM 90nm technology. Together these techniques can be enabling technologies for both pipelined ADCs and general mixed signal design in deep sub-micron technologies.by Lane Gearle Brooks.Ph.D

New simple digital self-calibration technique for pipeline ADCs using the internal thermal noise

IEEE International Symposium on Circuits and Systems, pp. 232 – 235, Seattle, EUAThis paper describes a new digital-domain selfcalibration technique for high-speed pipeline A/D converters using the internal thermal noise as input stimulus. This lowamplitude noise is amplified and recycled by the ADC itself and, due to the successive foldings, it is naturally converted into uniform noise. This noise is then used to calculate the required calibrating-codes. As an example, the calibration of a 13-bit pipeline ADC shows that the overall linearity can be significantly improved using this technique

Architectural Improvements Towards an Efficient 16-18 Bit 100-200 MSPS ADC

As Data conversion systems continue to improve in speed and resolution, increasing demands are placed on the performance of high-speed Analog to Digital Conversion systems. This work makes a survey about all these and proposes a suitable architecture in order to achieve the desired specifications of 100-200MS/s with 16-18 bit of resolution. The main architecture is based on paralleled structures in order to achieve high sampling rate and at the same time high resolution. In order to solve problems related to Time-interleaved architectures, an advanced randomization method was introduced. It combines randomization and spectral shaping of mismatches. With a simple low-pass filter the method can, compared to conventional randomization algorithms, improve the SFDR as well as the SINAD. The main advantage of this technique over previous ones is that, because the algorithm only need that ADCs are ordered basing on their time mismatches, the absolute accuracy of the mismatch identification method does not matter and, therefore, the requirements on the timing mismatch identification are very low. In addition to that, this correction system uses very simple algorithms able to correct not only for time but also for gain and offset mismatches

Analog/RF Circuit Design Techniques for Nanometerscale IC Technologies

CMOS evolution introduces several problems in analog design. Gate-leakage mismatch exceeds conventional matching tolerances requiring active cancellation techniques or alternative architectures. One strategy to deal with the use of lower supply voltages is to operate critical parts at higher supply voltages, by exploiting combinations of thin- and thick-oxide transistors. Alternatively, low voltage circuit techniques are successfully developed. In order to benefit from nanometer scale CMOS technology, more functionality is shifted to the digital domain, including parts of the RF circuits. At the same time, analog control for digital and digital control for analog emerges to deal with current and upcoming imperfections

Efficient digital self-calibration of video-rate pipeline ADCs using white gaussian noise

Proceedings of IEEE, ISCAS 2003, Vol.I, pp. 877-880A digital-domain self-calibration technique for video-rate pipeline A/D converters based on a white Gaussian noise input signal is presented. The implementation of the proposed algorithm requires simple digital circuitv. An application design example of the self-calibration of a IZb. 40 MUS CMOSpipeline ADC is shown to illustrate that the overall linearity of the ADC can be highly improved using this technique