Calibration of DAC mismatch errors in sigma delta ADCs based on a sine-wave measurement

We present an offline calibration procedure to correct the nonlinearity due element mismatch in the digital-to-analog converter (DAC) of a multibit Sigma Delta-modulation A/D converter. The calibration uses a single measurement on a sinusoidal input signal, from which the DAC errors can be estimated. The main quality of the calibration method is that it can be implemented completely in the digital domain (or in software) and does not intervene in any way in the analog modulator circuit. This way, the technique is a powerful tool for verifying and debugging designs. Due to the simplicity of the method, it may be also a viable approach for factory calibration

Design Considerations for Wide Bandwidth Continuous-Time Low-Pass Delta-Sigma Analog-to-Digital Converters

Continuous-time (CT) delta-sigma (ΔΣ) analog-to-digital converters (ADC) have emerged as the popular choice to achieve high resolution and large bandwidth due to their low cost, power efficiency, inherent anti-alias filtering and digital post processing capabilities. This work presents a detailed system-level design methodology for a low-power CT ΔΣ ADC. Design considerations and trade-offs at the system-level are presented. A novel technique to reduce the sensitivity of the proposed ADC to clock jitter-induced feedback charge variations by employing a hybrid digital-to-analog converter (DAC) based on switched-capacitor circuits is also presented. The proposed technique provides a clock jitter tolerance of up to 5ps (rms). The system is implemented using a 5th order active-RC loop filter, 9-level quantizer and DAC, achieving 74dB SNDR over 20MHz signal bandwidth, at 400MHz sampling frequency in a 1.2V, 90 nm CMOS technology. A novel technique to improve the linearity of the feedback digital-to-analog converters (DAC) in a target 11-bits resolution, 100MHz bandwidth, 2GHz sampling frequency CT ΔΣ ADC is also presented in this work. DAC linearity is improved by combining dynamic element matching and automatic background calibration to achieve up to 18dB improvement in the SNR. Transistor-level circuit implementation of the proposed technique was done in a 1.8V, 0.18μm BiCMOS process

A Low-Power, Reconfigurable, Pipelined ADC with Automatic Adaptation for Implantable Bioimpedance Applications

Biomedical monitoring systems that observe various physiological parameters or electrochemical reactions typically cannot expect signals with fixed amplitude or frequency as signal properties can vary greatly even among similar biosignals. Furthermore, advancements in biomedical research have resulted in more elaborate biosignal monitoring schemes which allow the continuous acquisition of important patient information. Conventional ADCs with a fixed resolution and sampling rate are not able to adapt to signals with a wide range of variation. As a result, reconfigurable analog-to-digital converters (ADC) have become increasingly more attractive for implantable biosensor systems. These converters are able to change their operable resolution, sampling rate, or both in order convert changing signals with increased power efficiency. Traditionally, biomedical sensing applications were limited to low frequencies. Therefore, much of the research on ADCs for biomedical applications focused on minimizing power consumption with smaller bias currents resulting in low sampling rates. However, recently bioimpedance monitoring has become more popular because of its healthcare possibilities. Bioimpedance monitoring involves injecting an AC current into a biosample and measuring the corresponding voltage drop. The frequency of the injected current greatly affects the amplitude and phase of the voltage drop as biological tissue is comprised of resistive and capacitive elements. For this reason, a full spectrum of measurements from 100 Hz to 10-100 MHz is required to gain a full understanding of the impedance. For this type of implantable biomedical application, the typical low power, low sampling rate analog-to-digital converter is insufficient. A different optimization of power and performance must be achieved. Since SAR ADC power consumption scales heavily with sampling rate, the converters that sample fast enough to be attractive for bioimpedance monitoring do not have a figure-of-merit that is comparable to the slower converters. Therefore, an auto-adapting, reconfigurable pipelined analog-to-digital converter is proposed. The converter can operate with either 8 or 10 bits of resolution and with a sampling rate of 0.1 or 20 MS/s. Additionally, the resolution and sampling rate are automatically determined by the converter itself based on the input signal. This way, power efficiency is increased for input signals of varying frequency and amplitude

Efficient offline outer/inner DAC mismatch calibration in wideband ΔΣ ADCs

Distortion due to feedback DAC mismatch is a key limitation in Delta Sigma ADCs for wideband wireless communications. This article presents an efficient frequency-domain mask-based offline mismatch calibration method of both the outer DAC and the inner DACs in a Delta Sigma ADC. The test stimulus for the calibration is a two-tone signal near the band edge. To avoid the need for high-performance signal generation, a frequency mask is applied to void the stimulus signal and its phase noise. In this way, the method is robust against distortion and jitter in the stimulus signal, which therefore could be combined from two low-quality signal generators. The two-tone band-edge signal has the additional benefit that the number of needed samples of the excitation signal is very modest because as many intermodulations as possible contribute to the calculation of the mismatch errors of the DACs. Experimental results confirming the calibration method are obtained from a prototype chip, designed for an 85MHz signal bandwidth in 28nm CMOS technology. A two-tone stimulus around 78 MHz is applied to calculate the mismatch of the outer DAC and the inner DAC with only 68K samples. With the DACs calibrated, an SFDR improvement of 28.1 dB is achieved for a single-tone input at 5 MHz, while for a two-tone input around 71 MHz, the IM3 is improved from -63.6 dBc to below the noise floor (<-94.1 dBc). This illustrates the effectiveness of the approach

Time-encoding analog-to-digital converters : bridging the analog gap to advanced digital CMOS? Part 2: architectures and circuits

The scaling of CMOS technology deep into the nanometer range has created challenges for the design of highperformance analog ICs: they remain large in area and power consumption in spite of process scaling. Analog circuits based on time encoding [1], [2], where the signal information is encoded in the waveform transitions instead of its amplitude, have been developed to overcome these issues. While part one of this overview article [3] presented the basic principles of time encoding, this follow-up article describes and compares the main time-encoding architectures for analog-to-digital converters (ADCs) and discusses the corresponding design challenges of the circuit blocks. The focus is on structures that avoid, as much as possible, the use of traditional analog blocks like operational amplifiers (opamps) or comparators but instead use digital circuitry, ring oscillators, flip-flops, counters, an so on. Our overview of the state of the art will show that these circuits can achieve excellent performance. The obvious benefit of this highly digital approach to realizing analog functionality is that the resulting circuits are small in area and more compatible with CMOS process scaling. The approach also allows for the easy integration of these analog functions in systems on chip operating at "digital" supply voltages as low as 1V and lower. A large part of the design process can also be embedded in a standard digital synthesis flow

Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

A design tool for high-resolution high-frequency cascade continuous- time Σ∆ modulators

Event: Microtechnologies for the New Millennium, 2007, Maspalomas, Gran Canaria, SpainThis paper introduces a CAD methodology to assist the de signer in the implementation of continuous-time (CT) cas- cade Σ∆ modulators. The salient features of this methodology ar e: (a) flexible behavioral modeling for optimum accuracy- efficiency trade-offs at different stages of the top-down synthesis process; (b) direct synthesis in the continuous-time domain for minimum circuit complexity and sensitivity; a nd (c) mixed knowledge-based and optimization-based architec- tural exploration and specification transmission for enhanced circuit performance. The applicability of this methodology will be illustrated via the design of a 12 bit 20 MHz CT Σ∆ modulator in a 1.2V 130nm CMOS technology.Ministerio de Ciencia y Educación TEC2004-01752/MICMinisterio de Industria, Turismo y Comercio FIT-330100-2006-134 SPIRIT Projec