999 research outputs found

    Intermittent/transient fault phenomena in digital systems

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    An overview of the intermittent/transient (IT) fault study is presented. An interval survivability evaluation of digital systems for IT faults is discussed along with a method for detecting and diagnosing IT faults in digital systems

    Constraint Based Diagnosis Algorithms For Multiprocessors

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    Constraint-based diagnosis algorithms for multiprocessors A. Petri, P. Urban, J. Altmann, M. Dal Cin, E. Selenyi, K. Tilly, A. Pataricza In the latest years, new ideas appeared in system level diagnosis of multiprocessor systems. In contrary to the traditional diagnosis models (like PMC, BGM, etc.) which use strictly graph-oriented methods to determine the faulty components in a system, these new theories prefer AI-based algorithms, especially CSP methods. Syndrome decoding, the basic problem of self-diagnosis, can be easily transformed into constraints between the state of the tester and the tested components. Therefore, the diagnosis algorithm can be derived from a special constraint solving algorithm. The "benign" nature of the constraints (all their variables, representing the fault states of the components, have a very limited domain; the constraints are simple and similar to each other) reduces the algorithm's complexity so it can be converted to a powerful distributed diagnosis method with a minimal overhead. Experimental algorithms (using both centralized and distributed approach) were implemented for a Parsytec GC massively parallel multiprocessor system

    Fault-tolerant computer study

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    A set of building block circuits is described which can be used with commercially available microprocessors and memories to implement fault tolerant distributed computer systems. Each building block circuit is intended for VLSI implementation as a single chip. Several building blocks and associated processor and memory chips form a self checking computer module with self contained input output and interfaces to redundant communications buses. Fault tolerance is achieved by connecting self checking computer modules into a redundant network in which backup buses and computer modules are provided to circumvent failures. The requirements and design methodology which led to the definition of the building block circuits are discussed

    A Primer on Architectural Level Fault Tolerance

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    This paper introduces the fundamental concepts of fault tolerant computing. Key topics covered are voting, fault detection, clock synchronization, Byzantine Agreement, diagnosis, and reliability analysis. Low level mechanisms such as Hamming codes or low level communications protocols are not covered. The paper is tutorial in nature and does not cover any topic in detail. The focus is on rationale and approach rather than detailed exposition

    Innovative Techniques for Testing and Diagnosing SoCs

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    We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

    Space station automation of common module power management and distribution

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    The purpose is to automate a breadboard level Power Management and Distribution (PMAD) system which possesses many functional characteristics of a specified Space Station power system. The automation system was built upon 20 kHz ac source with redundancy of the power buses. There are two power distribution control units which furnish power to six load centers which in turn enable load circuits based upon a system generated schedule. The progress in building this specified autonomous system is described. Automation of Space Station Module PMAD was accomplished by segmenting the complete task in the following four independent tasks: (1) develop a detailed approach for PMAD automation; (2) define the software and hardware elements of automation; (3) develop the automation system for the PMAD breadboard; and (4) select an appropriate host processing environment

    Development and analysis of the Software Implemented Fault-Tolerance (SIFT) computer

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    SIFT (Software Implemented Fault Tolerance) is an experimental, fault-tolerant computer system designed to meet the extreme reliability requirements for safety-critical functions in advanced aircraft. Errors are masked by performing a majority voting operation over the results of identical computations, and faulty processors are removed from service by reassigning computations to the nonfaulty processors. This scheme has been implemented in a special architecture using a set of standard Bendix BDX930 processors, augmented by a special asynchronous-broadcast communication interface that provides direct, processor to processor communication among all processors. Fault isolation is accomplished in hardware; all other fault-tolerance functions, together with scheduling and synchronization are implemented exclusively by executive system software. The system reliability is predicted by a Markov model. Mathematical consistency of the system software with respect to the reliability model has been partially verified, using recently developed tools for machine-aided proof of program correctness

    Advanced information processing system: The Army fault tolerant architecture conceptual study. Volume 2: Army fault tolerant architecture design and analysis

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    Described here is the Army Fault Tolerant Architecture (AFTA) hardware architecture and components and the operating system. The architectural and operational theory of the AFTA Fault Tolerant Data Bus is discussed. The test and maintenance strategy developed for use in fielded AFTA installations is presented. An approach to be used in reducing the probability of AFTA failure due to common mode faults is described. Analytical models for AFTA performance, reliability, availability, life cycle cost, weight, power, and volume are developed. An approach is presented for using VHSIC Hardware Description Language (VHDL) to describe and design AFTA's developmental hardware. A plan is described for verifying and validating key AFTA concepts during the Dem/Val phase. Analytical models and partial mission requirements are used to generate AFTA configurations for the TF/TA/NOE and Ground Vehicle missions

    A model-based reasoning architecture for system-level fault diagnosis

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    This dissertation presents a model-based reasoning architecture with a two fold purpose: to detect and classify component faults from observable system behavior, and to generate fault propagation models so as to make a more accurate estimation of current operational risks. It incorporates a novel approach to system level diagnostics by addressing the need to reason about low-level inaccessible components from observable high-level system behavior. In the field of complex system maintenance it can be invaluable as an aid to human operators. The first step is the compilation of the database of functional descriptions and associated fault-specific features for each of the system components. The system is then analyzed to extract structural information, which, in addition to the functional database, is used to create the structural and functional models. A fault-symptom matrix is constructed from the functional model and the features database. The fault threshold levels for these symptoms are founded on the nominal baseline data. Based on the fault-symptom matrix and these thresholds, a diagnostic decision tree is formulated in order to intelligently query about the system health. For each faulty candidate, a fault propagation tree is generated from the structural model. Finally, the overall system health status report includes both the faulty components and the associated at risk components, as predicted by the fault propagation model.Ph.D.Committee Chair: Vachtsevanos, George; Committee Member: Liang, Steven; Committee Member: Michaels, Thomas; Committee Member: Vela, Patricio; Committee Member: Wardi, Yora
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