Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Self-healing concepts involving fine-grained redundancy for electronic systems

The start of the digital revolution came through the metal-oxide-semiconductor field-effect transistor (MOSFET) in 1959 followed by massive integration onto a silicon die by means of constant down scaling of individual components. Digital systems for certain applications require fault-tolerance against faults caused by temporary or permanent influence. The most widely used technique is triple module redundancy (TMR) in conjunction with a majority voter, which is regarded as a passive fault mitigation strategy. Design by functional resilience has been applied to circuit structures for increased fault-tolerance and towards self-diagnostic triggered self-healing. The focus of this thesis is therefore to develop new design strategies for fault detection and mitigation within transistor, gate and cell design levels. The research described in this thesis makes three contributions. The first contribution is based on adding fine-grained transistor level redundancy to logic gates in order to accomplish stuck-at fault-tolerance. The objective is to realise maximum fault-masking for a logic gate with minimal added redundant transistors. In the case of non-maskable stuck-at faults, the gate structure generates an intrinsic indication signal that is suitable for autonomous self-healing functions. As a result, logic circuitry utilising this design is now able to differentiate between gate faults and faults occurring in inter-gate connections. This distinction between fault-types can then be used for triggering selective self-healing responses. The second contribution is a logic matrix element which applies the three core redundancy concepts of spatial- temporal- and data-redundancy. This logic structure is composed of quad-modular redundant structures and is capable of selective fault-masking and localisation depending of fault-type at the cell level, which is referred to as a spatiotemporal quadded logic cell (QLC) structure. This QLC structure has the capability of cellular self-healing. Through the combination of fault-tolerant and masking logic features the QLC is designed with a fault-behaviour that is equal to existing quadded logic designs using only 33.3% of the equivalent transistor resources. The inherent self-diagnosing feature of QLC is capable of identifying individual faulty cells and can trigger self-healing features. The final contribution is focused on the conversion of finite state machines (FSM) into memory to achieve better state transition timing, minimal memory utilisation and fault protection compared to common FSM designs. A novel implementation based on content-addressable type memory (CAM) is used to achieve this. The FSM is further enhanced by creating the design out of logic gates of the first contribution by achieving stuck-at fault resilience. Applying cross-data parity checking, the FSM becomes equipped with single bit fault detection and correction

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results

Exploiting Partial Dynamic Reconfiguration for On-Line On-Demand Detection of Permanent Faults in SRAM-based FPGAs

FPGAs become ever more popular thanks to their features, such as reconfigurability and short time to market. When FPGAs operates in harsh environment, like in space, soft faults can occur (SEU) due to radiation, as well as permanent faults (TID, Aging). To the best of my knowledge, testing of logic resources has already been widely considered in literature, on the other hand this work aims to detect permanent faults which can affect the interconnection infrastructure. In modern FPGAs the routing resources represents up to 80% of the whole chip area. Few works consider permanent faults and none of them deals with on-line testing of permanent faults with using independent test circuits. In this work a first approach is presented, where different circuits have been developed and tested on a DB-V4 of the RAPTOR system

Built-in tests for a real-time embedded system.

Thesis (M.Sc.)-University of Natal, Durban, 1991.Beneath the facade of the applications code of a well-designed real-time embedded system lies intrinsic firmware that facilitates a fast and effective means of detecting and diagnosing inevitable hardware failures. These failures can encumber the availability of a system, and, consequently, an identification of the source of the malfunction is needed. It is shown that the number of possible origins of all manner of failures is immense. As a result, fault models are contrived to encompass prevalent hardware faults. Furthermore, the complexity is reduced by determining syndromes for particular circuitry and applying test vectors at a functional block level. Testing phases and philosophies together with standardisation policies are defined to ensure the compliance of system designers to the underlying principles of evaluating system integrity. The three testing phases of power-on self tests at system start up, on-line health monitoring and off-line diagnostics are designed to ensure that the inherent test firmware remains inconspicuous during normal applications. The prominence of the code is, however, apparent on the detection or diagnosis of a hardware failure. The authenticity of the theoretical models, standardisation policies and built-in test philosophies are illustrated by means of their application to an intricate real-time system. The architecture and the software design implementing the idealogies are described extensively. Standardisation policies, enhanced by the proposition of generic tests for common core components, are advocated at all hierarchical levels. The presentation of the integration of the hardware and software are aimed at portraying the moderately complex nature of the task of generating a set of built-in tests for a real-time embedded system. In spite of generic policies, the intricacies of the architecture are found to have a direct influence on software design decisions. It is thus concluded that the diagnostic objectives of the user requirements specification be lucidly expressed by both operational and maintenance personnel for all testing phases. Disparity may exist between the system designer and the end user in the understanding of the requirements specification defining the objectives of the diagnosis. It is thus essential for complete collaboration between the two parties throughout the development life cycle, but especially during the preliminary design phase. Thereafter, the designer would be able to decide on the sophistication of the system testing capabilities

A Decade of Neural Networks: Practical Applications and Prospects

The Jet Propulsion Laboratory Neural Network Workshop, sponsored by NASA and DOD, brings together sponsoring agencies, active researchers, and the user community to formulate a vision for the next decade of neural network research and application prospects. While the speed and computing power of microprocessors continue to grow at an ever-increasing pace, the demand to intelligently and adaptively deal with the complex, fuzzy, and often ill-defined world around us remains to a large extent unaddressed. Powerful, highly parallel computing paradigms such as neural networks promise to have a major impact in addressing these needs. Papers in the workshop proceedings highlight benefits of neural networks in real-world applications compared to conventional computing techniques. Topics include fault diagnosis, pattern recognition, and multiparameter optimization

Low-cost and efficient fault detection and diagnosis schemes for modern cores

Continuous improvements in transistor scaling together with microarchitectural advances have made possible the widespread adoption of high-performance processors across all market segments. However, the growing reliability threats induced by technology scaling and by the complexity of designs are challenging the production of cheap yet robust systems. Soft error trends are haunting, especially for combinational logic, and parity and ECC codes are therefore becoming insufficient as combinational logic turns into the dominant source of soft errors. Furthermore, experts are warning about the need to also address intermittent and permanent faults during processor runtime, as increasing temperatures and device variations will accelerate inherent aging phenomena. These challenges specially threaten the commodity segments, which impose requirements that existing fault tolerance mechanisms cannot offer. Current techniques based on redundant execution were devised in a time when high penalties were assumed for the sake of high reliability levels. Novel light-weight techniques are therefore needed to enable fault protection in the mass market segments. The complexity of designs is making post-silicon validation extremely expensive. Validation costs exceed design costs, and the number of discovered bugs is growing, both during validation and once products hit the market. Fault localization and diagnosis are the biggest bottlenecks, magnified by huge detection latencies, limited internal observability, and costly server farms to generate test outputs. This thesis explores two directions to address some of the critical challenges introduced by unreliable technologies and by the limitations of current validation approaches. We first explore mechanisms for comprehensively detecting multiple sources of failures in modern processors during their lifetime (including transient, intermittent, permanent and also design bugs). Our solutions embrace a paradigm where fault tolerance is built based on exploiting high-level microarchitectural invariants that are reusable across designs, rather than relying on re-execution or ad-hoc block-level protection. To do so, we decompose the basic functionalities of processors into high-level tasks and propose three novel runtime verification solutions that combined enable global error detection: a computation/register dataflow checker, a memory dataflow checker, and a control flow checker. The techniques use the concept of end-to-end signatures and allow designers to adjust the fault coverage to their needs, by trading-off area, power and performance. Our fault injection studies reveal that our methods provide high coverage levels while causing significantly lower performance, power and area costs than existing techniques. Then, this thesis extends the applicability of the proposed error detection schemes to the validation phases. We present a fault localization and diagnosis solution for the memory dataflow by combining our error detection mechanism, a new low-cost logging mechanism and a diagnosis program. Selected internal activity is continuously traced and kept in a memory-resident log whose capacity can be expanded to suite validation needs. The solution can catch undiscovered bugs, reducing the dependence on simulation farms that compute golden outputs. Upon error detection, the diagnosis algorithm analyzes the log to automatically locate the bug, and also to determine its root cause. Our evaluations show that very high localization coverage and diagnosis accuracy can be obtained at very low performance and area costs. The net result is a simplification of current debugging practices, which are extremely manual, time consuming and cumbersome. Altogether, the integrated solutions proposed in this thesis capacitate the industry to deliver more reliable and correct processors as technology evolves into more complex designs and more vulnerable transistors.El continuo escalado de los transistores junto con los avances microarquitectónicos han posibilitado la presencia de potentes procesadores en todos los segmentos de mercado. Sin embargo, varios problemas de fiabilidad están desafiando la producción de sistemas robustos. Las predicciones de "soft errors" son inquietantes, especialmente para la lógica combinacional: soluciones como ECC o paridad se están volviendo insuficientes a medida que dicha lógica se convierte en la fuente predominante de soft errors. Además, los expertos están alertando acerca de la necesidad de detectar otras fuentes de fallos (causantes de errores permanentes e intermitentes) durante el tiempo de vida de los procesadores. Los segmentos "commodity" son los más vulnerables, ya que imponen unos requisitos que las técnicas actuales de fiabilidad no ofrecen. Estas soluciones (generalmente basadas en re-ejecución) fueron ideadas en un tiempo en el que con tal de alcanzar altos nivel de fiabilidad se asumían grandes costes. Son por tanto necesarias nuevas técnicas que permitan la protección contra fallos en los segmentos más populares. La complejidad de los diseños está encareciendo la validación "post-silicon". Su coste excede el de diseño, y el número de errores descubiertos está aumentando durante la validación y ya en manos de los clientes. La localización y el diagnóstico de errores son los mayores problemas, empeorados por las altas latencias en la manifestación de errores, por la poca observabilidad interna y por el coste de generar las señales esperadas. Esta tesis explora dos direcciones para tratar algunos de los retos causados por la creciente vulnerabilidad hardware y por las limitaciones de los enfoques de validación. Primero exploramos mecanismos para detectar múltiples fuentes de fallos durante el tiempo de vida de los procesadores (errores transitorios, intermitentes, permanentes y de diseño). Nuestras soluciones son de un paradigma donde la fiabilidad se construye explotando invariantes microarquitectónicos genéricos, en lugar de basarse en re-ejecución o en protección ad-hoc. Para ello descomponemos las funcionalidades básicas de un procesador y proponemos tres soluciones de `runtime verification' que combinadas permiten una detección de errores a nivel global. Estas tres soluciones son: un verificador de flujo de datos de registro y de computación, un verificador de flujo de datos de memoria y un verificador de flujo de control. Nuestras técnicas usan el concepto de firmas y permiten a los diseñadores ajustar los niveles de protección a sus necesidades, mediante compensaciones en área, consumo energético y rendimiento. Nuestros estudios de inyección de errores revelan que los métodos propuestos obtienen altos niveles de protección, a la vez que causan menos costes que las soluciones existentes. A continuación, esta tesis explora la aplicabilidad de estos esquemas a las fases de validación. Proponemos una solución de localización y diagnóstico de errores para el flujo de datos de memoria que combina nuestro mecanismo de detección de errores, junto con un mecanismo de logging de bajo coste y un programa de diagnóstico. Cierta actividad interna es continuamente registrada en una zona de memoria cuya capacidad puede ser expandida para satisfacer las necesidades de validación. La solución permite descubrir bugs, reduciendo la necesidad de calcular los resultados esperados. Al detectar un error, el algoritmo de diagnóstico analiza el registro para automáticamente localizar el bug y determinar su causa. Nuestros estudios muestran un alto grado de localización y de precisión de diagnóstico a un coste muy bajo de rendimiento y área. El resultado es una simplificación de las prácticas actuales de depuración, que son enormemente manuales, incómodas y largas. En conjunto, las soluciones de esta tesis capacitan a la industria a producir procesadores más fiables, a medida que la tecnología evoluciona hacia diseños más complejos y más vulnerables

Test and Diagnosis of Integrated Circuits

The ever-increasing growth of the semiconductor market results in an increasing complexity of digital circuits. Smaller, faster, cheaper and low-power consumption are the main challenges in semiconductor industry. The reduction of transistor size and the latest packaging technology (i.e., System-On-a-Chip, System-In-Package, Trough Silicon Via 3D Integrated Circuits) allows the semiconductor industry to satisfy the latest challenges. Although producing such advanced circuits can benefit users, the manufacturing process is becoming finer and denser, making chips more prone to defects.The work presented in the HDR manuscript addresses the challenges of test and diagnosis of integrated circuits. It covers:- Power aware test;- Test of Low Power Devices;- Fault Diagnosis of digital circuits

Space station data system analysis/architecture study. Task 2: Options development DR-5. Volume 1: Technology options

The second task in the Space Station Data System (SSDS) Analysis/Architecture Study is the development of an information base that will support the conduct of trade studies and provide sufficient data to make key design/programmatic decisions. This volume identifies the preferred options in the technology category and characterizes these options with respect to performance attributes, constraints, cost, and risk. The technology category includes advanced materials, processes, and techniques that can be used to enhance the implementation of SSDS design structures. The specific areas discussed are mass storage, including space and round on-line storage and off-line storage; man/machine interface; data processing hardware, including flight computers and advanced/fault tolerant computer architectures; and software, including data compression algorithms, on-board high level languages, and software tools. Also discussed are artificial intelligence applications and hard-wire communications

Deep Space Network information system architecture study

The purpose of this article is to describe an architecture for the Deep Space Network (DSN) information system in the years 2000-2010 and to provide guidelines for its evolution during the 1990s. The study scope is defined to be from the front-end areas at the antennas to the end users (spacecraft teams, principal investigators, archival storage systems, and non-NASA partners). The architectural vision provides guidance for major DSN implementation efforts during the next decade. A strong motivation for the study is an expected dramatic improvement in information-systems technologies, such as the following: computer processing, automation technology (including knowledge-based systems), networking and data transport, software and hardware engineering, and human-interface technology. The proposed Ground Information System has the following major features: unified architecture from the front-end area to the end user; open-systems standards to achieve interoperability; DSN production of level 0 data; delivery of level 0 data from the Deep Space Communications Complex, if desired; dedicated telemetry processors for each receiver; security against unauthorized access and errors; and highly automated monitor and control