Pulse Quenching and Charge-Sharing Effects on Heavy-Ion Microbeam Induced ASET in a Full-Custom CMOS OpAmp

In this work, charge sharing effects on Analog Single Event Transients are experimentally observed in a fully-custom designed, 180nm CMOS Operational Amplifier by means of a heavy-ion microbeam. Sensitive nodes of the differential stage showed bipolar output transients that cannot be explained by single node collection for the closed loop characteristics of the circuit under test. Layout of these transistors are consistent with charge sharing effects due to deposited charge diffusion. Implementation of linear modeling and simulations of multiple node collection between paired transistors of the input stage showed great coincidence with the obtained experimental waveforms, shaped as bipolar, quenched pulses. These effects are also observed due to dummy transistors placed in the layout. A simple parametrization at the simulation level is proposed to reproduce the observed experimental waveforms. Results indicate that charge-sharing effects should be taken into account during simulation-based sensitivity evaluation of analog circuits, as pulse quenching can alter the obtained results, and linear modeling is a simple approach to emulate simultaneous charge collection in multiple nodes by applying superposition principles, with aims of hardening a design.Fil: Fontana, Andrés. Universidad Tecnológica Nacional; ArgentinaFil: Pazos, Sebastián Matías. Comisión Nacional de Energía Atómica. Gerencia de Área Investigaciones y Aplicaciones No Nucleares. Gerencia Física (CAC). Departamento de Física de la Materia Condensada; Argentina. Universidad Tecnológica Nacional; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Aguirre, Fernando Leonel. Comisión Nacional de Energía Atómica. Gerencia de Área Investigaciones y Aplicaciones No Nucleares. Gerencia Física (CAC). Departamento de Física de la Materia Condensada; Argentina. Universidad Tecnológica Nacional; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Vega, Nahuel Agustín. Comisión Nacional de Energía Atómica; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; ArgentinaFil: Muller, Nahuel. Comisión Nacional de Energía Atómica; ArgentinaFil: De la Fourniere, Emmanuel. Comisión Nacional de Energía Atómica; ArgentinaFil: Silveira, Fernando. Universidad de la Republica. Facultad de Ingeniería; UruguayFil: Debray, Mario Ernesto. Comisión Nacional de Energía Atómica; ArgentinaFil: Palumbo, Félix Roberto Mario. Comisión Nacional de Energía Atómica. Gerencia de Área Investigaciones y Aplicaciones No Nucleares. Gerencia Física (CAC). Departamento de Física de la Materia Condensada; Argentina. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentin

Techniques d'abstraction pour l'analyse et la mitigation des effets dus à la radiation

The main objective of this thesis is to develop techniques that can beused to analyze and mitigate the effects of radiation-induced soft errors in industrialscale integrated circuits. To achieve this goal, several methods have been developedbased on analyzing the design at higher levels of abstraction. These techniquesaddress both sequential and combinatorial SER.Fault-injection simulations remain the primary method for analyzing the effectsof soft errors. In this thesis, techniques which significantly speed-up fault-injectionsimulations are presented. Soft errors in flip-flops are typically mitigated by selectivelyreplacing the most critical flip-flops with hardened implementations. Selectingan optimal set to harden is a compute intensive problem and the second contributionconsists of a clustering technique which significantly reduces the number offault-injections required to perform selective mitigation.In terrestrial applications, the effect of soft errors in combinatorial logic hasbeen fairly small. It is known that this effect is growing, yet there exist few techniqueswhich can quickly estimate the extent of combinatorial SER for an entireintegrated circuit. The third contribution of this thesis is a hierarchical approachto combinatorial soft error analysis.Systems-on-chip are often developed by re-using design-blocks that come frommultiple sources. In this context, there is a need to develop and exchange reliabilitymodels. The final contribution of this thesis consists of an application specificmodeling language called RIIF (Reliability Information Interchange Format). Thislanguage is able to model how faults at the gate-level propagate up to the block andchip-level. Work is underway to standardize the RIIF modeling language as well asto extend it beyond modeling of radiation-induced failures.In addition to the main axis of research, some tangential topics were studied incollaboration with other teams. One of these consisted in the development of a novelapproach for protecting ternary content addressable memories (TCAMs), a specialtype of memory important in networking applications. The second supplementalproject resulted in an algorithm for quickly generating approximate redundant logicwhich can protect combinatorial networks against permanent faults. Finally anapproach for reducing the detection time for errors in the configuration RAM forField-Programmable Gate-Arrays (FPGAs) was outlined.Les effets dus à la radiation peuvent provoquer des pannes dans des circuits intégrés. Lorsqu'une particule subatomique, fait se déposer une charge dans les régions sensibles d'un transistor cela provoque une impulsion de courant. Cette impulsion peut alors engendrer l'inversion d'un bit ou se propager dans un réseau de logique combinatoire avant d'être échantillonnée par une bascule en aval.Selon l'état du circuit au moment de la frappe de la particule et selon l'application, cela provoquera une panne observable ou non. Parmi les événements induits par la radiation, seule une petite portion génère des pannes. Il est donc essentiel de déterminer cette fraction afin de prédire la fiabilité du système. En effet, les raisons pour lesquelles une perturbation pourrait être masquée sont multiples, et il est de plus parfois difficile de préciser ce qui constitue une erreur. A cela s'ajoute le fait que les circuits intégrés comportent des milliards de transistors. Comme souvent dans le contexte de la conception assisté par ordinateur, les approches hiérarchiques et les techniques d'abstraction permettent de trouver des solutions.Cette thèse propose donc plusieurs nouvelles techniques pour analyser les effets dus à la radiation. La première technique permet d'accélérer des simulations d'injections de fautes en détectant lorsqu'une faute a été supprimée du système, permettant ainsi d'arrêter la simulation. La deuxième technique permet de regrouper en ensembles les éléments d'un circuit ayant une fonction similaire. Ensuite, une analyse au niveau des ensemble peut être faite, identifiant ainsi ceux qui sont les plus critiques et qui nécessitent donc d'être durcis. Le temps de calcul est ainsi grandement réduit.La troisième technique permet d'analyser les effets des fautes transitoires dans les circuits combinatoires. Il est en effet possible de calculer à l'avance la sensibilité à des fautes transitoires de cellules ainsi que les effets de masquage dans des blocs fréquemment utilisés. Ces modèles peuvent alors être combinés afin d'analyser la sensibilité de grands circuits. La contribution finale de cette thèse consiste en la définition d'un nouveau langage de modélisation appelé RIIF (Reliability Information Ineterchange Format). Ce langage permet de décrire le taux des fautes dans des composants simples en fonction de leur environnement de fonctionnement. Ces composants simples peuvent ensuite être combinés permettant ainsi de modéliser la propagation de leur fautes vers des pannes au niveau système. En outre, l'utilisation d'un langage standard facilite l'échange de données de fiabilité entre les partenaires industriels.Au-delà des contributions principales, cette thèse aborde aussi des techniques permettant de protéger des mémoires associatives ternaires (TCAMs). Les approches classiques de protection (codes correcteurs) ne s'appliquent pas directement. Une des nouvelles techniques proposées consiste à utiliser une structure de données qui peut détecter, d'une manière statistique, quand le résultat n'est pas correct. La probabilité de détection peut être contrôlée par le nombre de bits alloués à cette structure. Une autre technique consiste à utiliser un détecteur de courant embarqué (BICS) afin de diriger un processus de fond directement vers le région touchée par une erreur. La contribution finale consiste en un algorithme qui permet de synthétiser de la logique combinatoire afin de protéger des circuits combinatoires contre les fautes transitoires.Dans leur ensemble, ces techniques facilitent l'analyse des erreurs provoquées par les effets dus à la radiation dans les circuits intégrés, en particulier pour les très grands circuits composés de blocs provenant de divers fournisseurs. Des techniques pour mieux sélectionner les bascules/flip-flops à durcir et des approches pour protéger des TCAMs ont étés étudiées

Laboratory Directed Research and Development Program FY 2004 Annual Report

The Oak Ridge National Laboratory (ORNL) Laboratory Directed Research and Development (LDRD) Program reports its status to the U.S. Department of Energy (DOE) in March of each year. The program operates under the authority of DOE Order 413.2A, 'Laboratory Directed Research and Development' (January 8, 2001), which establishes DOE's requirements for the program while providing the Laboratory Director broad flexibility for program implementation. LDRD funds are obtained through a charge to all Laboratory programs. This report describes all ORNL LDRD research activities supported during FY 2004 and includes final reports for completed projects and shorter progress reports for projects that were active, but not completed, during this period. The FY 2004 ORNL LDRD Self-Assessment (ORNL/PPA-2005/2) provides financial data about the FY 2004 projects and an internal evaluation of the program's management process. ORNL is a DOE multiprogram science, technology, and energy laboratory with distinctive capabilities in materials science and engineering, neutron science and technology, energy production and end-use technologies, biological and environmental science, and scientific computing. With these capabilities ORNL conducts basic and applied research and development (R&D) to support DOE's overarching national security mission, which encompasses science, energy resources, environmental quality, and national nuclear security. As a national resource, the Laboratory also applies its capabilities and skills to the specific needs of other federal agencies and customers through the DOE Work For Others (WFO) program. Information about the Laboratory and its programs is available on the Internet at <http://www.ornl.gov/>. LDRD is a relatively small but vital DOE program that allows ORNL, as well as other multiprogram DOE laboratories, to select a limited number of R&D projects for the purpose of: (1) maintaining the scientific and technical vitality of the Laboratory; (2) enhancing the Laboratory's ability to address future DOE missions; (3) fostering creativity and stimulating exploration of forefront science and technology; (4) serving as a proving ground for new research; and (5) supporting high-risk, potentially high-value R&D. Through LDRD the Laboratory is able to improve its distinctive capabilities and enhance its ability to conduct cutting-edge R&D for its DOE and WFO sponsors. To meet the LDRD objectives and fulfill the particular needs of the Laboratory, ORNL has established a program with two components: the Director's R&D Fund and the Seed Money Fund. As outlined in Table 1, these two funds are complementary. The Director's R&D Fund develops new capabilities in support of the Laboratory initiatives, while the Seed Money Fund is open to all innovative ideas that have the potential for enhancing the Laboratory's core scientific and technical competencies. Provision for multiple routes of access to ORNL LDRD funds maximizes the likelihood that novel and seminal ideas with scientific and technological merit will be recognized and supported

Psr1p interacts with SUN/sad1p and EB1/mal3p to establish the bipolar spindle

Regular Abstracts - Sunday Poster Presentations: no. 382During mitosis, interpolar microtubules from two spindle pole bodies (SPBs) interdigitate to create an antiparallel microtubule array for accommodating numerous regulatory proteins. Among these proteins, the kinesin-5 cut7p/Eg5 is the key player responsible for sliding apart antiparallel microtubules and thus helps in establishing the bipolar spindle. At the onset of mitosis, two SPBs are adjacent to one another with most microtubules running nearly parallel toward the nuclear envelope, creating an unfavorable microtubule configuration for the kinesin-5 kinesins. Therefore, how the cell organizes the antiparallel microtubule array in the first place at mitotic onset remains enigmatic. Here, we show that a novel protein psrp1p localizes to the SPB and plays a key role in organizing the antiparallel microtubule array. The absence of psr1+ leads to a transient monopolar spindle and massive chromosome loss. Further functional characterization demonstrates that psr1p is recruited to the SPB through interaction with the conserved SUN protein sad1p and that psr1p physically interacts with the conserved microtubule plus tip protein mal3p/EB1. These results suggest a model that psr1p serves as a linking protein between sad1p/SUN and mal3p/EB1 to allow microtubule plus ends to be coupled to the SPBs for organization of an antiparallel microtubule array. Thus, we conclude that psr1p is involved in organizing the antiparallel microtubule array in the first place at mitosis onset by interaction with SUN/sad1p and EB1/mal3p, thereby establishing the bipolar spindle.postprin

Removal of antagonistic spindle forces can rescue metaphase spindle length and reduce chromosome segregation defects

Regular Abstracts - Tuesday Poster Presentations: no. 1925Metaphase describes a phase of mitosis where chromosomes are attached and oriented on the bipolar spindle for subsequent segregation at anaphase. In diverse cell types, the metaphase spindle is maintained at a relatively constant length. Metaphase spindle length is proposed to be regulated by a balance of pushing and pulling forces generated by distinct sets of spindle microtubules and their interactions with motors and microtubule-associated proteins (MAPs). Spindle length appears important for chromosome segregation fidelity, as cells with shorter or longer than normal metaphase spindles, generated through deletion or inhibition of individual mitotic motors or MAPs, showed chromosome segregation defects. To test the force balance model of spindle length control and its effect on chromosome segregation, we applied fast microfluidic temperature-control with live-cell imaging to monitor the effect of switching off different combinations of antagonistic forces in the fission yeast metaphase spindle. We show that spindle midzone proteins kinesin-5 cut7p and microtubule bundler ase1p contribute to outward pushing forces, and spindle kinetochore proteins kinesin-8 klp5/6p and dam1p contribute to inward pulling forces. Removing these proteins individually led to aberrant metaphase spindle length and chromosome segregation defects. Removing these proteins in antagonistic combination rescued the defective spindle length and, in some combinations, also partially rescued chromosome segregation defects. Our results stress the importance of proper chromosome-to-microtubule attachment over spindle length regulation for proper chromosome segregation.postprin

Sewage sludge heavy metal analysis and agricultural prospects for Fiji

Insoluble residues produced in Waste Water Treatment Plants (WWTP) as by products are known as sewage sludge (SS). Land application of SS, particularly in agricultural lands, is becoming an alternative disposal method in Fiji. However, currently there is no legislative framework governing its use. SS together with its high nutrient and organic matter contents, constitutes some undesired pollutants such as heavy metals, which may limit its extensive use. The focus of this study therefore was to determine the total concentrations of Pb, Zn, Cd, Cu, Cr, Ni and Mn in the SS produced at the Kinoya WWTP (Fiji) and in the non-fertile soil amended with the SS at 20, 40, 60, 80% application rates and in the control (100% Soil). The bioavailable heavy metals were also determined as it depicts the true extent of metal contamination. The treatment mixtures were then used to cultivate cabbage plants in which the total heavy metal uptake was investigated. Total Zn (695.6 mg/kg) was present in the highest amounts in the 100% SS (control), followed by Pb (370.9 mg/kg), Mn (35.0 mg/kg), Cu (65.5 mg/kg), Cr (20.5 mg/kg) and finally Cd (13.5 mg/kg) and hence a similar trend was seen in all treatment mixtures. The potential mobility of sludgeborne heavy metals can be classified as Ni > Cu > Cd > Zn > Mn > Cr > Pb. Total metal uptake in plant leaves and stems showed only the bioavailable metals Cu, Cd, Zn and Mn, with maximum uptake occurring in the leaves. Ni, despite being highly mobile was not detected, due to minute concentrations in the SS treatments. Optimum growth occurred in the 20 and 40% SS treatments. However maximum Cu and Mn uptake occurred in the 40% SS treatment thereby making the 20% treatment the most feasible. Furthermore the total and bioavailable metal concentrations observed were within the safe and permitted limits of the EEC and USEPA legislations

Microelectromechanical Systems and Devices

The advances of microelectromechanical systems (MEMS) and devices have been instrumental in the demonstration of new devices and applications, and even in the creation of new fields of research and development: bioMEMS, actuators, microfluidic devices, RF and optical MEMS. Experience indicates a need for MEMS book covering these materials as well as the most important process steps in bulk micro-machining and modeling. We are very pleased to present this book that contains 18 chapters, written by the experts in the field of MEMS. These chapters are groups into four broad sections of BioMEMS Devices, MEMS characterization and micromachining, RF and Optical MEMS, and MEMS based Actuators. The book starts with the emerging field of bioMEMS, including MEMS coil for retinal prostheses, DNA extraction by micro/bio-fluidics devices and acoustic biosensors. MEMS characterization, micromachining, macromodels, RF and Optical MEMS switches are discussed in next sections. The book concludes with the emphasis on MEMS based actuators