Fault-tolerant sub-lithographic design with rollback recovery

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf = 10^-7) in systems with 10^12 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results

A scalable multi-core architecture with heterogeneous memory structures for Dynamic Neuromorphic Asynchronous Processors (DYNAPs)

Neuromorphic computing systems comprise networks of neurons that use asynchronous events for both computation and communication. This type of representation offers several advantages in terms of bandwidth and power consumption in neuromorphic electronic systems. However, managing the traffic of asynchronous events in large scale systems is a daunting task, both in terms of circuit complexity and memory requirements. Here we present a novel routing methodology that employs both hierarchical and mesh routing strategies and combines heterogeneous memory structures for minimizing both memory requirements and latency, while maximizing programming flexibility to support a wide range of event-based neural network architectures, through parameter configuration. We validated the proposed scheme in a prototype multi-core neuromorphic processor chip that employs hybrid analog/digital circuits for emulating synapse and neuron dynamics together with asynchronous digital circuits for managing the address-event traffic. We present a theoretical analysis of the proposed connectivity scheme, describe the methods and circuits used to implement such scheme, and characterize the prototype chip. Finally, we demonstrate the use of the neuromorphic processor with a convolutional neural network for the real-time classification of visual symbols being flashed to a dynamic vision sensor (DVS) at high speed.Comment: 17 pages, 14 figure

Variability-aware architectures based on hardware redundancy for nanoscale reliable computation

During the last decades, human beings have experienced a significant enhancement in the quality of life thanks in large part to the fast evolution of Integrated Circuits (IC). This unprecedented technological race, along with its significant economic impact, has been grounded on the production of complex processing systems from highly reliable compounding devices. However, the fundamental assumption of nearly ideal devices, which has been true within the past CMOS technology generations, today seems to be coming to an end. In fact, as MOSFET technology scales into nanoscale regime it approaches to fundamental physical limits and starts experiencing higher levels of variability, performance degradation, and higher rates of manufacturing defects. On the other hand, ICs with increasing number of transistors require a decrease in the failure rate per device in order to maintain the overall chip reliability. As a result, it is becoming increasingly important today the development of circuit architectures capable of providing reliable computation while tolerating high levels of variability and defect rates. The main objective of this thesis is to analyze and propose new fault-tolerant architectures based on redundancy for future technologies. Our research is founded on the principles of redundancy established by von Neumann in the 1950s and extends them to three new dimensions: 1. Heterogeneity: Most of the works on fault-tolerant architectures based on redundancy assume homogeneous variability in the replicas like von Neumann's original work. Instead, we explore the possibilities of redundancy when heterogeneity between replicas is taken into account. In this sense, we propose compensating mechanisms that select the weighting of the redundant information to maximize the overall reliability. 2. Asynchrony: Each of the replicas of a redundant system may have associated different processing delays due to variability and degradation; especially in future nanotechnologies. If we design our system to work locally in asynchronous mode then we may consider different voting policies to deal with the redundant information. Depending on how many replicas we collect before taking a decision we can obtain different trade-off between processing delay and reliability. We propose a mechanism for providing these facilities and analyze and simulate its operation. 3. Hierarchy: Finally, we explore the possibilities of redundancy applied at different hierarchy layers of complex processing systems. We propose to distribute redundancy across the various hierarchy layers and analyze the benefits that can be obtained. Drawing on the scenario of future ICs technologies, we push the concept of redundancy to its fullest expression through the study of realistic nano-device architectures. Most of the redundant architectures considered so far do not face properly the era of Terascale Computing and the nanotechnology trends. Since von Neumann applied for the first time redundancy at electronic circuits, never until now effects as common in nanoelectronics as degradation and interconnection failures have been treated directly from the standpoint of redundancy. In this thesis we address in a comprehensive manner the reliability of digital processing systems in the upcoming technology generations

Fine-grained fault-tolerance : reliability as a fungible resource

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2004.Includes bibliographical references (p. 131-134).The traditional design of logic circuits, based on reliable components, is incompatible with the next generation of devices relying on fewer resources and subject to high rates of soft errors. These allow a trade-off between failure probability and their space and power consumption. Using this, we show that reliability can be a fungible resource, interconvertible with other physical resources in multiple, unusual ways, via fault-tolerant architectures. This thesis investigates the potentialities offered by a fault-tolerant design in devices whose reliability is limited by shrinking resources. Surprisingly, we find that an appropriate use of structured redundancy could lead to more efficient components. The performance of a fine-grained multiplexed design can indeed be systematically evaluated in terms of resource savings and reliability improvement. This analysis is applied to characterize technologies at the nano scale, such as molecular electronics, which may benefit enormously by fault-tolerant designs.by François Impens.S.M

Computational Modalities of Belousov-Zhabotinsky Encapsulated Vesicles

We present both simulated and partial empirical evidence for the computational utility of many connected vesicle analogs of an encapsulated non-linear chemical processing medium. By connecting small vesicles containing a solution of sub-excitable Belousov-Zhabotinsky (BZ) reaction, sustained and propagating wave fragments are modulated by both spatial geometry, network connectivity and their interaction with other waves. The processing ability is demonstrated through the creation of simple Boolean logic gates and then by the combination of those gates to create more complex circuits