Fault diagnostic instrumentation design for environmental control and life support systems

As a development phase moves toward flight hardware, the system availability becomes an important design aspect which requires high reliability and maintainability. As part of continous development efforts, a program to evaluate, design, and demonstrate advanced instrumentation fault diagnostics was successfully completed. Fault tolerance designs for reliability and other instrumenation capabilities to increase maintainability were evaluated and studied

Application of advanced technology to space automation

Automated operations in space provide the key to optimized mission design and data acquisition at minimum cost for the future. The results of this study strongly accentuate this statement and should provide further incentive for immediate development of specific automtion technology as defined herein. Essential automation technology requirements were identified for future programs. The study was undertaken to address the future role of automation in the space program, the potential benefits to be derived, and the technology efforts that should be directed toward obtaining these benefits

Advanced information processing system: The Army fault tolerant architecture conceptual study. Volume 2: Army fault tolerant architecture design and analysis

Described here is the Army Fault Tolerant Architecture (AFTA) hardware architecture and components and the operating system. The architectural and operational theory of the AFTA Fault Tolerant Data Bus is discussed. The test and maintenance strategy developed for use in fielded AFTA installations is presented. An approach to be used in reducing the probability of AFTA failure due to common mode faults is described. Analytical models for AFTA performance, reliability, availability, life cycle cost, weight, power, and volume are developed. An approach is presented for using VHSIC Hardware Description Language (VHDL) to describe and design AFTA's developmental hardware. A plan is described for verifying and validating key AFTA concepts during the Dem/Val phase. Analytical models and partial mission requirements are used to generate AFTA configurations for the TF/TA/NOE and Ground Vehicle missions

Fully automated urban traffic system

The replacement of the driver with an automatic system which could perform the functions of guiding and routing a vehicle with a human's capability of responding to changing traffic demands was discussed. The problem was divided into four technological areas; guidance, routing, computing, and communications. It was determined that the latter three areas being developed independent of any need for fully automated urban traffic. A guidance system that would meet system requirements was not being developed but was technically feasible

Software implemented fault tolerance for microprocessor controllers: fault tolerance for microprocessor controllers

It is generally accepted that transient faults are a major cause of failure in micro processor systems. Industrial controllers with embedded microprocessors are particularly at risk from this type of failure because their working environments are prone to transient disturbances which can generate transient faults. In order to improve the reliability of processor systems for industrial applications within a limited budget, fault tolerant techniques for uniprocessors are implemented. These techniques aim to identify characteristics of processor operation which are attributed to erroneous behaviour. Once detection is achieved, a programme of restoration activity can be initiated. This thesis initially develops a previous model of erroneous microprocessor behaviour from which characteristics particular to mal-operation are identified. A new technique is proposed, based on software implemented fault tolerance which, by recognizing a particular behavioural characteristic, facilitates the self-detection of erroneous execution. The technique involves inserting detection mechanisms into the target software. This can be quite a complex process and so a prototype software tool called Post-programming Automated Recovery UTility (PARUT) is developed to automate the technique's application. The utility can be used to apply the proposed behavioural fault tolerant technique for a selection of target processors. Fault injection and emulation experiments assess the effectiveness of the proposed fault tolerant technique for three application programs implemented on an 8, 16, and 32- bit processors respectively. The modified application programs are shown to have an improved detection capability and hence reliability when the proposed fault tolerant technique is applied. General assessment of the technique cannot be made, however, because its effectiveness is application specific. The thesis concludes by considering methods of generating non-hazardous application programs at the compilation stage, and design features for incorporation into the architecture of a microprocessor which inherently reduce the hazard, and increase the detection capability of the target software. Particular suggestions are made to add a 'PARUT' phase to the translation process, and to orientate microprocessor design towards the instruction opcode map

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

NASA Space Engineering Research Center Symposium on VLSI Design

The NASA Space Engineering Research Center (SERC) is proud to offer, at its second symposium on VLSI design, presentations by an outstanding set of individuals from national laboratories and the electronics industry. These featured speakers share insights into next generation advances that will serve as a basis for future VLSI design. Questions of reliability in the space environment along with new directions in CAD and design are addressed by the featured speakers

Integrated circuit outlier identification by multiple parameter correlation

Semiconductor manufacturers must ensure that chips conform to their specifications before they are shipped to customers. This is achieved by testing various parameters of a chip to determine whether it is defective or not. Separating defective chips from fault-free ones is relatively straightforward for functional or other Boolean tests that produce a go/no-go type of result. However, making this distinction is extremely challenging for parametric tests. Owing to continuous distributions of parameters, any pass/fail threshold results in yield loss and/or test escapes. The continuous advances in process technology, increased process variations and inaccurate fault models all make this even worse. The pass/fail thresholds for such tests are usually set using prior experience or by a combination of visual inspection and engineering judgment. Many chips have parameters that exceed certain thresholds but pass Boolean tests. Owing to the imperfect nature of tests, to determine whether these chips (called "outliers") are indeed defective is nontrivial. To avoid wasted investment in packaging or further testing it is important to screen defective chips early in a test flow. Moreover, if seemingly strange behavior of outlier chips can be explained with the help of certain process parameters or by correlating additional test data, such chips can be retained in the test flow before they are proved to be fatally flawed. In this research, we investigate several methods to identify true outliers (defective chips, or chips that lead to functional failure) from apparent outliers (seemingly defective, but fault-free chips). The outlier identification methods in this research primarily rely on wafer-level spatial correlation, but also use additional test parameters. These methods are evaluated and validated using industrial test data. The potential of these methods to reduce burn-in is discussed