FVF-Based Low-Dropout Voltage Regulator with Fast Charging/Discharging Paths for Fast Line and Load Regulation

A new internally compensated low drop-out voltage regulator based on the cascoded flipped voltage follower is presented in this paper. Adaptive biasing current and fast charging/discharging paths have been added to rapidly charge and discharge the parasitic capacitance of the pass transistor gate, thus improving the transient response. The proposed regulator was designed with standard 65-nm CMOS technology. Measurements show load and line regulations of 433.80 μV/mA and 5.61 mV/V, respectively. Furthermore, the output voltage spikes are kept under 76 mV for 0.1 mA to 100 mA load variations and 0.9 V to 1.2 V line variations with rise and fall times of 1 μs. The total current consumption is 17.88 μA (for a 0.9 V supply voltage).Ministerio de Economía y Competitividad TEC2015-71072-C3-3-RConsejería de Economía, Innovación y Ciencia. Junta de Andalucía P12-TIC-186

Quasi–digital low–dropout voltage regulators uses controlled pass transistors

This article presents a low quiescent current outputcapacitorless quasi-digital CMOS LDO regulator with controlled pass transistors according to load demands. The pass transistor of the LDO is broken up to two smaller sizes based on a breakup criterion defined here, which considers the maximum output voltage variations to different load current steps to find the suitable current boundary for breaking up. This criterion shows that low load conditions will cause more output variations and settling time if the pass transistor is used in its maximum size. Therefore, using one smaller transistor for low load currents, and another one larger for higher currents, is the best trade-off between output variations, complexity, and power dissipation. The proposed LDO regulator has been designed and post-simulated in HSPICE in a 0.35 µm CMOS process to supply a load current between 0-100 mA while consumes 7.6 µA quiescent current. The results reveal 46% and 69% improvement on the output voltage variations and settling time, respectively.Postprint (published version

Output-Capacitorless CMOS LDO Regulator Based on High Slew-Rate Current-Mode Transconductance Amplifier

A low quiescent current output-capacitorless CMOS LDO regulator based on a high slew-rate current-mode transconductance amplifier (CTA) as an error amplifier is presented. Load transient characteristic of the proposed LDO is improved even at low quiescent currents, by using a local common-mode feedback (LCMFB) in the proposed CTA. This provides an increase in the order of transfer characteristic of the circuit, thereby enhancing the slew-rate at the gate of pass transistor. The proposed CTA-based LDO topology has been designed and post-layout simulated in HSPICE, in a 0.18 μm CMOS process to supply a load current between 0-100 mA. Postlayout simulation results reveal that the proposed LDO is stable without any internal compensation strategy and with on-chip output capacitor or lumped parasitic capacitances at the output node between 10-100 pF.Postprint (published version

Diseño de circuitos electrónicos de ultra-bajo consumo en tecnologías nanométricas

El escalado de los procesos de fabricación de semiconductores, predicho por el Dr. Moore en los años sesenta, ha tenido un gran impacto en el desarrollo de la electrónica integrada actual. Por una parte, la reducción del tamaño de los transistores ha permitido incrementar la densidad de integración, dando la posibilidad a los diseñadores de introducir un mayor número de funcionalidades dentro de una misma área. Por otro lado, este fenómeno ha llevado consigo una reducción de los costes asociados a la fabricación, logrando abaratar el producto final. Esta continua evolución e incremento de la funcionalidad dentro de un mismo circuito integrado, implica, a su vez, un aumento de la complejidad a la hora de planificar la generación y distribución de las distintas tensiones de alimentación, necesarias para cada uno de los bloques incluidos en el chip. Esto provoca que las especificaciones de ruido, regulación y/o estabilidad asociadas a cada dominio de alimentación varíen según la naturaleza del sistema al que se pretende alimentar. Por esta razón, los circuitos destinados a la gestión de la potencia han tomado una mayor relevancia en los últimos años, puesto que las restricciones impuestas por los sistemas integrados son cada vez mayores. Dentro de los circuitos destinados a la gestión de potencia, los reguladores lineales y, en concreto, los de bajo dropout se corresponden con un bloque básico, ya que permiten la generación de tensiones de alimentación muy estables, precisas y de bajo ruido. Estas características los convierten en el circuito ideal para alimentar a sistemas analógicos o de radio-frecuencia, muy sensibles a variaciones de la alimentación. Otra característica de estos bloques, que ha provocado el creciente interés de la comunidad científica en ellos, es la posibilidad de poder integrarlos sin necesidad de incluir ningún dispositivo externo, con el consecuente ahorro económico y de área en la tarjeta impresa. Sin embargo, dentro de los inconvenientes cabe destacar dos. Por una parte, la eficiencia máxima teórica que pueden lograr es baja frente a soluciones basadas en capacidades conmutadas o inductores. Por otro lado, al buscarse un esquema de compensación interna, el polo dominante del sistema viene fijado por un nodo interno del circuito, provocando que el polo no-dominante esté dominado por la carga. Esto se traduce en un gran problema de estabilidad, debido a que las variaciones que sufre la carga se traducen en un desplazamiento en frecuencia del polo no dominante, degradando el margen de fase de todo el sistema. Según lo descrito anteriormente, esta investigación se ha centrado en el estudio de reguladores lineales de tipo Low-DropOut o LDO compensados internamente y sus propiedades, dada la problemática de este tipo de celdas cuando se busca minimizar su consumo quiescente. Para ello, uno de los objetivos marcados versa sobre la búsqueda de topologías alternativas que permitan el diseño de LDOs de altas prestaciones, sin suponer un incremento del consumo quiescente y que sean válidos para entornos de baja tensión de alimentación. En este sentido, se ha apostado por el uso de la celda Flipped Voltage Follower como regulador debido a su baja impendancia de salida, gran estabilidad y sencillez. Una segunda línea, se ha centrado en la búsqueda de esquemas de compensación simples que permitan extender la estabilidad de este tipo de regulador en todo el rango de funcionamiento. Para ello, se ha explorado un esquema basado en la compensación clásica de Miller donde se ha utilizado un esquema de replica para ajustar de forma dinámica el valor de la resistencia según la carga del sistema. Por último, con el objetivo de minimizar lo máximo posible el consumo quiescente de los reguladores LDOs sin degradar las prestaciones de la respuesta transitoria, se ha explorado el uso de buffers clase AB para gestionar la puerta del transistor de paso. Esta técnica permite mejorar la respuesta transitoria, al ser capaz de crear corrientes elevadas durante las transiciones sin necesidad de penalizar la eficiencia del regulador.The continuous downscaling of semiconductor fabrication processes, which was predicted by PhD. Moore in 1965, have had a great impact in the development of nowadays integrated electronics. The reduction of transistor size has allowed, on one hand, the integration of more devices in the same área, increasing the integration density, while, on the other hand, has led to the reduction of fabrication costs, making the final product cheaper and accessible. However, this increase in the functionality of a single integrated circuit entails greater complexity in the generation and distribution of the different biasing voltages needed throughout one chip. Thus, as more different systems are integrated in the same chip, more different biasing domains coexists in it, leading several different requirements of noise, regulation and/or stability that need to be satisfied simultaneously. Therefore, power management circuits have been acquiring greater significance as technology downscales, reaching its maximum nowadays, when the nanoscale had taken those issues to its culmen. Linear regulators, and more concretely, low-dropout linear regulators, are an essential block in any power management system, able to generate precise and extremely-stable low-noise biasing voltages what make them the ideal choice for extremely biasing-sensitive circuits such as analog or radio-frequency systems. In addition to this, low-dropout linear regulators can be completely integrated without needing any external device, what translates to expenses and area savings. For all these reasons, low-dropout linear regulators have been lately acquiring extensive attention from the scientific community. However, those circuits also have some disadvantages, indeed, the maximum theoretical efficiency that can be achieved though low-dropout linear regulators is lower than switched capacitor or inductor-based solutions efficiency. In addition to this, as internal compensation is required, the system’s dominant pole is given by an internal node, making the non-dominant pole to be fixed by the charge. This leads to a great stability concern as charge variations translate to a frequency displacement of the non-dominant pole that degrades the whole system phase margin. In accordance with previously described issues, this research has been focused on the study of minimum-quiescent consumption internally compensated low-dropout linear regulators (LDO). The first objective of this research is the proposal of low-voltage high-performance LDO structures that do not increase quiescent consumption. Thus, the Flipped Voltage Follower cell has been proposed as regulator due to its inherent low output impedance, great stability and simplicity. The second aim of this research has been the proposal of simple compensation schemes that allow full-operation range stability. So that, a classical Miller compensation based scheme where a replica circuit dynamically adjust the charge resistance has been proposed. Finally, in order to minimize quiescent consumption of LDOs regulators without degrading transient response performance, class-AB buffers have been proposed to drive the pass transistor gate. This technique enhances the transient response as it generates high currents during transitions without compromising efficiency.Premio Extraordinario de Doctorado U